DE3877785D1 - Seitlich bestrahlte detektorenanordnung mit stoerstellenbandleitung. - Google Patents

Seitlich bestrahlte detektorenanordnung mit stoerstellenbandleitung.

Info

Publication number
DE3877785D1
DE3877785D1 DE8888102761A DE3877785A DE3877785D1 DE 3877785 D1 DE3877785 D1 DE 3877785D1 DE 8888102761 A DE8888102761 A DE 8888102761A DE 3877785 A DE3877785 A DE 3877785A DE 3877785 D1 DE3877785 D1 DE 3877785D1
Authority
DE
Germany
Prior art keywords
radiated
detector arrangement
tape line
interference
interference tape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888102761A
Other languages
English (en)
Other versions
DE3877785T2 (de
DE3877785T4 (de
Inventor
Ramasesha Bharat
Michael D Petroff
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Boeing North American Inc
Original Assignee
Rockwell International Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rockwell International Corp filed Critical Rockwell International Corp
Application granted granted Critical
Publication of DE3877785D1 publication Critical patent/DE3877785D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14645—Colour imagers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G01J3/0259—Monolithic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
DE8888102761A 1987-03-02 1988-02-24 Seitlich bestrahlte detektorenanordnung mit stoerstellenbandleitung. Expired - Fee Related DE3877785D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/020,418 US4757210A (en) 1987-03-02 1987-03-02 Edge illuminated detector arrays for determination of spectral content

Publications (1)

Publication Number Publication Date
DE3877785D1 true DE3877785D1 (de) 1993-03-11

Family

ID=21798519

Family Applications (2)

Application Number Title Priority Date Filing Date
DE8888102761A Expired - Fee Related DE3877785D1 (de) 1987-03-02 1988-02-24 Seitlich bestrahlte detektorenanordnung mit stoerstellenbandleitung.
DE88102761T Expired - Lifetime DE3877785T4 (de) 1987-03-02 1988-02-24 Seitlich bestrahlte Detektorenanordnung mit Störstellenbandleitung.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE88102761T Expired - Lifetime DE3877785T4 (de) 1987-03-02 1988-02-24 Seitlich bestrahlte Detektorenanordnung mit Störstellenbandleitung.

Country Status (5)

Country Link
US (1) US4757210A (de)
EP (1) EP0281011B1 (de)
JP (1) JPS63231230A (de)
CA (1) CA1283968C (de)
DE (2) DE3877785D1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE68929071T2 (de) * 1988-03-18 2000-02-03 Nippon Sheet Glass Co Ltd Selbstabtastende Anordnung von lichtemittierenden Bauelementen
US4962304A (en) * 1988-12-23 1990-10-09 Rockwell International Corporation Intrinsic impurity band conduction detectors
US5066994A (en) * 1989-03-31 1991-11-19 Eastman Kodak Company Image sensor
US5001532A (en) * 1989-09-06 1991-03-19 Rockwell International Corporation Impurity band conduction detector having photoluminescent layer
US4943491A (en) * 1989-11-20 1990-07-24 Honeywell Inc. Structure for improving interconnect reliability of focal plane arrays
FR2713017B1 (fr) * 1993-11-23 1996-01-12 Commissariat Energie Atomique Détecteur de rayonnements dans deux bandes de longueurs d'ondes et procédé de fabrication de ce détecteur.
WO2000010033A1 (en) * 1995-10-05 2000-02-24 Z.M.Z. Advanced Systems Ltd Methods and apparatus for recording and reading-out an image formed by ionizing radiation
US7274011B2 (en) * 2004-12-27 2007-09-25 Teledyne Licensing, Llc Spectral imager and fabrication method
JP2010520615A (ja) * 2007-03-01 2010-06-10 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 光検出器装置
JP6021909B2 (ja) 2011-07-21 2016-11-09 ブルックス オートメーション インコーポレイテッド 低温試料グループホルダーにおける寸法変化の補正のための方法と装置
US11211305B2 (en) 2016-04-01 2021-12-28 Texas Instruments Incorporated Apparatus and method to support thermal management of semiconductor-based components
US10861796B2 (en) 2016-05-10 2020-12-08 Texas Instruments Incorporated Floating die package
US10411150B2 (en) * 2016-12-30 2019-09-10 Texas Instruments Incorporated Optical isolation systems and circuits and photon detectors with extended lateral P-N junctions
US10074639B2 (en) 2016-12-30 2018-09-11 Texas Instruments Incorporated Isolator integrated circuits with package structure cavity and fabrication methods

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1003938A (en) * 1974-09-17 1977-01-18 Northern Electric Company, Limited Photodiode detector with selective frequency response
US3987298A (en) * 1975-07-09 1976-10-19 Honeywell Inc. Photodetector system for determination of the wavelength of incident radiation
US4568960A (en) * 1980-10-23 1986-02-04 Rockwell International Corporation Blocked impurity band detectors
US4586068A (en) * 1983-10-07 1986-04-29 Rockwell International Corporation Solid state photomultiplier
US4581625A (en) * 1983-12-19 1986-04-08 Atlantic Richfield Company Vertically integrated solid state color imager
US4618763A (en) * 1985-04-12 1986-10-21 Grumman Aerospace Corporation Infrared focal plane module with stacked IC module body

Also Published As

Publication number Publication date
US4757210A (en) 1988-07-12
EP0281011A3 (en) 1989-08-16
DE3877785T2 (de) 1993-05-27
EP0281011B1 (de) 1993-01-27
EP0281011A2 (de) 1988-09-07
JPS63231230A (ja) 1988-09-27
CA1283968C (en) 1991-05-07
DE3877785T4 (de) 1993-10-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee