DE3628857C2 - - Google Patents

Info

Publication number
DE3628857C2
DE3628857C2 DE3628857A DE3628857A DE3628857C2 DE 3628857 C2 DE3628857 C2 DE 3628857C2 DE 3628857 A DE3628857 A DE 3628857A DE 3628857 A DE3628857 A DE 3628857A DE 3628857 C2 DE3628857 C2 DE 3628857C2
Authority
DE
Germany
Prior art keywords
type
region
drain
cat
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3628857A
Other languages
German (de)
English (en)
Other versions
DE3628857A1 (de
Inventor
Gourab Itami Hyogo Jp Majumdar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP19073585A external-priority patent/JPS6248073A/ja
Priority claimed from JP60190734A external-priority patent/JPH0715998B2/ja
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE3628857A1 publication Critical patent/DE3628857A1/de
Application granted granted Critical
Publication of DE3628857C2 publication Critical patent/DE3628857C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D12/00—Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
    • H10D12/411—Insulated-gate bipolar transistors [IGBT]
    • H10D12/441—Vertical IGBTs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
    • H10D62/141—Anode or cathode regions of thyristors; Collector or emitter regions of gated bipolar-mode devices, e.g. of IGBTs
    • H10D62/142—Anode regions of thyristors or collector regions of gated bipolar-mode devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Junction Field-Effect Transistors (AREA)
DE19863628857 1985-08-27 1986-08-25 Halbleitereinrichtung Granted DE3628857A1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP19073585A JPS6248073A (ja) 1985-08-27 1985-08-27 半導体装置
JP60190734A JPH0715998B2 (ja) 1985-08-27 1985-08-27 半導体装置

Publications (2)

Publication Number Publication Date
DE3628857A1 DE3628857A1 (de) 1987-03-12
DE3628857C2 true DE3628857C2 (en:Method) 1992-02-13

Family

ID=26506271

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19863628857 Granted DE3628857A1 (de) 1985-08-27 1986-08-25 Halbleitereinrichtung

Country Status (3)

Country Link
US (1) US4841345A (en:Method)
DE (1) DE3628857A1 (en:Method)
FR (1) FR2586862B1 (en:Method)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4234152A1 (de) * 1991-10-24 1993-04-29 Fuji Electric Co Ltd In seiner leitfaehigkeit modulierter mosfet-typ
DE4318205A1 (de) * 1992-06-01 1993-12-02 Fuji Electric Co Ltd Halbleitervorrichtung

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0680832B2 (ja) * 1987-09-30 1994-10-12 日本電気株式会社 半導体装置
EP0313000B1 (de) * 1987-10-21 1998-05-06 Siemens Aktiengesellschaft Verfahren zum Herstellen eines Bipolartransistors mit isolierter Gateelektrode
JPH07109882B2 (ja) * 1988-02-26 1995-11-22 三菱電機株式会社 バイポーラ型半導体スイッチング装置
US5159425A (en) * 1988-06-08 1992-10-27 Ixys Corporation Insulated gate device with current mirror having bi-directional capability
EP0366916B1 (en) * 1988-10-04 1995-06-14 Kabushiki Kaisha Toshiba Shorted-anode semiconductor device and methods of making the same
EP0371785B1 (en) * 1988-11-29 1996-05-01 Kabushiki Kaisha Toshiba Lateral conductivity modulated MOSFET
JPH02312280A (ja) * 1989-05-26 1990-12-27 Mitsubishi Electric Corp 絶縁ゲート型バイポーラトランジスタ
EP0409010A1 (de) * 1989-07-19 1991-01-23 Asea Brown Boveri Ag Abschaltbares Leistungshalbleiterbauelement
JPH03155677A (ja) * 1989-08-19 1991-07-03 Fuji Electric Co Ltd 伝導度変調型ｍｏｓｆｅｔ
JP2663679B2 (ja) * 1990-04-20 1997-10-15 富士電機株式会社 伝導度変調型ｍｏｓｆｅｔ
DE4114349C2 (de) * 1990-05-10 2001-05-31 Fuji Electric Co Ltd Bipolartransistor mit isoliertem Gate (IGBT)
DE4134855C2 (de) * 1990-10-31 2001-03-15 Fuji Electric Co Ltd MOS-Halbleiterelement
US5141889A (en) * 1990-11-30 1992-08-25 Motorola, Inc. Method of making enhanced insulated gate bipolar transistor
JP2782638B2 (ja) * 1990-12-28 1998-08-06 富士電機株式会社 Ｍｏｓコントロールサイリスタ
US5475243A (en) * 1991-07-02 1995-12-12 Fuji Electric Co., Ltd. Semiconductor device including an IGBT and a current-regenerative diode
DE4125074A1 (de) * 1991-07-29 1993-02-11 Siemens Ag Durch feldeffekt steuerbares halbleiterbauelement
JP2810821B2 (ja) * 1992-03-30 1998-10-15 三菱電機株式会社 半導体装置及びその製造方法
FR2700418B1 (fr) * 1993-01-12 1995-04-07 France Telecom Composant électronique capable de résistance dynamique négative et procédé de fabrication correspondant.
RU2370855C1 (ru) * 2008-02-18 2009-10-20 Открытое акционерное общество "Воронежский завод полупроводниковых приборов - сборка" Транзистор с ограничением тока и способ его изготовления
JP2011023527A (ja) * 2009-07-15 2011-02-03 Toshiba Corp 半導体装置
TWI404205B (zh) * 2009-10-06 2013-08-01 Anpec Electronics Corp 絕緣閘雙極電晶體與快速逆向恢復時間整流器之整合結構及其製作方法
JP2013235890A (ja) * 2012-05-07 2013-11-21 Denso Corp 半導体装置
CN112310207B (zh) * 2019-08-01 2024-06-21 广东美的白色家电技术创新中心有限公司 绝缘栅双极型晶体管及其制作方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE643783A (fr) * 1963-02-19 1964-05-29 Forges Et Ateliers De Constructions Electriques De Jeumont Dispositif de commutation de puissance à semi-conducteur
GB1558840A (en) * 1977-02-07 1980-01-09 Rca Corp Gate controlled semiconductor device
JPS5933272B2 (ja) * 1978-06-19 1984-08-14 株式会社日立製作所 半導体装置
JPS5599774A (en) * 1979-01-26 1980-07-30 Semiconductor Res Found Electrostatic induction type thyristor
GB2050694B (en) * 1979-05-07 1983-09-28 Nippon Telegraph & Telephone Electrode structure for a semiconductor device
SE8107136L (sv) * 1980-12-02 1982-06-03 Gen Electric Styrelektrodforsedd likriktaranordning
IE53895B1 (en) * 1981-11-23 1989-04-12 Gen Electric Semiconductor device having rapid removal of majority carriers from an active base region thereof at device turn-off and method of fabricating this device
JPS594077A (ja) * 1982-06-30 1984-01-10 Toshiba Corp 電界効果トランジスタ
JPS605568A (ja) * 1983-06-23 1985-01-12 Sanken Electric Co Ltd 縦型絶縁ゲ−ト電界効果トランジスタ
GB2150753B (en) * 1983-11-30 1987-04-01 Toshiba Kk Semiconductor device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4234152A1 (de) * 1991-10-24 1993-04-29 Fuji Electric Co Ltd In seiner leitfaehigkeit modulierter mosfet-typ
DE4318205A1 (de) * 1992-06-01 1993-12-02 Fuji Electric Co Ltd Halbleitervorrichtung
DE4318205C2 (de) * 1992-06-01 1998-04-23 Fuji Electric Co Ltd Halbleitervorrichtungen

Also Published As

Publication number Publication date
US4841345A (en) 1989-06-20
DE3628857A1 (de) 1987-03-12
FR2586862B1 (fr) 1991-04-19
FR2586862A1 (fr) 1987-03-06

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Legal Events

Date Code Title Description
OM8 Search report available as to paragraph 43 lit. 1 sentence 1 patent law
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee