DE3665631D1 - Electrical interface arrangements - Google Patents
Electrical interface arrangementsInfo
- Publication number
- DE3665631D1 DE3665631D1 DE8686300441T DE3665631T DE3665631D1 DE 3665631 D1 DE3665631 D1 DE 3665631D1 DE 8686300441 T DE8686300441 T DE 8686300441T DE 3665631 T DE3665631 T DE 3665631T DE 3665631 D1 DE3665631 D1 DE 3665631D1
- Authority
- DE
- Germany
- Prior art keywords
- arrays
- circuit board
- array
- pressure
- electrical interface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
- G01R1/07335—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards for double-sided contacting or for testing boards with surface-mounted devices (SMD's)
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Organic Insulating Materials (AREA)
- Insulated Conductors (AREA)
- Bipolar Transistors (AREA)
- Surgical Instruments (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB08505566A GB2172150B (en) | 1985-03-05 | 1985-03-05 | Probe arrays for testing circuit boards |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3665631D1 true DE3665631D1 (en) | 1989-10-19 |
Family
ID=10575423
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8686300441T Expired DE3665631D1 (en) | 1985-03-05 | 1986-01-23 | Electrical interface arrangements |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0196149B1 (de) |
AT (1) | ATE46398T1 (de) |
DE (1) | DE3665631D1 (de) |
GB (1) | GB2172150B (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3781979D1 (de) * | 1986-08-07 | 1992-11-05 | Siemens Ag | Pruefeinrichtung fuer beidseitige, zweistufige kontaktierung bestueckter leiterplatten. |
GB8622878D0 (en) * | 1986-09-23 | 1986-10-29 | Marconi Instruments Ltd | Electrical interface arrangement |
DE4335841C1 (de) * | 1993-10-20 | 1995-06-01 | Siemens Nixdorf Inf Syst | Vakuumadapter |
DE102004007696B4 (de) | 2004-02-16 | 2009-01-02 | Infineon Technologies Ag | Testvorrichtung zum Prüfen eines Halbleiterbauteils mit Kontaktflächen auf seiner Oberseite und seiner Unterseite und Verfahren zum Prüfen des Halbleiterbauteils |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2918648A (en) * | 1956-06-15 | 1959-12-22 | Philco Corp | Testing apparatus |
GB1151833A (en) * | 1968-01-22 | 1969-05-14 | Cossor Ltd A C | A Clip for Facilitating the Testing of Micro-Electronic Packages. |
GB1503927A (en) * | 1975-08-14 | 1978-03-15 | Continental Specialties Corp | Electrical test clips |
US4012097A (en) * | 1975-10-17 | 1977-03-15 | Everett/Charles, Inc. | Combined test clip and component extraction tool |
GB1530350A (en) * | 1976-10-23 | 1978-10-25 | Marconi Instruments Ltd | Electrical test jigs |
-
1985
- 1985-03-05 GB GB08505566A patent/GB2172150B/en not_active Expired
-
1986
- 1986-01-23 AT AT86300441T patent/ATE46398T1/de active
- 1986-01-23 DE DE8686300441T patent/DE3665631D1/de not_active Expired
- 1986-01-23 EP EP86300441A patent/EP0196149B1/de not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB2172150B (en) | 1988-06-08 |
GB8505566D0 (en) | 1985-04-03 |
EP0196149A1 (de) | 1986-10-01 |
ATE46398T1 (de) | 1989-09-15 |
GB2172150A (en) | 1986-09-10 |
EP0196149B1 (de) | 1989-09-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |