DE3852176D1 - Verfahren zur steuerung einer strahlungsquelle und einer regelbaren strahlungsquelle. - Google Patents

Verfahren zur steuerung einer strahlungsquelle und einer regelbaren strahlungsquelle.

Info

Publication number
DE3852176D1
DE3852176D1 DE3852176T DE3852176T DE3852176D1 DE 3852176 D1 DE3852176 D1 DE 3852176D1 DE 3852176 T DE3852176 T DE 3852176T DE 3852176 T DE3852176 T DE 3852176T DE 3852176 D1 DE3852176 D1 DE 3852176D1
Authority
DE
Germany
Prior art keywords
radiation source
regulatable
controlling
radiation
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3852176T
Other languages
English (en)
Other versions
DE3852176T2 (de
Inventor
Heimo Keraenen
Jouko Malinen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Valtion Teknillinen Tutkimuskeskus
Original Assignee
Valtion Teknillinen Tutkimuskeskus
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Valtion Teknillinen Tutkimuskeskus filed Critical Valtion Teknillinen Tutkimuskeskus
Application granted granted Critical
Publication of DE3852176D1 publication Critical patent/DE3852176D1/de
Publication of DE3852176T2 publication Critical patent/DE3852176T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/28—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
    • G01J1/30—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors
    • G01J1/32—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source using electric radiation detectors adapted for automatic variation of the measured or reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G01J3/0259—Monolithic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G01N2201/0621—Supply
DE3852176T 1987-06-25 1988-06-23 Verfahren zur steuerung einer strahlungsquelle und einer regelbaren strahlungsquelle. Expired - Fee Related DE3852176T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI872824A FI77736C (fi) 1987-06-25 1987-06-25 Foerfarande foer reglering av straolkaella och reglerbar straolkaella.
PCT/FI1988/000103 WO1988010462A1 (en) 1987-06-25 1988-06-23 Procedure for controlling a radiation source and controllable radiation source

Publications (2)

Publication Number Publication Date
DE3852176D1 true DE3852176D1 (de) 1995-01-05
DE3852176T2 DE3852176T2 (de) 1995-06-22

Family

ID=8524727

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3852176T Expired - Fee Related DE3852176T2 (de) 1987-06-25 1988-06-23 Verfahren zur steuerung einer strahlungsquelle und einer regelbaren strahlungsquelle.

Country Status (5)

Country Link
US (1) US5029245A (de)
EP (1) EP0366696B1 (de)
DE (1) DE3852176T2 (de)
FI (1) FI77736C (de)
WO (1) WO1988010462A1 (de)

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US20040188594A1 (en) * 2003-05-01 2004-09-30 Brown Steven W. Spectrally tunable solid-state light source
US7500950B2 (en) 2003-07-25 2009-03-10 Masimo Corporation Multipurpose sensor port
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US8634607B2 (en) * 2003-09-23 2014-01-21 Cambridge Research & Instrumentation, Inc. Spectral imaging of biological samples
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CA2539679A1 (en) * 2005-03-15 2006-09-15 Electronic Design To Market, Inc. System of measuring light transmission and/or reflection
DE102005022175A1 (de) * 2005-05-13 2006-12-21 Carl Zeiss Jena Gmbh Multispektrale Beleuchtungseinheit
US7279678B2 (en) * 2005-08-15 2007-10-09 Schlumber Technology Corporation Method and apparatus for composition analysis in a logging environment
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WO2007061436A1 (en) * 2005-11-28 2007-05-31 University Of South Carolina Self calibration methods for optical analysis system
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US9170154B2 (en) 2006-06-26 2015-10-27 Halliburton Energy Services, Inc. Data validation and classification in optical analysis systems
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EP2078187A2 (de) * 2006-11-02 2009-07-15 University of South Carolina Optisches multianalyt-datenverarbeitungssystem
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DE102009046831B4 (de) * 2009-11-18 2015-02-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Strahlungserzeugungsvorrichtung zum Erzeugen einer elektromagnetischen Strahlung mit einer einstellbaren spektralen Zusammensetzung und Verfahren zur Herstellung derselben
JP5796275B2 (ja) * 2010-06-02 2015-10-21 セイコーエプソン株式会社 分光測定器
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Also Published As

Publication number Publication date
DE3852176T2 (de) 1995-06-22
FI872824A0 (fi) 1987-06-25
EP0366696A1 (de) 1990-05-09
FI77736B (fi) 1988-12-30
WO1988010462A1 (en) 1988-12-29
US5029245A (en) 1991-07-02
FI77736C (fi) 1989-04-10
EP0366696B1 (de) 1994-11-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee