DE3623136A1 - Vorrichtung zur messung des verhaeltnisses zwischen zwei kleinen kapazitaeten - Google Patents

Vorrichtung zur messung des verhaeltnisses zwischen zwei kleinen kapazitaeten

Info

Publication number
DE3623136A1
DE3623136A1 DE19863623136 DE3623136A DE3623136A1 DE 3623136 A1 DE3623136 A1 DE 3623136A1 DE 19863623136 DE19863623136 DE 19863623136 DE 3623136 A DE3623136 A DE 3623136A DE 3623136 A1 DE3623136 A1 DE 3623136A1
Authority
DE
Germany
Prior art keywords
switches
switch
integrator
voltage
capacitances
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19863623136
Other languages
German (de)
English (en)
Other versions
DE3623136C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Joel Choisnet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Publication of DE3623136A1 publication Critical patent/DE3623136A1/de
Application granted granted Critical
Publication of DE3623136C2 publication Critical patent/DE3623136C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
DE19863623136 1985-07-09 1986-07-09 Vorrichtung zur messung des verhaeltnisses zwischen zwei kleinen kapazitaeten Granted DE3623136A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8510481A FR2584822B1 (fr) 1985-07-09 1985-07-09 Dispositif de mesure du rapport de deux capacites de faibles valeurs

Publications (2)

Publication Number Publication Date
DE3623136A1 true DE3623136A1 (de) 1987-01-22
DE3623136C2 DE3623136C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-02-15

Family

ID=9321109

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19863623136 Granted DE3623136A1 (de) 1985-07-09 1986-07-09 Vorrichtung zur messung des verhaeltnisses zwischen zwei kleinen kapazitaeten

Country Status (5)

Country Link
US (1) US4797603A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS6214067A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3623136A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2584822B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB2177806B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4107366C1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1991-03-08 1992-04-23 Leica Heerbrugg Ag, Heerbrugg, Ch
US5629629A (en) * 1995-04-06 1997-05-13 Siemens Aktiengesellschaft Circuit arrangement for determining differences in capacitance

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5136251A (en) * 1988-09-23 1992-08-04 John Fluke Mfg. Co., Inc. Capacitance measurement
FR2682768A1 (fr) * 1991-10-21 1993-04-23 Otic Fischer & Porter Methodes de conversion de rapports d'impedances applicables aux appareils de mesure, notamment aux transmetteurs de pression industriels, et leurs dispositifs de mise en óoeuvre.
FR2768122B1 (fr) * 1997-09-09 1999-11-19 Sextant Avionique Dispositif optique de detection de conditions givrantes sur aeronef
FR2791144B1 (fr) 1999-03-19 2001-11-30 Sextant Avionique Dispositif de surveillance de la circulation d'un courant sensiblement continu dans une charge et procede pour la mise en oeuvre de ce dispositif
FR2791773B1 (fr) 1999-04-02 2001-06-15 Sextant Avionique Girouette destinee a s'orienter dans l'axe d'un ecoulement d'air ambiant
FR2793022B1 (fr) 1999-04-30 2001-07-13 Sextant Avionique Sonde multifonctions fixe pour aeronef
FR2802636B1 (fr) 1999-12-17 2002-03-22 Thomson Csf Sextant Sonde multifonctions pour aeronef
FR2802647B1 (fr) 1999-12-17 2002-03-01 Thomson Csf Sextant Sonde pour aeronef
FR2817044B1 (fr) * 2000-11-17 2003-02-14 Thomson Csf Procede de determination de parametres aerodynamiques et procede de detection de panne d'une sonde utilisee pour determiner les parametres aerodynamiques
FR2823846B1 (fr) 2001-04-24 2003-06-27 Thomson Csf Dispositif de mesure de la pression totale d'un ecoulement
WO2003071233A1 (de) * 2002-02-21 2003-08-28 Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung Et Al Vorrichtung und verfahren zum auslesen einer differentialkapazität mit einer ersten und zweiten teilkapazität
JP3985545B2 (ja) 2002-02-22 2007-10-03 セイコーエプソン株式会社 薄膜形成装置と薄膜形成方法、液晶装置の製造装置と液晶装置の製造方法と液晶装置、及び薄膜構造体の製造装置と薄膜構造体の製造方法と薄膜構造体、及び電子機器
CN104169728B (zh) * 2011-12-23 2016-11-23 Imec公司 用于测量电容性元件之间的电容差的方法和系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2347450B2 (de) * 1972-09-21 1975-04-24 Iwatsu Electric Co., Ltd., Tokio Verfahren und Vorrichtung zum Messen der elektrostatischen Kapazität eines Kondensators
US4392378A (en) * 1979-09-01 1983-07-12 501 Ferranti Limited Capacitance measuring apparatus

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4054833A (en) * 1976-06-11 1977-10-18 Setra Systems, Inc. Capacitance measuring system
US4039940A (en) * 1976-07-30 1977-08-02 General Electric Company Capacitance sensor
FR2404229A1 (fr) * 1977-09-23 1979-04-20 Testut Aequitas Dispositif de mesure de capacite d'un condensateur
FR2436399A2 (fr) * 1978-09-13 1980-04-11 Testut Aequitas Perfectionnement a l'inhibition des capacites parasites dans un dispositif de mesure de capacite
US4187459A (en) * 1978-02-13 1980-02-05 Automatic Systems Laboratories Limited Digital measurement of impedance ratios
US4282480A (en) * 1978-05-02 1981-08-04 Matsushita Electric Industrial Co., Ltd. Apparatus for humidity detection
GB2036982B (en) * 1978-10-04 1982-12-01 Automatic Systems Lab Ltd Electrical impedance ratios
US4404481A (en) * 1980-10-20 1983-09-13 Matsushita Electric Industrial Co., Ltd. Capacitance to voltage conversion apparatus
US4636714A (en) * 1984-01-18 1987-01-13 Wystron, Inc. Capacitive transducer and method
GB2155644B (en) * 1984-03-09 1988-04-20 Automatic Syst Lab Ltd Improvements in the measurement of impedance ratios

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2347450B2 (de) * 1972-09-21 1975-04-24 Iwatsu Electric Co., Ltd., Tokio Verfahren und Vorrichtung zum Messen der elektrostatischen Kapazität eines Kondensators
US4392378A (en) * 1979-09-01 1983-07-12 501 Ferranti Limited Capacitance measuring apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4107366C1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1991-03-08 1992-04-23 Leica Heerbrugg Ag, Heerbrugg, Ch
US5283528A (en) * 1991-03-08 1994-02-01 Leica Heerbrugg Ag Circuit arrangement for measuring the ratio of the capacitance values of two capacitors
US5629629A (en) * 1995-04-06 1997-05-13 Siemens Aktiengesellschaft Circuit arrangement for determining differences in capacitance

Also Published As

Publication number Publication date
US4797603A (en) 1989-01-10
DE3623136C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-02-15
GB2177806A (en) 1987-01-28
JPS6214067A (ja) 1987-01-22
GB2177806B (en) 1989-01-18
FR2584822B1 (fr) 1988-06-17
GB8614836D0 (en) 1986-07-23
FR2584822A1 (fr) 1987-01-16

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee