DE3264636D1 - Hall element device - Google Patents

Hall element device

Info

Publication number
DE3264636D1
DE3264636D1 DE8282102690T DE3264636T DE3264636D1 DE 3264636 D1 DE3264636 D1 DE 3264636D1 DE 8282102690 T DE8282102690 T DE 8282102690T DE 3264636 T DE3264636 T DE 3264636T DE 3264636 D1 DE3264636 D1 DE 3264636D1
Authority
DE
Germany
Prior art keywords
hall element
element device
hall
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8282102690T
Other languages
German (de)
English (en)
Inventor
Shikei Tanaka
Kunihiko Matsui
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE3264636D1 publication Critical patent/DE3264636D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R21/00—Arrangements for measuring electric power or power factor
    • G01R21/08—Arrangements for measuring electric power or power factor by using galvanomagnetic-effect devices, e.g. Hall-effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N52/00—Hall-effect devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
DE8282102690T 1981-06-26 1982-03-30 Hall element device Expired DE3264636D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56099354A JPS582084A (ja) 1981-06-26 1981-06-26 ホ−ル素子装置

Publications (1)

Publication Number Publication Date
DE3264636D1 true DE3264636D1 (en) 1985-08-14

Family

ID=14245260

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8282102690T Expired DE3264636D1 (en) 1981-06-26 1982-03-30 Hall element device

Country Status (4)

Country Link
US (1) US4464629A (forum.php)
EP (1) EP0068081B1 (forum.php)
JP (1) JPS582084A (forum.php)
DE (1) DE3264636D1 (forum.php)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61194885A (ja) * 1985-02-25 1986-08-29 Seiko Instr & Electronics Ltd 磁気センサ
JPS62206889A (ja) * 1986-03-07 1987-09-11 Seiko Instr & Electronics Ltd 磁気センサ
CH669068A5 (de) * 1986-04-29 1989-02-15 Landis & Gyr Ag Integrierbares hallelement.
JP2614444B2 (ja) * 1987-03-02 1997-05-28 セイコー電子工業株式会社 磁気センサ
CH677036A5 (forum.php) * 1987-08-06 1991-03-28 Landis & Gyr Betriebs Ag
JP2796391B2 (ja) * 1990-01-08 1998-09-10 株式会社日立製作所 物理量検出方法および物理量検出装置あるいはこれらの方法あるいは装置を利用したサーボモータおよびこのサーボモータを使用したパワーステアリング装置
JP3002310B2 (ja) * 1991-11-21 2000-01-24 株式会社東芝 電力量計
US5831426A (en) * 1996-08-16 1998-11-03 Nonvolatile Electronics, Incorporated Magnetic current sensor
US6466004B1 (en) 2000-04-27 2002-10-15 Sensotec, Inc. Apparatus and method for measuring weld circuit
FR2820211A1 (fr) * 2001-02-01 2002-08-02 Schlumberger Ind Sa Cellule a effet hall pour la mesure de courant efficace
US7557562B2 (en) * 2004-09-17 2009-07-07 Nve Corporation Inverted magnetic isolator
US7847536B2 (en) * 2006-08-31 2010-12-07 Itron, Inc. Hall sensor with temperature drift control
JP2015078949A (ja) * 2013-10-18 2015-04-23 旭化成エレクトロニクス株式会社 ホール起電力信号検出回路
JP2017161475A (ja) * 2016-03-11 2017-09-14 株式会社東芝 半導体装置および磁気センサ
CN107478887A (zh) * 2017-07-07 2017-12-15 中国电力科学研究院 一种阵列式霍尔电流传感器
JP7239308B2 (ja) * 2018-03-14 2023-03-14 エイブリック株式会社 半導体装置及びその調整方法
US11567107B2 (en) * 2020-12-31 2023-01-31 Texas Instruments Incorporated Differential hall sensor

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2988650A (en) * 1953-11-11 1961-06-13 Siemens Ag Hall-effect control element with utilization circuit
GB822210A (en) * 1957-03-29 1959-10-21 Gen Electric Co Ltd Improvements in or relating to instruments for making magnetic measurements
GB868765A (en) * 1957-07-16 1961-05-25 Siemens Ag Improvements in or relating to apparatus for the measurement of magnetic field gradients
DE1295073B (de) * 1962-10-31 1969-05-14 Siemens Ag Elektronischer Wirkverbrauchszaehler
US4199696A (en) * 1977-03-18 1980-04-22 Tokyo Shibaura Electric Co., Ltd. Multiplier using hall element

Also Published As

Publication number Publication date
EP0068081A1 (en) 1983-01-05
JPS582084A (ja) 1983-01-07
US4464629A (en) 1984-08-07
EP0068081B1 (en) 1985-07-10
JPS634717B2 (forum.php) 1988-01-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee