DE3672583D1 - Anordnung fuer das optische messen von oberflaechenprofilen. - Google Patents

Anordnung fuer das optische messen von oberflaechenprofilen.

Info

Publication number
DE3672583D1
DE3672583D1 DE8686202021T DE3672583T DE3672583D1 DE 3672583 D1 DE3672583 D1 DE 3672583D1 DE 8686202021 T DE8686202021 T DE 8686202021T DE 3672583 T DE3672583 T DE 3672583T DE 3672583 D1 DE3672583 D1 DE 3672583D1
Authority
DE
Germany
Prior art keywords
arrangement
optical measurement
surface profiles
measure
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686202021T
Other languages
English (en)
Inventor
Henricus Mathias Marie Kessels
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Application granted granted Critical
Publication of DE3672583D1 publication Critical patent/DE3672583D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE8686202021T 1985-11-19 1986-11-17 Anordnung fuer das optische messen von oberflaechenprofilen. Expired - Lifetime DE3672583D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL8503182A NL8503182A (nl) 1985-11-19 1985-11-19 Inrichting voor het langs optische weg meten van een oppervlakteprofiel.

Publications (1)

Publication Number Publication Date
DE3672583D1 true DE3672583D1 (de) 1990-08-16

Family

ID=19846892

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686202021T Expired - Lifetime DE3672583D1 (de) 1985-11-19 1986-11-17 Anordnung fuer das optische messen von oberflaechenprofilen.

Country Status (7)

Country Link
US (1) US4808003A (de)
EP (1) EP0227136B1 (de)
JP (1) JPH0726821B2 (de)
KR (1) KR940003916B1 (de)
AT (1) ATE54489T1 (de)
DE (1) DE3672583D1 (de)
NL (1) NL8503182A (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5113082A (en) * 1990-09-11 1992-05-12 Moshe Golberstein Electro-optical instrument with self-contained photometer
NL9100205A (nl) * 1991-02-06 1992-09-01 Philips Nv Inrichting voor het optisch meten van de hoogte van een oppervlak.
GB9107740D0 (en) * 1991-04-11 1991-05-29 Atomic Energy Authority Uk Method of monitoring displacements
DE69735943T2 (de) * 1996-11-26 2007-01-04 Assembléon N.V. Methode zum anordnen von bauteilen auf einem träger mit kalibrierungsverfahren und vorrichtung dafür
AU5925300A (en) * 1999-07-10 2001-01-30 Tay Bok Her Post-seal inspection system and method
DE202004009727U1 (de) 2004-06-21 2004-10-07 Trioptics Gmbh Vorrichtung zur Messung von Winkeln optischer Oberflächen
JP2016201002A (ja) * 2015-04-10 2016-12-01 船井電機株式会社 位置検出装置及び空間入力装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2116872A5 (fr) * 1970-12-10 1972-07-21 Compteurs Comp D Perfectionnements aux dispositifs palpeurs optiques
US3692414A (en) * 1971-02-24 1972-09-19 Harry L Hosterman Non-contacting measuring probe
US4379647A (en) * 1971-10-18 1983-04-12 Paul S. Kempf Optical comparator and inspection apparatus
AR205243A1 (es) 1972-05-11 1976-04-21 Philips Nv Aparato para la lectura de un portador de grabacion reflector plano
US3944369A (en) * 1974-05-24 1976-03-16 Bell Telephone Laboratories, Incorporated Optical comparator system to separate unacceptable defects from acceptable edge aberrations
US4017188A (en) * 1975-02-26 1977-04-12 The Bendix Corporation Surface profile measuring device and method
US4158507A (en) * 1977-07-27 1979-06-19 Recognition Equipment Incorporated Laser measuring system for inspection
DE2903529A1 (de) * 1979-01-31 1980-08-07 Schlatter Ag Verfahren zum messen von entfernungen und vorrichtung zur durchfuehrung des verfahrens
US4383168A (en) * 1980-06-02 1983-05-10 Raytheon Company Automatic focusing apparatus
US4427880A (en) * 1981-06-29 1984-01-24 Westinghouse Electric Corp. Non-contact visual proximity sensing apparatus
JPS5963503A (ja) * 1982-10-02 1984-04-11 Canon Inc マ−ク位置検出方法
DE3315576A1 (de) * 1983-04-29 1984-10-31 Hommelwerke GmbH, 7730 Villingen-Schwenningen Einrichtung zur optischen abstandsmessung, insbesondere zur messung von profilen von werkstuecken oder schneidkanten von werkzeugen
US4627734A (en) * 1983-06-30 1986-12-09 Canadian Patents And Development Limited Three dimensional imaging method and device

Also Published As

Publication number Publication date
JPH0726821B2 (ja) 1995-03-29
JPS62121305A (ja) 1987-06-02
EP0227136B1 (de) 1990-07-11
KR940003916B1 (ko) 1994-05-09
ATE54489T1 (de) 1990-07-15
NL8503182A (nl) 1987-06-16
US4808003A (en) 1989-02-28
KR870005235A (ko) 1987-06-05
EP0227136A1 (de) 1987-07-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: PHILIPS ELECTRONICS N.V., EINDHOVEN, NL

8339 Ceased/non-payment of the annual fee