DE3278585D1 - A test system for functionally testing a microprocessor-based assembly, and apparatus for testing logic circuitry - Google Patents

A test system for functionally testing a microprocessor-based assembly, and apparatus for testing logic circuitry

Info

Publication number
DE3278585D1
DE3278585D1 DE8282302172T DE3278585T DE3278585D1 DE 3278585 D1 DE3278585 D1 DE 3278585D1 DE 8282302172 T DE8282302172 T DE 8282302172T DE 3278585 T DE3278585 T DE 3278585T DE 3278585 D1 DE3278585 D1 DE 3278585D1
Authority
DE
Germany
Prior art keywords
testing
microprocessor
test system
logic circuitry
based assembly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8282302172T
Other languages
English (en)
Inventor
Kasi Seshadri Bhaskar
Alden J Carlson
Alastair Norman Couper
Dennis L Lambert
Marshall H Scott
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
John Fluke Manufacturing Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by John Fluke Manufacturing Co Inc filed Critical John Fluke Manufacturing Co Inc
Application granted granted Critical
Publication of DE3278585D1 publication Critical patent/DE3278585D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2736—Tester hardware, i.e. output processing circuits using a dedicated service processor for test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/32—Monitoring with visual or acoustical indication of the functioning of the machine
    • G06F11/324—Display of status information
    • G06F11/325—Display of status information by lamps or LED's

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
DE8282302172T 1981-06-05 1982-04-28 A test system for functionally testing a microprocessor-based assembly, and apparatus for testing logic circuitry Expired DE3278585D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06270926 US4455654B1 (en) 1981-06-05 1981-06-05 Test apparatus for electronic assemblies employing a microprocessor

Publications (1)

Publication Number Publication Date
DE3278585D1 true DE3278585D1 (en) 1988-07-07

Family

ID=23033419

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8282302172T Expired DE3278585D1 (en) 1981-06-05 1982-04-28 A test system for functionally testing a microprocessor-based assembly, and apparatus for testing logic circuitry

Country Status (4)

Country Link
US (1) US4455654B1 (de)
EP (2) EP0182388B1 (de)
JP (2) JPS5837752A (de)
DE (1) DE3278585D1 (de)

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Also Published As

Publication number Publication date
US4455654A (en) 1984-06-19
EP0067510B1 (de) 1988-06-01
EP0182388A3 (en) 1986-10-08
JPS6218062B2 (de) 1987-04-21
JPS5837752A (ja) 1983-03-05
JPS626264B2 (de) 1987-02-09
US4455654B1 (en) 1991-04-30
EP0067510A3 (en) 1984-08-22
EP0182388B1 (de) 1989-08-16
EP0182388A2 (de) 1986-05-28
EP0067510A2 (de) 1982-12-22
JPS60216278A (ja) 1985-10-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee