DE3882905D1 - Fuehler zur unterscheidung von fehlern in lichtdurchlassendem bahnfoermigem material. - Google Patents

Fuehler zur unterscheidung von fehlern in lichtdurchlassendem bahnfoermigem material.

Info

Publication number
DE3882905D1
DE3882905D1 DE8888904637T DE3882905T DE3882905D1 DE 3882905 D1 DE3882905 D1 DE 3882905D1 DE 8888904637 T DE8888904637 T DE 8888904637T DE 3882905 T DE3882905 T DE 3882905T DE 3882905 D1 DE3882905 D1 DE 3882905D1
Authority
DE
Germany
Prior art keywords
transfering
differentiating
errors
sensors
rail
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888904637T
Other languages
English (en)
Other versions
DE3882905T2 (de
Inventor
Masaharu Nippon Sheet Okafuji
Tatsuo Nippon Sheet Gl Takeoka
Nagayoshi Nippon Shee Ichinose
J K K Yaskawa Denki Seisak Abe
M K K Yaskawa Denki Sei Miyano
K K K Yask Denki Seisak Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yaskawa Electric Corp
Nippon Sheet Glass Co Ltd
Original Assignee
Nippon Sheet Glass Co Ltd
Yaskawa Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP62128090A external-priority patent/JPS63293449A/ja
Priority claimed from JP12808987A external-priority patent/JPH087159B2/ja
Priority claimed from JP1987079978U external-priority patent/JPS63188549U/ja
Priority claimed from JP12963987A external-priority patent/JPH087160B2/ja
Priority claimed from JP12964487A external-priority patent/JPH087161B2/ja
Priority claimed from JP12964187A external-priority patent/JPH0778473B2/ja
Priority claimed from JP13152487A external-priority patent/JPH087162B2/ja
Application filed by Nippon Sheet Glass Co Ltd, Yaskawa Electric Manufacturing Co Ltd filed Critical Nippon Sheet Glass Co Ltd
Publication of DE3882905D1 publication Critical patent/DE3882905D1/de
Publication of DE3882905T2 publication Critical patent/DE3882905T2/de
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4711Multiangle measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N2021/558Measuring reflectivity and transmission

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
DE88904637T 1987-05-27 1988-05-25 Fühler zur unterscheidung von fehlern in lichtdurchlassendem bahnförmigem material. Expired - Fee Related DE3882905T2 (de)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
JP62128090A JPS63293449A (ja) 1987-05-27 1987-05-27 ガラス板のドリップ検出装置
JP12808987A JPH087159B2 (ja) 1987-05-27 1987-05-27 透光板材の識別型欠点検出装置
JP12963987A JPH087160B2 (ja) 1987-05-28 1987-05-28 欠点デ−タ取込み回路
JP12964487A JPH087161B2 (ja) 1987-05-28 1987-05-28 識別型欠点検出装置の板厚補正装置
JP12964187A JPH0778473B2 (ja) 1987-05-28 1987-05-28 識別型欠点検出装置の透過散乱光用agc装置
JP1987079978U JPS63188549U (de) 1987-05-28 1987-05-28
JP13152487A JPH087162B2 (ja) 1987-05-29 1987-05-29 欠点デ−タ取込み回路

Publications (2)

Publication Number Publication Date
DE3882905D1 true DE3882905D1 (de) 1993-09-09
DE3882905T2 DE3882905T2 (de) 1994-03-10

Family

ID=27565311

Family Applications (1)

Application Number Title Priority Date Filing Date
DE88904637T Expired - Fee Related DE3882905T2 (de) 1987-05-27 1988-05-25 Fühler zur unterscheidung von fehlern in lichtdurchlassendem bahnförmigem material.

Country Status (5)

Country Link
US (1) US4914309A (de)
EP (1) EP0315697B1 (de)
KR (1) KR960012330B1 (de)
DE (1) DE3882905T2 (de)
WO (1) WO1988009497A1 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0317638B1 (de) * 1987-05-29 1992-04-29 Nippon Sheet Glass Co., Ltd. Sortiersystem und Verfahren für Flachglasscheiben
US5068523A (en) * 1990-03-02 1991-11-26 Intec Corp. Scanner detector array and light diffuser
JP2671241B2 (ja) * 1990-12-27 1997-10-29 日立電子エンジニアリング株式会社 ガラス板の異物検出装置
NL9100248A (nl) * 1991-02-13 1992-09-01 Philips & Du Pont Optical Inrichting voor het meten van de reflectie en/of transmissie van een voorwerp.
US5172421A (en) * 1991-03-27 1992-12-15 Hughes Aircraft Company Automated method of classifying optical fiber flaws
US5164603A (en) * 1991-07-16 1992-11-17 Reynolds Metals Company Modular surface inspection method and apparatus using optical fibers
JPH05249052A (ja) * 1992-03-06 1993-09-28 Nippon Sheet Glass Co Ltd 透光板材の欠点検出装置
EP0563897A1 (de) * 1992-03-30 1993-10-06 Fuji Photo Film Co., Ltd. System zur Fehlerinspektion
FR2697086B1 (fr) * 1992-10-20 1994-12-09 Thomson Csf Procédé et dispositif d'inspection de matériau transparent.
CA2108940A1 (en) * 1992-11-13 1994-05-14 James W. Oram Material fault detector
JPH06207910A (ja) * 1993-01-11 1994-07-26 Fuji Photo Film Co Ltd 表面検査装置
AT402861B (de) * 1994-03-28 1997-09-25 Oesterr Forsch Seibersdorf Verfahren und anordnung zum erkennen bzw. zur kontrolle von flächenstrukturen bzw. der oberflächenbeschaffenheit
US5684707A (en) * 1994-10-03 1997-11-04 Westvaco Corporation Apparatus and method for analyzing paper surface topography
AUPQ262299A0 (en) * 1999-09-02 1999-09-23 Resolve Engineering Pty Ltd Detection of inclusions in glass
WO2002012869A1 (en) * 2000-08-09 2002-02-14 Türkiye Sise Ve Cam Farbrikalari A.S. Method and apparatus for imaging inhomogeneity in a transparent solid medium
US7342654B2 (en) * 2003-12-19 2008-03-11 International Business Machines Corporation Detection of impurities in cylindrically shaped transparent media
AT7890U1 (de) * 2004-08-05 2005-10-17 Binder Co Ag Verfahren zum detektieren und entfernen von fremdkörpern
WO2006087213A2 (de) * 2005-02-18 2006-08-24 Schott Ag Verfahren und vorrichtung zur erfassung und/oder klassifizierung von fehlstellen
EP1857773A1 (de) * 2005-03-07 2007-11-21 Nippon Sheet Glass Company Limited Gerät zur prüfung von perspektivenverzerrung und verfahren für eine lichtdurchlässige tafel
US7986404B2 (en) * 2006-03-30 2011-07-26 Orbotech Ltd. Inspection system employing illumination that is selectable over a continuous range angles
US7929142B2 (en) * 2007-09-25 2011-04-19 Microsoft Corporation Photodiode-based bi-directional reflectance distribution function (BRDF) measurement
DE102008025870A1 (de) * 2008-05-31 2009-12-03 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
US8742385B2 (en) * 2011-01-26 2014-06-03 Honeywell Asca Inc. Beam distortion control system using fluid channels
US8553228B2 (en) * 2011-09-30 2013-10-08 3M Innovative Properties Company Web inspection calibration system and related methods
JP2014238534A (ja) 2013-06-10 2014-12-18 シャープ株式会社 光制御フィルムの検査装置および光制御フィルムの製造装置
JP6324113B2 (ja) * 2014-02-28 2018-05-16 キヤノン株式会社 光学系および光沢計
JP6324114B2 (ja) 2014-02-28 2018-05-16 キヤノン株式会社 光学系および光沢計
JP2016070782A (ja) * 2014-09-30 2016-05-09 株式会社Jvcケンウッド 分析装置及び分析方法
JP6146717B2 (ja) * 2014-12-24 2017-06-14 レーザーテック株式会社 検査装置、及び検査方法
US11774368B2 (en) 2022-01-03 2023-10-03 Rick Ross Light table apparatus and methods for inspecting heat exchanger plates for defects using light

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1401957A (en) * 1971-08-12 1975-08-06 Paint Research Ass Colourimeters
US3843890A (en) * 1973-07-27 1974-10-22 Du Pont Optical-electrical web inspection system
US3910701A (en) * 1973-07-30 1975-10-07 George R Henderson Method and apparatus for measuring light reflectance absorption and or transmission
US4033698A (en) * 1975-10-10 1977-07-05 International Business Machines Corporation Apparatus for textile color analysis
US3999864A (en) * 1975-11-17 1976-12-28 International Business Machines Corporation Gloss measuring instrument
GB1592449A (en) * 1976-12-01 1981-07-08 Ferranti Ltd Optical inspection apparatus
DE2860548D1 (en) * 1977-09-09 1981-04-16 Rank Organisation Ltd An optical sensing instrument
JPS54106289A (en) * 1978-02-07 1979-08-21 Nippon Sheet Glass Co Ltd Defect detector for glass sheet
US4247204A (en) * 1979-02-26 1981-01-27 Intec Corporation Method and apparatus for a web edge tracking flaw detection system
DE2910240A1 (de) * 1979-03-15 1980-09-25 Rolf Dr Bartke Vorrichtung zur ermittelung des reflexionsvermoegens der oberflaeche eines messobjektes
DE3006071C2 (de) * 1980-02-19 1987-05-27 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Lichtsammelanordnung in einer Vorrichtung zur Abtastung einer Fläche wie z.B. einer Materialbahn längs einer Geraden mittels eines Lichtstrahls
DE3043849A1 (de) * 1980-11-21 1982-07-08 Koninklijke Textielfabrieken Nijverdal-Ten Gate N.V., Almelo Verfahren zum beschauen einer reflektierenden und/oder transparenten, sich bewegenden bahn und beschaumaschine zur durchfuehrung des verfahrens
DE3226370A1 (de) * 1982-07-14 1984-01-19 Compur-Electronic GmbH, 8000 München Remissionsmesskopf
US4570074A (en) * 1982-09-29 1986-02-11 Q-Val Incorporated Flying spot scanner system
DE3334357C2 (de) * 1983-09-22 1986-04-10 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät für Bahnen
JP2946252B2 (ja) * 1991-07-12 1999-09-06 本田技研工業株式会社 摺動部材

Also Published As

Publication number Publication date
EP0315697A1 (de) 1989-05-17
US4914309A (en) 1990-04-03
KR960012330B1 (ko) 1996-09-18
EP0315697A4 (en) 1990-10-03
WO1988009497A1 (en) 1988-12-01
KR890702017A (ko) 1989-12-22
EP0315697B1 (de) 1993-08-04
DE3882905T2 (de) 1994-03-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee