DE3786576T2 - Belichtungsfühler. - Google Patents

Belichtungsfühler.

Info

Publication number
DE3786576T2
DE3786576T2 DE87400398T DE3786576T DE3786576T2 DE 3786576 T2 DE3786576 T2 DE 3786576T2 DE 87400398 T DE87400398 T DE 87400398T DE 3786576 T DE3786576 T DE 3786576T DE 3786576 T2 DE3786576 T2 DE 3786576T2
Authority
DE
Germany
Prior art keywords
exposure sensor
exposure
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE87400398T
Other languages
English (en)
Other versions
DE3786576D1 (de
Inventor
Alain Pilot
Marcel Grasset
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales Avionics SAS
Original Assignee
Thales Avionics SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thales Avionics SAS filed Critical Thales Avionics SAS
Application granted granted Critical
Publication of DE3786576D1 publication Critical patent/DE3786576D1/de
Publication of DE3786576T2 publication Critical patent/DE3786576T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0418—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using attenuators
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0232—Optical elements or arrangements associated with the device
    • H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0204—Compact construction

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE87400398T 1986-03-28 1987-02-24 Belichtungsfühler. Expired - Fee Related DE3786576T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8604526A FR2596516B1 (fr) 1986-03-28 1986-03-28 Capteur d'eclairement perfectionne

Publications (2)

Publication Number Publication Date
DE3786576D1 DE3786576D1 (de) 1993-08-26
DE3786576T2 true DE3786576T2 (de) 1994-01-05

Family

ID=9333684

Family Applications (1)

Application Number Title Priority Date Filing Date
DE87400398T Expired - Fee Related DE3786576T2 (de) 1986-03-28 1987-02-24 Belichtungsfühler.

Country Status (5)

Country Link
US (1) US4795899A (de)
EP (1) EP0239443B1 (de)
JP (1) JPS62237329A (de)
DE (1) DE3786576T2 (de)
FR (1) FR2596516B1 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2072800B1 (es) * 1992-07-17 1996-02-16 Corral Enrique Gallar Regulador de intensidad de arco en tubos fluorescentes.
DE4407792C1 (de) * 1994-03-09 1995-07-13 Nat Rejectors Gmbh Vorrichtung zur optischen Prüfung von Münzen
US6393927B1 (en) * 1995-03-24 2002-05-28 Li-Cor, Inc. Method and apparatus for real-time determination and application of nitrogen fertilizer using rapid, non-destructive crop canopy measurements
DE19624494A1 (de) * 1996-06-19 1998-01-02 Sick Ag Sensoranordnung
CN102472571A (zh) * 2009-09-30 2012-05-23 松下电器产业株式会社 冷藏库

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1028357B (de) * 1955-03-22 1958-04-17 Patra Patent Treuhand Beleuchtungsmesservorsatz fuer cos-richtige Beleuchtungsstaerkemessungen
FR1355752A (fr) * 1963-02-07 1964-03-20 Détecteur d'éclairs nucléaires
CH408211A (de) * 1963-09-27 1966-02-28 Landis & Gyr Ag Fühler für eine lichtelektrische Schalteinrichtung
DE1240295B (de) * 1964-02-06 1967-05-11 Kodak Ag Vorrichtung zur Belichtungsmessung mit einer Fotozelle und einem das vom zu fotografierenden Objekt einfallende Licht integrierenden Diffusor
US3709615A (en) * 1969-02-28 1973-01-09 Calumet Photographic Inc Integrating light meter with movable meter mechanism
JPS4946782B1 (de) * 1971-06-29 1974-12-12
US3880528A (en) * 1973-07-02 1975-04-29 Tektronix Inc Light probe
FR2262794A1 (en) * 1974-02-28 1975-09-26 Scit Photosensitive element light reception adjuster - has translucent or transparent screw with opaque head in light path
DE2654465C3 (de) * 1976-12-01 1981-12-03 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Mischkammer in Form eines innen verspiegelten optischen Kanals
US4178101A (en) * 1977-03-16 1979-12-11 Booth Charles R Scalar irradiance meter
JPS6059125B2 (ja) * 1983-06-18 1985-12-24 豊田合成株式会社 合成樹脂成形装置
US4703173A (en) * 1986-03-06 1987-10-27 Fusion Systems Corporation Probe for collecting light for a radiation monitoring device

Also Published As

Publication number Publication date
JPS62237329A (ja) 1987-10-17
FR2596516B1 (fr) 1988-06-10
EP0239443B1 (de) 1993-07-21
EP0239443A3 (en) 1990-02-07
DE3786576D1 (de) 1993-08-26
EP0239443A2 (de) 1987-09-30
FR2596516A1 (fr) 1987-10-02
US4795899A (en) 1989-01-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee