DE3371695D1 - Method of photometric measurement - Google Patents

Method of photometric measurement

Info

Publication number
DE3371695D1
DE3371695D1 DE8383305954T DE3371695T DE3371695D1 DE 3371695 D1 DE3371695 D1 DE 3371695D1 DE 8383305954 T DE8383305954 T DE 8383305954T DE 3371695 T DE3371695 T DE 3371695T DE 3371695 D1 DE3371695 D1 DE 3371695D1
Authority
DE
Germany
Prior art keywords
photometric measurement
photometric
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383305954T
Other languages
German (de)
English (en)
Inventor
Tomiharu C O Patent D Minekane
Noboru C O Patent Div Yokotani
Takehiko C O Patent Divi Onuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE3371695D1 publication Critical patent/DE3371695D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/04—Batch operation; multisample devices
    • G01N2201/0415—Carrusel, sequential

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
  • Spectrometry And Color Measurement (AREA)
DE8383305954T 1982-09-30 1983-09-30 Method of photometric measurement Expired DE3371695D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57171893A JPS5960323A (ja) 1982-09-30 1982-09-30 測光装置

Publications (1)

Publication Number Publication Date
DE3371695D1 true DE3371695D1 (en) 1987-06-25

Family

ID=15931757

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383305954T Expired DE3371695D1 (en) 1982-09-30 1983-09-30 Method of photometric measurement

Country Status (4)

Country Link
US (1) US4549809A (enExample)
EP (1) EP0107410B1 (enExample)
JP (1) JPS5960323A (enExample)
DE (1) DE3371695D1 (enExample)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4705403A (en) * 1984-03-21 1987-11-10 Canon Kabushiki Kaisha Apparatus and method for measuring a photometric characteristic of a sample portion
JPS61137066A (ja) * 1984-12-07 1986-06-24 Toshiba Corp 自動化学分析装置の測光方式
US4737464A (en) * 1985-09-26 1988-04-12 Molecular Devices Corporation Solid-state optical assay imaging apparatus
DE3535515A1 (de) * 1985-10-04 1987-04-09 Pantuc Ing Buero Verfahren und vorrichtung zur on-line-messung von transmission oder reflexion an bewegten objekten im bereich detektierbarer elektromagnetischer strahlung
JPH0754326B2 (ja) * 1986-06-24 1995-06-07 株式会社東芝 自動化学分析装置
US4933146A (en) * 1986-07-11 1990-06-12 Beckman Instruments, Inc. Temperature control apparatus for automated clinical analyzer
US4804274A (en) * 1986-12-30 1989-02-14 Mobil Oil Corporation Method and apparatus for determining phase transition temperature using laser attenuation
SE463639B (sv) * 1989-05-26 1990-12-17 Petter Jaeremo Anordning foer kontroll av celler uppslammade i vaetska
US5449621A (en) * 1989-07-31 1995-09-12 Biotope, Inc. Method for measuring specific binding assays
US5089229A (en) * 1989-11-22 1992-02-18 Vettest S.A. Chemical analyzer
US5250262A (en) * 1989-11-22 1993-10-05 Vettest S.A. Chemical analyzer
JPH07318576A (ja) * 1994-05-11 1995-12-08 Xerox Corp 流体感知装置
US5730938A (en) * 1995-08-09 1998-03-24 Bio-Chem Laboratory Systems, Inc. Chemistry analyzer
SE9600666L (sv) * 1996-02-22 1997-08-23 Pharmacia Biotech Ab Detekteringsanordning
DE19849597A1 (de) * 1998-10-28 2000-05-04 Dade Behring Marburg Gmbh Nephelometrische Detektionseinheit mit optischer In-Prozeß-Kontrolle
JP3794012B2 (ja) * 1999-03-10 2006-07-05 日本電子株式会社 回転反応器の測定方式
US6307630B1 (en) * 1999-11-19 2001-10-23 Hach Company Turbidimeter array system
US7751049B1 (en) * 2008-09-16 2010-07-06 Microglo, Llc Photo sensing fluid contamination and quality monitor
US7273591B2 (en) 2003-08-12 2007-09-25 Idexx Laboratories, Inc. Slide cartridge and reagent test slides for use with a chemical analyzer, and chemical analyzer for same
US7588733B2 (en) 2003-12-04 2009-09-15 Idexx Laboratories, Inc. Retaining clip for reagent test slides
US20050185176A1 (en) * 2004-02-23 2005-08-25 Moran Donald J.Jr. Determining an analyte by multiple measurements through a cuvette
US7307718B2 (en) * 2004-02-23 2007-12-11 Ortho-Clinical Diagnostics, Inc. Determining an analyte by multiple measurements through a cuvette
JP4018131B2 (ja) * 2005-07-27 2007-12-05 シスメックス株式会社 キュベット
JP4598682B2 (ja) * 2006-01-23 2010-12-15 株式会社日立ハイテクノロジーズ 自動分析装置
US9116129B2 (en) 2007-05-08 2015-08-25 Idexx Laboratories, Inc. Chemical analyzer
WO2009050177A1 (en) * 2007-10-15 2009-04-23 Ima Life S.R.L. Inline measurement of moving containers with infrared (ir) spectroscopy
JP6100587B2 (ja) * 2013-04-08 2017-03-22 株式会社堀場製作所 分析装置
JP6381978B2 (ja) 2013-07-05 2018-08-29 キヤノンメディカルシステムズ株式会社 自動分析装置
US9797916B2 (en) 2014-01-10 2017-10-24 Idexx Laboratories, Inc. Chemical analyzer
EP2957892A1 (de) * 2014-06-17 2015-12-23 Siemens Healthcare Diagnostics Products GmbH Photometriesystem und Verfahren zur Positionsbestimmung
ES2623452T3 (es) 2014-09-18 2017-07-11 Siemens Healthcare Diagnostics Products Gmbh Método y dispositivo para la determinación nefelométrica de un analito
CA2961453A1 (en) * 2014-09-30 2016-04-07 Ft System S.R.L. Group and method for measuring the pressure in closed containers
WO2018017762A1 (en) * 2016-07-21 2018-01-25 Siemens Healthcare Diagnostics Inc. Eliminating source lamp intensity drift effect using reference measurement between cuvettes
JP6987121B2 (ja) 2016-07-21 2021-12-22 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレーテッドSiemens Healthcare Diagnostics Inc. 測光キュベットマッピング
AU2021306343A1 (en) 2020-07-10 2023-03-02 Idexx Laboratories Inc. Point-of-care medical diagnostic analyzer and devices, systems, and methods for medical diagnostic analysis of samples
US20240328940A1 (en) * 2021-10-05 2024-10-03 Gasporox Ab System and method for measuring a property of a gas in a container
CN114279990A (zh) * 2022-01-12 2022-04-05 北京华科仪科技股份有限公司 一种分光光度的测量方法
JP2024097174A (ja) * 2023-01-05 2024-07-18 古野電気株式会社 分析装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1648841A1 (de) * 1967-10-18 1971-07-22 Bodenseewerk Perkin Elmer Co Einstrahl-Photometer
JPS5081578A (enExample) * 1973-11-21 1975-07-02
JPS5364084A (en) * 1976-11-19 1978-06-08 Hitachi Ltd System spectometer
JPS5525412U (enExample) * 1978-08-07 1980-02-19
JPS56132548A (en) * 1980-03-21 1981-10-16 Olympus Optical Co Ltd Automatic analyzer
US4308231A (en) * 1980-08-11 1981-12-29 Coulter Electronics, Inc. Optical timing and A/D conversion method and apparatus

Also Published As

Publication number Publication date
JPS5960323A (ja) 1984-04-06
JPH0331217B2 (enExample) 1991-05-02
EP0107410A1 (en) 1984-05-02
US4549809A (en) 1985-10-29
EP0107410B1 (en) 1987-05-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee