DE3437519A1 - Verfahren und vorrichtung zum analysieren von teilchenfoermigem material - Google Patents

Verfahren und vorrichtung zum analysieren von teilchenfoermigem material

Info

Publication number
DE3437519A1
DE3437519A1 DE3437519A DE3437519A DE3437519A1 DE 3437519 A1 DE3437519 A1 DE 3437519A1 DE 3437519 A DE3437519 A DE 3437519A DE 3437519 A DE3437519 A DE 3437519A DE 3437519 A1 DE3437519 A1 DE 3437519A1
Authority
DE
Germany
Prior art keywords
measuring chamber
particles
inflowing
stream
suspension
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE3437519A
Other languages
German (de)
English (en)
Other versions
DE3437519C2 (cs
Inventor
Wieland E Von Behrens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sequoia Turner Corp
Original Assignee
Sequoia Turner Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sequoia Turner Corp filed Critical Sequoia Turner Corp
Publication of DE3437519A1 publication Critical patent/DE3437519A1/de
Application granted granted Critical
Publication of DE3437519C2 publication Critical patent/DE3437519C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/134—Devices using two or more apertures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
DE3437519A 1983-10-14 1984-10-12 Verfahren und vorrichtung zum analysieren von teilchenfoermigem material Granted DE3437519A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US54222483A 1983-10-14 1983-10-14

Publications (2)

Publication Number Publication Date
DE3437519A1 true DE3437519A1 (de) 1985-04-25
DE3437519C2 DE3437519C2 (cs) 1990-06-07

Family

ID=24162857

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3437519A Granted DE3437519A1 (de) 1983-10-14 1984-10-12 Verfahren und vorrichtung zum analysieren von teilchenfoermigem material

Country Status (2)

Country Link
JP (1) JPS60143742A (cs)
DE (1) DE3437519A1 (cs)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5456653B2 (ja) * 2010-12-13 2014-04-02 日本光電工業株式会社 血液測定装置
TWI885869B (zh) * 2023-04-25 2025-06-01 日商愛德萬測試股份有限公司 微粒子測定裝置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2445411A1 (de) * 1973-09-26 1975-05-07 Coulter Electronics Teilchenmessgeraet, fensterroehre und elektrolyt-speisevorrichtung fuer teilchenmessgeraete

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5522734A (en) * 1978-08-04 1980-02-18 Nippon Musical Instruments Mfg Electronic musical instrument
JPS55143431A (en) * 1979-04-26 1980-11-08 Toa Medical Electronics Co Ltd Detector for corpuscle
JPS58129348A (ja) * 1982-01-29 1983-08-02 Olympus Optical Co Ltd 微小粒子計数装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2445411A1 (de) * 1973-09-26 1975-05-07 Coulter Electronics Teilchenmessgeraet, fensterroehre und elektrolyt-speisevorrichtung fuer teilchenmessgeraete

Also Published As

Publication number Publication date
JPH0519097B2 (cs) 1993-03-15
JPS60143742A (ja) 1985-07-30
DE3437519C2 (cs) 1990-06-07

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition