DE3665631D1 - Electrical interface arrangements - Google Patents

Electrical interface arrangements

Info

Publication number
DE3665631D1
DE3665631D1 DE8686300441T DE3665631T DE3665631D1 DE 3665631 D1 DE3665631 D1 DE 3665631D1 DE 8686300441 T DE8686300441 T DE 8686300441T DE 3665631 T DE3665631 T DE 3665631T DE 3665631 D1 DE3665631 D1 DE 3665631D1
Authority
DE
Germany
Prior art keywords
arrays
circuit board
array
pressure
electrical interface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8686300441T
Other languages
German (de)
English (en)
Inventor
Frank Harry Jenner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Marconi Instruments Ltd
Original Assignee
Marconi Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marconi Instruments Ltd filed Critical Marconi Instruments Ltd
Application granted granted Critical
Publication of DE3665631D1 publication Critical patent/DE3665631D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Bipolar Transistors (AREA)
  • Surgical Instruments (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Organic Insulating Materials (AREA)
  • Insulated Conductors (AREA)
DE8686300441T 1985-03-05 1986-01-23 Electrical interface arrangements Expired DE3665631D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08505566A GB2172150B (en) 1985-03-05 1985-03-05 Probe arrays for testing circuit boards

Publications (1)

Publication Number Publication Date
DE3665631D1 true DE3665631D1 (en) 1989-10-19

Family

ID=10575423

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686300441T Expired DE3665631D1 (en) 1985-03-05 1986-01-23 Electrical interface arrangements

Country Status (4)

Country Link
EP (1) EP0196149B1 (fr)
AT (1) ATE46398T1 (fr)
DE (1) DE3665631D1 (fr)
GB (1) GB2172150B (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0256368B1 (fr) * 1986-08-07 1992-09-30 Siemens Aktiengesellschaft Dispositif de test pour circuits imprimés équipés à contact double face graduel
GB8622878D0 (en) * 1986-09-23 1986-10-29 Marconi Instruments Ltd Electrical interface arrangement
DE4335841C1 (de) * 1993-10-20 1995-06-01 Siemens Nixdorf Inf Syst Vakuumadapter
DE102004007696B4 (de) * 2004-02-16 2009-01-02 Infineon Technologies Ag Testvorrichtung zum Prüfen eines Halbleiterbauteils mit Kontaktflächen auf seiner Oberseite und seiner Unterseite und Verfahren zum Prüfen des Halbleiterbauteils

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2918648A (en) * 1956-06-15 1959-12-22 Philco Corp Testing apparatus
GB1151833A (en) * 1968-01-22 1969-05-14 Cossor Ltd A C A Clip for Facilitating the Testing of Micro-Electronic Packages.
GB1503927A (en) * 1975-08-14 1978-03-15 Continental Specialties Corp Electrical test clips
US4012097A (en) * 1975-10-17 1977-03-15 Everett/Charles, Inc. Combined test clip and component extraction tool
GB1530350A (en) * 1976-10-23 1978-10-25 Marconi Instruments Ltd Electrical test jigs

Also Published As

Publication number Publication date
GB8505566D0 (en) 1985-04-03
GB2172150B (en) 1988-06-08
ATE46398T1 (de) 1989-09-15
EP0196149A1 (fr) 1986-10-01
GB2172150A (en) 1986-09-10
EP0196149B1 (fr) 1989-09-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee