DE3866428D1 - Betrieb eines ionenfallen-massenspektrometers mittels chemischer ionisation. - Google Patents

Betrieb eines ionenfallen-massenspektrometers mittels chemischer ionisation.

Info

Publication number
DE3866428D1
DE3866428D1 DE8888304259T DE3866428T DE3866428D1 DE 3866428 D1 DE3866428 D1 DE 3866428D1 DE 8888304259 T DE8888304259 T DE 8888304259T DE 3866428 T DE3866428 T DE 3866428T DE 3866428 D1 DE3866428 D1 DE 3866428D1
Authority
DE
Germany
Prior art keywords
mass spectrometer
ion trap
trap mass
chemical ionisation
ionisation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888304259T
Other languages
English (en)
Inventor
Michael Weber-Grabau
John E P Syka
Stephen C Bradshaw
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Finnigan LLC
Original Assignee
Finnigan Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Finnigan Corp filed Critical Finnigan Corp
Application granted granted Critical
Publication of DE3866428D1 publication Critical patent/DE3866428D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/4265—Controlling the number of trapped ions; preventing space charge effects

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE8888304259T 1987-05-22 1988-05-11 Betrieb eines ionenfallen-massenspektrometers mittels chemischer ionisation. Expired - Fee Related DE3866428D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/053,359 US4771172A (en) 1987-05-22 1987-05-22 Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode

Publications (1)

Publication Number Publication Date
DE3866428D1 true DE3866428D1 (de) 1992-01-09

Family

ID=21983678

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888304259T Expired - Fee Related DE3866428D1 (de) 1987-05-22 1988-05-11 Betrieb eines ionenfallen-massenspektrometers mittels chemischer ionisation.

Country Status (5)

Country Link
US (1) US4771172A (de)
EP (1) EP0292187B1 (de)
JP (1) JP2608100B2 (de)
CA (1) CA1270342A (de)
DE (1) DE3866428D1 (de)

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US4945234A (en) * 1989-05-19 1990-07-31 Extrel Ftms, Inc. Method and apparatus for producing an arbitrary excitation spectrum for Fourier transform mass spectrometry
US5381007A (en) * 1991-02-28 1995-01-10 Teledyne Mec A Division Of Teledyne Industries, Inc. Mass spectrometry method with two applied trapping fields having same spatial form
US5256875A (en) * 1992-05-14 1993-10-26 Teledyne Mec Method for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometry
US5436445A (en) * 1991-02-28 1995-07-25 Teledyne Electronic Technologies Mass spectrometry method with two applied trapping fields having same spatial form
US5200613A (en) * 1991-02-28 1993-04-06 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5451782A (en) * 1991-02-28 1995-09-19 Teledyne Et Mass spectometry method with applied signal having off-resonance frequency
US5449905A (en) * 1992-05-14 1995-09-12 Teledyne Et Method for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometry
US5206507A (en) * 1991-02-28 1993-04-27 Teledyne Mec Mass spectrometry method using filtered noise signal
US5196699A (en) * 1991-02-28 1993-03-23 Teledyne Mec Chemical ionization mass spectrometry method using notch filter
US5173604A (en) * 1991-02-28 1992-12-22 Teledyne Cme Mass spectrometry method with non-consecutive mass order scan
US5134286A (en) * 1991-02-28 1992-07-28 Teledyne Cme Mass spectrometry method using notch filter
US5274233A (en) * 1991-02-28 1993-12-28 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5182451A (en) * 1991-04-30 1993-01-26 Finnigan Corporation Method of operating an ion trap mass spectrometer in a high resolution mode
US5189301A (en) * 1991-08-20 1993-02-23 Cpad Holdings, Ltd. Simple compact ion mobility spectrometer having a focusing electrode which defines a non-uniform field for the drift region
US5272337A (en) * 1992-04-08 1993-12-21 Martin Marietta Energy Systems, Inc. Sample introducing apparatus and sample modules for mass spectrometer
US5381006A (en) * 1992-05-29 1995-01-10 Varian Associates, Inc. Methods of using ion trap mass spectrometers
EP0852390B1 (de) * 1992-05-29 2004-08-11 Varian, Inc. Verfahren zum Betreiben eines Ionenfallen-Massenspektrometers
US5448061A (en) * 1992-05-29 1995-09-05 Varian Associates, Inc. Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling
US5399857A (en) * 1993-05-28 1995-03-21 The Johns Hopkins University Method and apparatus for trapping ions by increasing trapping voltage during ion introduction
DE4324233C1 (de) * 1993-07-20 1995-01-19 Bruker Franzen Analytik Gmbh Verfahren zur Auswahl der Reaktionspfade in Ionenfallen
DE4326549C1 (de) * 1993-08-07 1994-08-25 Bruker Franzen Analytik Gmbh Verfahren für eine Regelung der Raumladung in Ionenfallen
US5396064A (en) * 1994-01-11 1995-03-07 Varian Associates, Inc. Quadrupole trap ion isolation method
DE19501823A1 (de) * 1995-01-21 1996-07-25 Bruker Franzen Analytik Gmbh Verfahren zur Regelung der Erzeugungsraten für massenselektives Einspeichern von Ionen in Ionenfallen
US5670378A (en) * 1995-02-23 1997-09-23 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method for trace oxygen detection
JP3294106B2 (ja) * 1996-05-21 2002-06-24 株式会社日立製作所 三次元四重極質量分析法および装置
JP3413079B2 (ja) * 1997-10-09 2003-06-03 株式会社日立製作所 イオントラップ型質量分析装置
US6239429B1 (en) 1998-10-26 2001-05-29 Mks Instruments, Inc. Quadrupole mass spectrometer assembly
GB0029040D0 (en) 2000-11-29 2001-01-10 Micromass Ltd Orthogonal time of flight mass spectrometer
US7038197B2 (en) * 2001-04-03 2006-05-02 Micromass Limited Mass spectrometer and method of mass spectrometry
AU2003295316A1 (en) * 2002-05-31 2004-04-19 University Of Florida Research Foundation, Inc. Methods and devices for laser desorption chemical ionization
US7316290B2 (en) * 2003-01-30 2008-01-08 Harman International Industries, Incorporated Acoustic lens system
GB0312940D0 (en) * 2003-06-05 2003-07-09 Shimadzu Res Lab Europe Ltd A method for obtaining high accuracy mass spectra using an ion trap mass analyser and a method for determining and/or reducing chemical shift in mass analysis
DE102004001514A1 (de) * 2004-01-09 2005-08-04 Marcus Dr.-Ing. Gohl Verfahren und Vorrichtung zur Bestimmung des Schmierölgehalts in einem Abgasgemisch
CA2570806A1 (en) 2004-06-15 2006-01-05 Griffin Analytical Technologies, Inc. Analytical instruments, assemblies, and methods
GB2439261B (en) * 2005-04-25 2011-02-23 Griffin Analytical Technologies Llc Analytical apparatuses and methods
US7992424B1 (en) 2006-09-14 2011-08-09 Griffin Analytical Technologies, L.L.C. Analytical instrumentation and sample analysis methods
US7656236B2 (en) 2007-05-15 2010-02-02 Teledyne Wireless, Llc Noise canceling technique for frequency synthesizer
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US8179045B2 (en) 2008-04-22 2012-05-15 Teledyne Wireless, Llc Slow wave structure having offset projections comprised of a metal-dielectric composite stack
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
GB0810599D0 (en) 2008-06-10 2008-07-16 Micromass Ltd Mass spectrometer
DE102008029555A1 (de) * 2008-06-21 2010-01-14 Dräger Safety AG & Co. KGaA Verfahren und Vorrichtung für die Spektroskopie mit geladenen Analyten
US8912000B2 (en) * 2008-07-17 2014-12-16 Schlumberger Technology Corporation Downhole mass spectrometric hydrocarbon determination in presence of electron and chemical ionization
US8299421B2 (en) 2010-04-05 2012-10-30 Agilent Technologies, Inc. Low-pressure electron ionization and chemical ionization for mass spectrometry
GB201104225D0 (en) * 2011-03-14 2011-04-27 Micromass Ltd Pre scan for mass to charge ratio range
CA2884457A1 (en) * 2012-09-13 2014-03-20 University Of Maine System Board Of Trustees Radio-frequency ionization in mass spectrometry
WO2014164198A1 (en) 2013-03-11 2014-10-09 David Rafferty Automatic gain control with defocusing lens
US9202660B2 (en) 2013-03-13 2015-12-01 Teledyne Wireless, Llc Asymmetrical slow wave structures to eliminate backward wave oscillations in wideband traveling wave tubes
US8969794B2 (en) 2013-03-15 2015-03-03 1St Detect Corporation Mass dependent automatic gain control for mass spectrometer
GB2583694B (en) * 2019-03-14 2021-12-29 Thermo Fisher Scient Bremen Gmbh Ion trapping scheme with improved mass range
EP3992627A1 (de) 2020-10-28 2022-05-04 Roche Diagnostics GmbH Flüssigkeitschromatographie - stromäquivalenz durch einzelstromkalibrierung

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US3535512A (en) * 1966-07-21 1970-10-20 Varian Associates Double resonance ion cyclotron mass spectrometer for studying ion-molecule reactions
US3937955A (en) * 1974-10-15 1976-02-10 Nicolet Technology Corporation Fourier transform ion cyclotron resonance spectroscopy method and apparatus
US4105917A (en) * 1976-03-26 1978-08-08 The Regents Of The University Of California Method and apparatus for mass spectrometric analysis at ultra-low pressures
DE3124465C2 (de) * 1981-06-22 1985-02-14 Spectrospin AG, Fällanden, Zürich Verfahren zur Ionen-Zyklotron-Resonanz-Spektroskopie
US4540884A (en) * 1982-12-29 1985-09-10 Finnigan Corporation Method of mass analyzing a sample by use of a quadrupole ion trap
US4535235A (en) * 1983-05-06 1985-08-13 Finnigan Corporation Apparatus and method for injection of ions into an ion cyclotron resonance cell
US4686367A (en) * 1985-09-06 1987-08-11 Finnigan Corporation Method of operating quadrupole ion trap chemical ionization mass spectrometry
DE3533364A1 (de) * 1985-09-19 1987-03-26 Bruker Franzen Analytik Gmbh Verfahren und vorrichtung zur untersuchung eines gasgemisches

Also Published As

Publication number Publication date
JP2608100B2 (ja) 1997-05-07
EP0292187A1 (de) 1988-11-23
JPS6486438A (en) 1989-03-31
CA1270342A (en) 1990-06-12
US4771172A (en) 1988-09-13
EP0292187B1 (de) 1991-11-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee