DE3789890D1 - Verfahren und Vorrichtung zur Anwendung eines elektrooptischen Detektors in einem mikrotomographischen System. - Google Patents

Verfahren und Vorrichtung zur Anwendung eines elektrooptischen Detektors in einem mikrotomographischen System.

Info

Publication number
DE3789890D1
DE3789890D1 DE3789890T DE3789890T DE3789890D1 DE 3789890 D1 DE3789890 D1 DE 3789890D1 DE 3789890 T DE3789890 T DE 3789890T DE 3789890 T DE3789890 T DE 3789890T DE 3789890 D1 DE3789890 D1 DE 3789890D1
Authority
DE
Germany
Prior art keywords
electro
optical detector
microtomographic
microtomographic system
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3789890T
Other languages
English (en)
Other versions
DE3789890T2 (de
Inventor
Harry William Deckman
Brian Paul Flannery
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ExxonMobil Technology and Engineering Co
Original Assignee
Exxon Research and Engineering Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Exxon Research and Engineering Co filed Critical Exxon Research and Engineering Co
Application granted granted Critical
Publication of DE3789890D1 publication Critical patent/DE3789890D1/de
Publication of DE3789890T2 publication Critical patent/DE3789890T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S378/00—X-ray or gamma ray systems or devices
    • Y10S378/901—Computer tomography program or processor
DE3789890T 1986-11-19 1987-11-19 Verfahren und Vorrichtung zur Anwendung eines elektrooptischen Detektors in einem mikrotomographischen System. Expired - Fee Related DE3789890T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/932,273 US4891829A (en) 1986-11-19 1986-11-19 Method and apparatus for utilizing an electro-optic detector in a microtomography system

Publications (2)

Publication Number Publication Date
DE3789890D1 true DE3789890D1 (de) 1994-06-30
DE3789890T2 DE3789890T2 (de) 1994-09-08

Family

ID=25462066

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3789890T Expired - Fee Related DE3789890T2 (de) 1986-11-19 1987-11-19 Verfahren und Vorrichtung zur Anwendung eines elektrooptischen Detektors in einem mikrotomographischen System.

Country Status (6)

Country Link
US (1) US4891829A (de)
EP (1) EP0268488B1 (de)
JP (1) JPS63308548A (de)
CA (1) CA1282192C (de)
DE (1) DE3789890T2 (de)
NO (1) NO174224C (de)

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Also Published As

Publication number Publication date
EP0268488A2 (de) 1988-05-25
NO174224C (no) 1994-03-30
DE3789890T2 (de) 1994-09-08
JPS63308548A (ja) 1988-12-15
EP0268488B1 (de) 1994-05-25
EP0268488A3 (en) 1990-03-14
NO874773D0 (no) 1987-11-16
CA1282192C (en) 1991-03-26
NO174224B (no) 1993-12-20
US4891829A (en) 1990-01-02
NO874773L (no) 1988-05-20

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