DE3760833D1 - Method of detecting the presence or absence of defect of transparent circuit board having fine transparent electric conductive circuit - Google Patents

Method of detecting the presence or absence of defect of transparent circuit board having fine transparent electric conductive circuit

Info

Publication number
DE3760833D1
DE3760833D1 DE8787303908T DE3760833T DE3760833D1 DE 3760833 D1 DE3760833 D1 DE 3760833D1 DE 8787303908 T DE8787303908 T DE 8787303908T DE 3760833 T DE3760833 T DE 3760833T DE 3760833 D1 DE3760833 D1 DE 3760833D1
Authority
DE
Germany
Prior art keywords
transparent
defect
absence
detecting
electric conductive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8787303908T
Other languages
English (en)
Inventor
Suzuki Tameyuki
Yasukawa Junichi
Nomura Toyokazu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinto Paint Co Ltd
Original Assignee
Shinto Paint Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinto Paint Co Ltd filed Critical Shinto Paint Co Ltd
Application granted granted Critical
Publication of DE3760833D1 publication Critical patent/DE3760833D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01—Dielectrics
    • H05K2201/0104—Properties and characteristics in general
    • H05K2201/0108—Transparent
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03—Conductive materials
    • H05K2201/032—Materials
    • H05K2201/0326—Inorganic, non-metallic conductor, e.g. indium-tin oxide [ITO]
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/13—Moulding and encapsulation; Deposition techniques; Protective layers
    • H05K2203/1333—Deposition techniques, e.g. coating
    • H05K2203/135—Electrophoretic deposition of insulating material
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16—Inspection; Monitoring; Aligning
    • H05K2203/161—Using chemical substances, e.g. colored or fluorescent, for facilitating optical or visual inspection

Landscapes

  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Liquid Crystal (AREA)
  • Manufacturing Of Electric Cables (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Optical Filters (AREA)
DE8787303908T 1986-05-01 1987-04-30 Method of detecting the presence or absence of defect of transparent circuit board having fine transparent electric conductive circuit Expired DE3760833D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61101714A JPH0690151B2 (ja) 1986-05-01 1986-05-01 微細な透明導電回路を有する透明回路基板の欠陥の有無検出法

Publications (1)

Publication Number Publication Date
DE3760833D1 true DE3760833D1 (en) 1989-11-23

Family

ID=14307971

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787303908T Expired DE3760833D1 (en) 1986-05-01 1987-04-30 Method of detecting the presence or absence of defect of transparent circuit board having fine transparent electric conductive circuit

Country Status (3)

Country Link
EP (1) EP0244259B1 (de)
JP (1) JPH0690151B2 (de)
DE (1) DE3760833D1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103809309A (zh) * 2014-01-22 2014-05-21 北京京东方显示技术有限公司 基板检测设备及方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2642462B2 (ja) * 1988-12-12 1997-08-20 シャープ株式会社 マトリクス形表示装置用基板および検査修正方法
US5937512A (en) * 1996-01-11 1999-08-17 Micron Communications, Inc. Method of forming a circuit board
CN103792705B (zh) * 2014-01-28 2017-02-01 北京京东方显示技术有限公司 检测基板缺陷的检测方法及检测装置
JP6323266B2 (ja) * 2014-09-03 2018-05-16 大日本印刷株式会社 蒸着マスクの検査方法
CN109683358B (zh) * 2019-01-22 2022-08-12 成都中电熊猫显示科技有限公司 检测方法、装置和存储介质
JP7274377B2 (ja) * 2019-07-19 2023-05-16 信越ポリマー株式会社 多層回路基板

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5683093A (en) * 1979-12-11 1981-07-07 Fujitsu Ltd Method of inspecting printed circuit pattern
US4400618A (en) * 1981-08-06 1983-08-23 International Business Machines Corporation Method of detecting and analyzing damage in printed circuit boards

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103809309A (zh) * 2014-01-22 2014-05-21 北京京东方显示技术有限公司 基板检测设备及方法
CN103809309B (zh) * 2014-01-22 2016-07-06 北京京东方显示技术有限公司 基板检测设备及方法

Also Published As

Publication number Publication date
JPS62258490A (ja) 1987-11-10
EP0244259B1 (de) 1989-10-18
JPH0690151B2 (ja) 1994-11-14
EP0244259A1 (de) 1987-11-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee