DE3768652D1 - Verfahren zur erfassung von fehlern in oberflaechen. - Google Patents

Verfahren zur erfassung von fehlern in oberflaechen.

Info

Publication number
DE3768652D1
DE3768652D1 DE8787104591T DE3768652T DE3768652D1 DE 3768652 D1 DE3768652 D1 DE 3768652D1 DE 8787104591 T DE8787104591 T DE 8787104591T DE 3768652 T DE3768652 T DE 3768652T DE 3768652 D1 DE3768652 D1 DE 3768652D1
Authority
DE
Germany
Prior art keywords
detecting errors
errors
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787104591T
Other languages
English (en)
Inventor
Paul Regis Adomaitis
Nicholaas Louis Brouwer
Bernard John Hobi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Howmet Aerospace Inc
Original Assignee
Aluminum Company of America
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aluminum Company of America filed Critical Aluminum Company of America
Application granted granted Critical
Publication of DE3768652D1 publication Critical patent/DE3768652D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G01N2021/889—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a bare video image, i.e. without visual measurement aids

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
DE8787104591T 1987-03-27 1987-03-27 Verfahren zur erfassung von fehlern in oberflaechen. Expired - Lifetime DE3768652D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP87104591A EP0284630B1 (de) 1987-03-27 1987-03-27 Verfahren zur Erfassung von Fehlern in Oberflächen

Publications (1)

Publication Number Publication Date
DE3768652D1 true DE3768652D1 (de) 1991-04-18

Family

ID=8196879

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787104591T Expired - Lifetime DE3768652D1 (de) 1987-03-27 1987-03-27 Verfahren zur erfassung von fehlern in oberflaechen.

Country Status (3)

Country Link
US (1) US4675730A (de)
EP (1) EP0284630B1 (de)
DE (1) DE3768652D1 (de)

Families Citing this family (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4675730A (en) * 1985-09-06 1987-06-23 Aluminum Company Of America Video surface inspection system
US5043582A (en) * 1985-12-11 1991-08-27 General Imagining Corporation X-ray imaging system and solid state detector therefor
JPS62138740A (ja) * 1985-12-13 1987-06-22 Hiyuutec:Kk シ−ト面の欠陥検出方法
US4950911A (en) * 1986-12-10 1990-08-21 Process Automation Business, Inc. Apparatus and method for inspecting sheet material
US4872757A (en) * 1988-04-20 1989-10-10 Ball Corporation Optical convex surface profiling and gauging apparatus and method therefor
US4863275A (en) * 1988-04-20 1989-09-05 Ball Corporation Portable, shock-proof container surface profiling instrumentation
US4954891A (en) * 1988-07-11 1990-09-04 Process Automation Business, Inc. Light guided illuminating/sectioning device for sheet inspection system
AU627658B2 (en) * 1990-06-13 1992-08-27 Aluminium Company Of America Video inspection system
US5087822A (en) * 1990-06-22 1992-02-11 Alcan International Limited Illumination system with incident beams from near and far dark field for high speed surface inspection of rolled aluminum sheet
US5120976A (en) * 1990-07-25 1992-06-09 The Boeing Company Strip lay-up verification system with width and centerline skew determination
US5132791A (en) * 1990-09-25 1992-07-21 Ball Corporation Optical sheet inspection system
JPH0581408A (ja) * 1991-09-19 1993-04-02 Hiyuutec:Kk 欠点画像表示方法
US5345309A (en) * 1991-10-10 1994-09-06 Ball Corporation Precision three dimensional profiling and measurement system for cylindrical containers
US5175601A (en) * 1991-10-15 1992-12-29 Electro-Optical Information Systems High-speed 3-D surface measurement surface inspection and reverse-CAD system
JPH07117498B2 (ja) * 1991-12-11 1995-12-18 インターナショナル・ビジネス・マシーンズ・コーポレイション 検査システム
US5239376A (en) * 1992-02-11 1993-08-24 Lake Superior Paper Industries Web defect continuous surveillance system
US5283418A (en) * 1992-02-27 1994-02-01 Westinghouse Electric Corp. Automated rotor welding processes using neural networks
SE510242C2 (sv) * 1992-04-23 1999-05-03 Limab Laser Instrumentmek Metod och mätsystem för detektering av defekter vid ytan av ett trästycke
US5319445A (en) * 1992-09-08 1994-06-07 Fitts John M Hidden change distribution grating and use in 3D moire measurement sensors and CMM applications
US5305392A (en) * 1993-01-11 1994-04-19 Philip Morris Incorporated High speed, high resolution web inspection system
NL9500151A (nl) * 1995-01-27 1996-09-02 Stork Contiweb Werkwijze en inrichting voor het op fouten inspecteren van een materiaalbaan, toepassing van de werkwijze bij het voorbereiden van een voorraadrol in een rollenwisselaar en rollenwisselaar voorzien van een dergelijke inrichting.
US5717456A (en) * 1995-03-06 1998-02-10 Champion International Corporation System for monitoring a continuous manufacturing process
PT742431E (pt) * 1995-05-10 2000-08-31 Mahlo Gmbh & Co Kg Metodo e aparelho para a deteccao de defeitos em tecidos em movimento ou materiais semelhantes
WO1997000438A1 (en) * 1995-06-15 1997-01-03 British Nuclear Fuels Plc Inspecting the surface of an object
US6043840A (en) * 1996-04-19 2000-03-28 Alliedsignal Inc. Apparatus and method for characterizing fiber crimps
DE19624905A1 (de) * 1996-06-21 1998-01-08 L & P Elektroautomatisations G Vorrichtung für die Qualitätskontrolle einer laufenden Warenbahn
US6198529B1 (en) 1999-04-30 2001-03-06 International Business Machines Corporation Automated inspection system for metallic surfaces
US7120524B2 (en) * 2003-12-04 2006-10-10 Matrix Electronic Measuring, L.P. System for measuring points on a vehicle during damage repair
US7146034B2 (en) 2003-12-09 2006-12-05 Superpower, Inc. Tape manufacturing system
FI20040315A (fi) * 2004-02-27 2005-08-28 Tameye Ky Materiaalin vianilmaisu spektrikameran avulla
JP4249649B2 (ja) * 2004-04-09 2009-04-02 ホリゾン・インターナショナル株式会社 縦型丁合機
US7423280B2 (en) 2004-08-09 2008-09-09 Quad/Tech, Inc. Web inspection module including contact image sensors
US20090060316A1 (en) * 2006-02-22 2009-03-05 Hannu Ruuska Method for Monitoring a Rapidly-Moving Paper Web and Corresponding System
ATE425452T1 (de) * 2006-06-13 2009-03-15 Abb Oy Verfahren und vorrichtung zur erkennung von sich wiederholenden mustern
EP2159182B1 (de) * 2007-05-11 2013-07-17 Toray Industries, Inc. Fadenlauflinieninspektionsverfahren und dieses verwendendes kohlefaserherstellungsverfahren
SE531120C2 (sv) * 2007-09-25 2008-12-23 Abb Research Ltd En anordning och ett förfarande för stabilisering och visuell övervakning av ett långsträckt metalliskt band
KR100863700B1 (ko) * 2008-02-18 2008-10-15 에스엔유 프리시젼 주식회사 비전 검사 시스템 및 이것을 이용한 피검사체의 검사 방법
WO2009136869A1 (en) * 2008-05-05 2009-11-12 Agency For Science, Technology And Research Sensor chip for biological and chemical sensing
US8654333B2 (en) * 2010-03-30 2014-02-18 Fujifilm Corporation Surface inspection apparatus and method
JP6696384B2 (ja) * 2016-09-28 2020-05-20 株式会社デンソー 検査装置
US20190096057A1 (en) 2017-05-11 2019-03-28 Jacob Nathaniel Allen Object inspection system and method for inspecting an object
KR20230024390A (ko) 2020-06-17 2023-02-20 이노비전 소프트웨어 솔루션즈, 인크. 결함 복원을 위한 시스템 및 방법
CN113658121B (zh) * 2021-08-09 2024-07-12 国能榆林能源有限责任公司 一种线路缺陷检测方法、系统及计算机存储介质
CN118464915A (zh) * 2024-07-12 2024-08-09 南京侨睿交通技术有限公司 一种护栏螺栓缺失锈蚀检测装置

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2680200A (en) * 1950-07-24 1954-06-01 Ilford Ltd Examination of photographic materials
US2803755A (en) * 1954-12-16 1957-08-20 Gen Electric Automatic inspection gage
US3081379A (en) * 1956-12-04 1963-03-12 Jerome H Lemelson Automatic measurement apparatus
US3049588A (en) * 1959-08-28 1962-08-14 Prec Controls Corp Quality control system
GB930748A (en) * 1960-09-16 1963-07-10 British Nylon Spinners Ltd Improvements in or relating to processes and apparatus for the automatic inspection and segregation of bobbins of yarn
US3379829A (en) * 1964-04-14 1968-04-23 Itt Flaw detection apparatus
US3389789A (en) * 1965-12-10 1968-06-25 Moore Vue Inc Detecting and sorting means for sheets having flaws
US3868478A (en) * 1973-08-24 1975-02-25 Fairchild Industries Apparatus and method for scanning and storing information located on rapidly moving articles
JPS5849819B2 (ja) * 1975-03-18 1983-11-07 コニカ株式会社 ソウサシキケンサソウチ
DE2612482A1 (de) * 1976-03-24 1977-10-06 Hoesch Werke Ag Verfahren und einrichtung zur optischen beobachtung der oberflaeche von schnell bewegtem walzmaterial
JPS6026176B2 (ja) * 1976-07-09 1985-06-22 日本鋼管株式会社 赤熱金属材料の表面疵検出装置
US4063282A (en) * 1976-07-20 1977-12-13 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration TV fatigue crack monitoring system
FR2402868A1 (fr) * 1977-09-12 1979-04-06 Usinor Procede et appareil de detection de defauts de surface sur une bande defilant a grande vitesse
US4232336A (en) * 1978-09-18 1980-11-04 Eastman Kodak Company Inspection of elongated material
US4240110A (en) * 1978-09-18 1980-12-16 Eastman Kodak Company Inspection of elongated material
US4223346A (en) * 1979-04-05 1980-09-16 Armco Inc. Automatic defect detecting inspection apparatus
JPS5677704A (en) * 1979-11-30 1981-06-26 Hitachi Ltd Inspection system for surface defect of substance
DE2952712C2 (de) * 1979-12-29 1984-07-12 Hoesch Werke Ag, 4600 Dortmund Vorrichtung zur Erkennung von Fehlern
JPS5757246A (en) * 1980-09-25 1982-04-06 Fuji Photo Film Co Ltd Detecting and measuring apparatus for flaw
JPS57132044A (en) * 1981-02-10 1982-08-16 Hitachi Metals Ltd Discriminating method of surface defect
US4473842A (en) * 1981-07-06 1984-09-25 Tokyo Shibaura Denki Kabushiki Kaisha Apparatus and method for examining printed circuit board provided with electronic parts
CH656466A5 (de) * 1982-02-15 1986-06-30 Alusuisse Verfahren und vorrichtung zur oberflaechenkontrolle eines werkstoffes.
US4675730A (en) * 1985-09-06 1987-06-23 Aluminum Company Of America Video surface inspection system

Also Published As

Publication number Publication date
EP0284630B1 (de) 1991-03-13
EP0284630A1 (de) 1988-10-05
US4675730A (en) 1987-06-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee