DE3168115D1 - Temperature measuring device utilising a quartz slice - Google Patents
Temperature measuring device utilising a quartz sliceInfo
- Publication number
- DE3168115D1 DE3168115D1 DE8181103785T DE3168115T DE3168115D1 DE 3168115 D1 DE3168115 D1 DE 3168115D1 DE 8181103785 T DE8181103785 T DE 8181103785T DE 3168115 T DE3168115 T DE 3168115T DE 3168115 D1 DE3168115 D1 DE 3168115D1
- Authority
- DE
- Germany
- Prior art keywords
- measuring device
- temperature measuring
- device utilising
- quartz slice
- slice
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/32—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using change of resonant frequency of a crystal
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Oscillators With Electromechanical Resonators (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8011509A FR2483076A1 (fr) | 1980-05-23 | 1980-05-23 | Sonde de temperature utilisant une lame de quartz |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE3168115D1 true DE3168115D1 (en) | 1985-02-21 |
Family
ID=9242266
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE8181103785T Expired DE3168115D1 (en) | 1980-05-23 | 1981-05-18 | Temperature measuring device utilising a quartz slice |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4398115A (Direct) |
| EP (1) | EP0041168B1 (Direct) |
| DE (1) | DE3168115D1 (Direct) |
| FR (1) | FR2483076A1 (Direct) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4678905A (en) * | 1984-05-18 | 1987-07-07 | Luxtron Corporation | Optical sensors for detecting physical parameters utilizing vibrating piezoelectric elements |
| US4897541A (en) * | 1984-05-18 | 1990-01-30 | Luxtron Corporation | Sensors for detecting electromagnetic parameters utilizing resonating elements |
| US4676663A (en) * | 1984-05-23 | 1987-06-30 | General Electric Company | Arrangement for remote ultrasonic temperature measurement |
| US4603306A (en) * | 1985-04-25 | 1986-07-29 | The United States Of America As Represented By The Administrator, National Aeronautics And Space Administration | Temperature sensitive oscillator |
| JPS61288132A (ja) * | 1985-06-17 | 1986-12-18 | Yokogawa Electric Corp | 水晶温度計 |
| DE3744196A1 (de) * | 1987-12-24 | 1989-07-27 | Heraeus Sensor Gmbh | Elektronisches thermometer |
| DE3744239C1 (de) * | 1987-12-24 | 1989-06-01 | Heraeus Gmbh W C | Elektronisches Thermometer |
| US4905701A (en) * | 1988-06-15 | 1990-03-06 | National Research Development Corporation | Apparatus and method for detecting small changes in attached mass of piezoelectric devices used as sensors |
| FR2638519B1 (fr) * | 1988-11-02 | 1990-12-28 | Asulab Sa | Dispositif de mesure d'une grandeur physique |
| JP3216137B2 (ja) * | 1994-09-29 | 2001-10-09 | セイコーエプソン株式会社 | Sawデバイス |
| US5686779A (en) * | 1995-03-01 | 1997-11-11 | The United States Of America As Represented By The Secretary Of The Army | High sensitivity temperature sensor and sensor array |
| EP0753726A1 (de) * | 1995-07-11 | 1997-01-15 | Landis & Gyr Technology Innovation AG | Anordnung zur Ermittlung eines mittels eines Sensors gemessenen Parameters |
| US5836691A (en) * | 1996-07-17 | 1998-11-17 | Techno Togo Limited Company | Method of thermometry and apparatus for the thermometry |
| FR2785473B1 (fr) * | 1998-10-30 | 2001-01-26 | Thomson Csf | Filtre faibles pertes a ondes acoustiques de surface sur substrat de quartz de coupe optimisee |
| US6172443B1 (en) * | 1998-11-24 | 2001-01-09 | Cts Corporation | Quartz crystal resonator with improved temperature performance and method therefor |
| NO322272B1 (no) * | 1999-03-26 | 2006-09-04 | Kongsberg Maritime As | Sensor og system for overvaking av temperatur inne i vanskelig tilgjengelige, bevegelige deler |
| JP4679782B2 (ja) * | 1999-12-10 | 2011-04-27 | 富士通株式会社 | 温度センサ |
| FR2811828B1 (fr) * | 2000-07-13 | 2002-10-25 | Thomson Csf | Dispositif a ondes acoustiques comprenant des domaines de polarisation alternee |
| US7292085B2 (en) * | 2000-10-06 | 2007-11-06 | Igor Anatolievich Abrosimov | Timing delay generator and method using temperature stabilisation |
| US6877209B1 (en) * | 2002-08-28 | 2005-04-12 | Silicon Light Machines, Inc. | Method for sealing an active area of a surface acoustic wave device on a wafer |
| US8123399B2 (en) * | 2007-05-08 | 2012-02-28 | The United States of America as represented by the National Institute of Standards and Technology | Dielectric resonator thermometer and a method of using the same |
| US8987843B2 (en) | 2012-11-06 | 2015-03-24 | International Business Machines Corporation | Mapping density and temperature of a chip, in situ |
| DE102013010014A1 (de) * | 2013-06-14 | 2014-12-18 | Volkswagen Aktiengesellschaft | Temperatursensor für ein fluides Medium |
| DE102014003341B4 (de) * | 2014-03-07 | 2017-10-19 | Astrium Gmbh | Treibstofftank |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3879992A (en) * | 1970-05-12 | 1975-04-29 | California Inst Of Techn | Multiple crystal oscillator measuring apparatus |
| GB1351435A (en) * | 1972-05-17 | 1974-05-01 | Fedorkov A P Yaroslavsky M I | Piezo-electric quartz element |
| JPS5532051B2 (Direct) * | 1974-02-14 | 1980-08-22 | ||
| US4006435A (en) * | 1974-12-23 | 1977-02-01 | Hazeltine Corporation | Method for fabricating a temperature compensated surface wave device |
| DE2754669A1 (de) * | 1977-03-28 | 1978-10-12 | Hewlett Packard Co | Messfuehler |
| JPS54138480A (en) * | 1978-04-20 | 1979-10-26 | Toshiba Corp | Temperature detector |
| US4345176A (en) * | 1980-11-03 | 1982-08-17 | United Technologies Corporation | Temperature compensated gallium arsenide surface acoustic wave devices |
-
1980
- 1980-05-23 FR FR8011509A patent/FR2483076A1/fr active Granted
-
1981
- 1981-05-18 EP EP81103785A patent/EP0041168B1/fr not_active Expired
- 1981-05-18 DE DE8181103785T patent/DE3168115D1/de not_active Expired
- 1981-05-21 US US06/265,928 patent/US4398115A/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US4398115A (en) | 1983-08-09 |
| EP0041168B1 (fr) | 1985-01-09 |
| EP0041168A3 (en) | 1981-12-16 |
| EP0041168A2 (fr) | 1981-12-09 |
| FR2483076B1 (Direct) | 1982-11-26 |
| FR2483076A1 (fr) | 1981-11-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8339 | Ceased/non-payment of the annual fee |