DE3446014C2 - Interferometer nach dem Michelson-Prinzip - Google Patents

Interferometer nach dem Michelson-Prinzip

Info

Publication number
DE3446014C2
DE3446014C2 DE19843446014 DE3446014A DE3446014C2 DE 3446014 C2 DE3446014 C2 DE 3446014C2 DE 19843446014 DE19843446014 DE 19843446014 DE 3446014 A DE3446014 A DE 3446014A DE 3446014 C2 DE3446014 C2 DE 3446014C2
Authority
DE
Germany
Prior art keywords
rds
arrangement
mirror
beam splitter
rotation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19843446014
Other languages
German (de)
English (en)
Other versions
DE3446014A1 (de
Inventor
Volker Dipl.-Ing. 8088 Eching Tank
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Deutsches Zentrum fuer Luft und Raumfahrt eV
Original Assignee
Deutsche Forschungs und Versuchsanstalt fuer Luft und Raumfahrt eV DFVLR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Deutsche Forschungs und Versuchsanstalt fuer Luft und Raumfahrt eV DFVLR filed Critical Deutsche Forschungs und Versuchsanstalt fuer Luft und Raumfahrt eV DFVLR
Priority to DE19843446014 priority Critical patent/DE3446014C2/de
Publication of DE3446014A1 publication Critical patent/DE3446014A1/de
Application granted granted Critical
Publication of DE3446014C2 publication Critical patent/DE3446014C2/de
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/45Interferometric spectrometry
    • G01J3/453Interferometric spectrometry by correlation of the amplitudes

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
DE19843446014 1984-12-17 1984-12-17 Interferometer nach dem Michelson-Prinzip Expired DE3446014C2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19843446014 DE3446014C2 (de) 1984-12-17 1984-12-17 Interferometer nach dem Michelson-Prinzip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19843446014 DE3446014C2 (de) 1984-12-17 1984-12-17 Interferometer nach dem Michelson-Prinzip

Publications (2)

Publication Number Publication Date
DE3446014A1 DE3446014A1 (de) 1986-06-26
DE3446014C2 true DE3446014C2 (de) 1987-02-26

Family

ID=6253006

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19843446014 Expired DE3446014C2 (de) 1984-12-17 1984-12-17 Interferometer nach dem Michelson-Prinzip

Country Status (1)

Country Link
DE (1) DE3446014C2 (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3708883A1 (de) * 1987-03-20 1988-09-29 Menke Josef F Optisch-mechanisches bauelement
EP0443477B1 (de) * 1990-02-21 1993-09-01 Deutsches Zentrum für Luft- und Raumfahrt e.V. Interferometer nach Michelson zur Erzeugung optischer Wegunterschiede
DE4016731C3 (de) * 1990-05-24 2001-04-26 Bruker Analytik Gmbh Fourierspektrometer
US5784162A (en) * 1993-08-18 1998-07-21 Applied Spectral Imaging Ltd. Spectral bio-imaging methods for biological research, medical diagnostics and therapy
US6144456A (en) * 1995-05-04 2000-11-07 Haag-Streit Ag Apparatus having a multiple angle transparent rotating element for measuring the thickness of transparent objects
DE19949760A1 (de) * 1999-10-15 2001-04-19 Zeiss Carl Fa Interferometer
EP1785690A1 (de) * 2005-11-10 2007-05-16 Haag-Streit Ag Verfahren und Vorrichtung zur Ermittlung geometrischer Werte an einem Gegenstand
EP4160168A1 (en) 2021-09-30 2023-04-05 ETH Zurich Rotational optical delay line assembly for spectroscopy

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3072011A (en) * 1957-05-24 1963-01-08 Gen Precision Inc Interferometer optical system
GB1010277A (en) * 1963-05-20 1965-11-17 Parsons & Co Sir Howard G Improvements in and relating to optical interforometers
FR1589784A (ko) * 1968-10-22 1970-04-06
FR2203974B1 (ko) * 1972-10-23 1977-01-14 Commissariat Energie Atomique

Also Published As

Publication number Publication date
DE3446014A1 (de) 1986-06-26

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: DEUTSCHE FORSCHUNGSANSTALT FUER LUFT- UND RAUMFAHR

8339 Ceased/non-payment of the annual fee