DE3785398D1 - Aktive lastschaltung. - Google Patents
Aktive lastschaltung.Info
- Publication number
- DE3785398D1 DE3785398D1 DE8787108417T DE3785398T DE3785398D1 DE 3785398 D1 DE3785398 D1 DE 3785398D1 DE 8787108417 T DE8787108417 T DE 8787108417T DE 3785398 T DE3785398 T DE 3785398T DE 3785398 D1 DE3785398 D1 DE 3785398D1
- Authority
- DE
- Germany
- Prior art keywords
- active power
- power switching
- switching
- active
- power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Logic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/888,908 US4712058A (en) | 1986-07-22 | 1986-07-22 | Active load network |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3785398D1 true DE3785398D1 (de) | 1993-05-19 |
DE3785398T2 DE3785398T2 (de) | 1993-07-29 |
Family
ID=25394148
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8787108417T Expired - Fee Related DE3785398T2 (de) | 1986-07-22 | 1987-06-11 | Aktive lastschaltung. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4712058A (de) |
EP (1) | EP0254012B1 (de) |
JP (1) | JPH0614099B2 (de) |
CA (1) | CA1273061A (de) |
DE (1) | DE3785398T2 (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4007978A1 (de) * | 1989-03-17 | 1990-09-20 | Tektronix Inc | Ausgangstreiber-schaltungsanordnung zur minimierung von uebergangsimpedanzschwankungen und verfahren zur minimierung von impedanzfehlanpassungen |
US5010297A (en) * | 1989-12-01 | 1991-04-23 | Analog Devices, Incorporated | Automatic test equipment with active load having high-speed inhibit mode switching |
US5652524A (en) * | 1995-10-24 | 1997-07-29 | Unisys Corporation | Built-in load board design for performing high resolution quiescent current measurements of a device under test |
US5721495A (en) * | 1995-10-24 | 1998-02-24 | Unisys Corporation | Circuit for measuring quiescent current |
US5952821A (en) * | 1997-08-29 | 1999-09-14 | Credence Systems Corporation | Load circuit for integrated circuit tester |
DE10001154A1 (de) * | 2000-01-13 | 2001-07-26 | Infineon Technologies Ag | Schaltungsanordnung zur Simulation der Eingangs- oder Ausganslast einer Analogschaltung |
US6535831B1 (en) * | 2000-07-14 | 2003-03-18 | 3Com Corporation | Method for sourcing three level data from a two level tester pin faster than the maximum rate of a tester |
JP4538714B2 (ja) * | 2003-11-26 | 2010-09-08 | 横河電機株式会社 | テスタシミュレーション装置及びテスタシミュレーション方法 |
US7023233B1 (en) * | 2004-10-12 | 2006-04-04 | Advantest Corporation | Test apparatus and test method |
US20060214812A1 (en) * | 2005-03-25 | 2006-09-28 | Ainsworth Kenneth M | Measurement of output voltage characteristics on dynamic logic signals |
US20090063085A1 (en) * | 2007-09-05 | 2009-03-05 | Teradyne,Inc. | Pmu testing via a pe stage |
AT518368B1 (de) * | 2016-02-15 | 2021-06-15 | Omicron Electronics Gmbh | Prüfgerät und Verfahren zum Prüfen einer Steuereinheit einer Schaltvorrichtung einer Schaltanlage |
DE102017103246B4 (de) | 2016-04-08 | 2020-11-19 | Infineon Technologies Ag | Vor Überspannungsbedingungen geschützte Stromverteilungsvorrichtung |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US955006A (en) * | 1909-01-27 | 1910-04-12 | Joseph Everett Sparks | Abdominal retractor. |
US3492572A (en) * | 1966-10-10 | 1970-01-27 | Ibm | Programmable electronic circuit testing apparatus having plural multifunction test condition generating circuits |
US4027305A (en) * | 1973-08-09 | 1977-05-31 | Canon Kabushiki Kaisha | System for driving liquid crystal display device |
US3849726A (en) * | 1974-01-28 | 1974-11-19 | Sperry Rand Corp | Universal programmable digital testing interface line |
JPS50132821A (de) * | 1974-04-05 | 1975-10-21 | ||
US3936676A (en) * | 1974-05-16 | 1976-02-03 | Hitachi, Ltd. | Multi-level voltage supply circuit for liquid crystal display device |
GB1513930A (en) * | 1974-12-20 | 1978-06-14 | Seiko Instr & Electronics | Battery voltage detecting device |
JPS5196275A (de) * | 1975-02-20 | 1976-08-24 | ||
JPS53106532A (en) * | 1977-02-28 | 1978-09-16 | Toshiba Corp | Logic circuit |
US4216539A (en) * | 1978-05-05 | 1980-08-05 | Zehntel, Inc. | In-circuit digital tester |
US4357574A (en) * | 1979-05-21 | 1982-11-02 | Takamisawa Cybernetics Co., Ltd. | Loading apparatus for testing a power supply |
US4380710A (en) * | 1981-02-05 | 1983-04-19 | Harris Corporation | TTL to CMOS Interface circuit |
US4472678A (en) * | 1981-08-10 | 1984-09-18 | Mostek Corporation | Test apparatus for circuits having a multiplex input/output terminal including a load connected to the terminal together with circuitry for monitoring the current flow through the load when inputting a signal to the terminal |
JPS5957175A (ja) * | 1982-09-27 | 1984-04-02 | Fujitsu Ltd | 集積回路の測定方法 |
US4540904A (en) * | 1983-05-03 | 1985-09-10 | The United States Of America As Represented By The Secretary Of The Air Force | Tri-state type driver circuit |
US4570262A (en) * | 1983-06-22 | 1986-02-11 | The Boeing Company | Programmable universal logic driver |
-
1986
- 1986-07-22 US US06/888,908 patent/US4712058A/en not_active Expired - Lifetime
-
1987
- 1987-06-11 DE DE8787108417T patent/DE3785398T2/de not_active Expired - Fee Related
- 1987-06-11 EP EP87108417A patent/EP0254012B1/de not_active Expired - Lifetime
- 1987-06-25 CA CA000540565A patent/CA1273061A/en not_active Expired - Fee Related
- 1987-06-30 JP JP62163844A patent/JPH0614099B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE3785398T2 (de) | 1993-07-29 |
CA1273061A (en) | 1990-08-21 |
EP0254012B1 (de) | 1993-04-14 |
EP0254012A3 (en) | 1989-07-12 |
US4712058A (en) | 1987-12-08 |
JPS6332379A (ja) | 1988-02-12 |
JPH0614099B2 (ja) | 1994-02-23 |
EP0254012A2 (de) | 1988-01-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: CREDENCE SYSTEMS CORP. (N.D.GESETZEN D.STAATES DEL |
|
8339 | Ceased/non-payment of the annual fee |