FI20040315A - Materiaalin vianilmaisu spektrikameran avulla - Google Patents

Materiaalin vianilmaisu spektrikameran avulla Download PDF

Info

Publication number
FI20040315A
FI20040315A FI20040315A FI20040315A FI20040315A FI 20040315 A FI20040315 A FI 20040315A FI 20040315 A FI20040315 A FI 20040315A FI 20040315 A FI20040315 A FI 20040315A FI 20040315 A FI20040315 A FI 20040315A
Authority
FI
Finland
Prior art keywords
error detection
spectrum camera
material error
spectrum
camera
Prior art date
Application number
FI20040315A
Other languages
English (en)
Swedish (sv)
Other versions
FI20040315A0 (fi
Inventor
Kaj Soederholm
Risto Ritala
Tapio Kaski
Original Assignee
Tameye Ky
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tameye Ky filed Critical Tameye Ky
Priority to FI20040315A priority Critical patent/FI20040315A/fi
Publication of FI20040315A0 publication Critical patent/FI20040315A0/fi
Priority to CNA2005800116399A priority patent/CN1942756A/zh
Priority to EP05717256A priority patent/EP1718955A1/en
Priority to PCT/FI2005/000129 priority patent/WO2005083401A1/en
Priority to CA002558184A priority patent/CA2558184A1/en
Publication of FI20040315A publication Critical patent/FI20040315A/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0218—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N21/8903—Optical details; Scanning details using a multiple detector array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1208—Prism and grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G01J2003/2813—2D-array
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8917—Paper, also ondulated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34—Paper
    • G01N33/346—Paper paper sheets
FI20040315A 2004-02-27 2004-02-27 Materiaalin vianilmaisu spektrikameran avulla FI20040315A (fi)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FI20040315A FI20040315A (fi) 2004-02-27 2004-02-27 Materiaalin vianilmaisu spektrikameran avulla
CNA2005800116399A CN1942756A (zh) 2004-02-27 2005-02-28 利用光谱照相机检测材料中的偏差
EP05717256A EP1718955A1 (en) 2004-02-27 2005-02-28 Detection of a deviation in a material using a spectral camera
PCT/FI2005/000129 WO2005083401A1 (en) 2004-02-27 2005-02-28 Detection of a deviation in a material using a spectral camera
CA002558184A CA2558184A1 (en) 2004-02-27 2005-02-28 Detection of a deviation in a material using a spectral camera

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20040315A FI20040315A (fi) 2004-02-27 2004-02-27 Materiaalin vianilmaisu spektrikameran avulla

Publications (2)

Publication Number Publication Date
FI20040315A0 FI20040315A0 (fi) 2004-02-27
FI20040315A true FI20040315A (fi) 2005-08-28

Family

ID=31725785

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20040315A FI20040315A (fi) 2004-02-27 2004-02-27 Materiaalin vianilmaisu spektrikameran avulla

Country Status (5)

Country Link
EP (1) EP1718955A1 (fi)
CN (1) CN1942756A (fi)
CA (1) CA2558184A1 (fi)
FI (1) FI20040315A (fi)
WO (1) WO2005083401A1 (fi)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1862795A1 (en) * 2006-05-10 2007-12-05 ABB Schweiz AG Bulk Material Analyzer System
CN107870149B (zh) * 2017-11-01 2020-07-31 武汉能斯特科技有限公司 一种测量的光谱的方法和装置及其用途
CN110376213B (zh) * 2019-08-14 2022-01-25 深圳市麓邦技术有限公司 光学检测系统及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4675730A (en) * 1985-09-06 1987-06-23 Aluminum Company Of America Video surface inspection system
AU627658B2 (en) * 1990-06-13 1992-08-27 Aluminium Company Of America Video inspection system
US6573998B2 (en) * 1997-11-06 2003-06-03 Cynovad, Inc. Optoelectronic system using spatiochromatic triangulation
US9295391B1 (en) * 2000-11-10 2016-03-29 The General Hospital Corporation Spectrally encoded miniature endoscopic imaging probe
FI120053B (fi) * 2000-12-22 2009-06-15 Metso Automation Oy Menetelmä ja laitteisto liikkuvan paperirainan kosteusprofiilin säätämiseksi

Also Published As

Publication number Publication date
CA2558184A1 (en) 2005-09-09
FI20040315A0 (fi) 2004-02-27
EP1718955A1 (en) 2006-11-08
CN1942756A (zh) 2007-04-04
WO2005083401A1 (en) 2005-09-09

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Legal Events

Date Code Title Description
FD Application lapsed