DE3149869C2 - - Google Patents
Info
- Publication number
- DE3149869C2 DE3149869C2 DE3149869A DE3149869A DE3149869C2 DE 3149869 C2 DE3149869 C2 DE 3149869C2 DE 3149869 A DE3149869 A DE 3149869A DE 3149869 A DE3149869 A DE 3149869A DE 3149869 C2 DE3149869 C2 DE 3149869C2
- Authority
- DE
- Germany
- Prior art keywords
- radiation
- wavelength
- measuring
- luminescent diodes
- reference wavelength
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000005855 radiation Effects 0.000 claims description 31
- 239000000463 material Substances 0.000 claims description 11
- 238000010521 absorption reaction Methods 0.000 claims description 7
- 238000004020 luminiscence type Methods 0.000 claims description 7
- 239000013078 crystal Substances 0.000 claims description 5
- 229910052785 arsenic Inorganic materials 0.000 claims description 4
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- 229940056932 lead sulfide Drugs 0.000 claims description 3
- 229910052981 lead sulfide Inorganic materials 0.000 claims description 3
- 229910000673 Indium arsenide Inorganic materials 0.000 claims description 2
- 239000006096 absorbing agent Substances 0.000 claims description 2
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 claims description 2
- JHFCVRNLWYSLOL-UHFFFAOYSA-N [P].[As].[In] Chemical compound [P].[As].[In] JHFCVRNLWYSLOL-UHFFFAOYSA-N 0.000 claims 1
- 238000011156 evaluation Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 230000031700 light absorption Effects 0.000 description 3
- 239000011521 glass Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000001208 nuclear magnetic resonance pulse sequence Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- D—TEXTILES; PAPER
- D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
- D21F—PAPER-MAKING MACHINES; METHODS OF PRODUCING PAPER THEREON
- D21F7/00—Other details of machines for making continuous webs of paper
- D21F7/003—Indicating or regulating the moisture content of the layer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N21/3151—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using two sources of radiation of different wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19813149869 DE3149869A1 (de) | 1981-12-16 | 1981-12-16 | "vorrichtung zur schnellen bestimmung der feuchte einer probe mit hilfe von infrarot-lumineszenzdioden" |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19813149869 DE3149869A1 (de) | 1981-12-16 | 1981-12-16 | "vorrichtung zur schnellen bestimmung der feuchte einer probe mit hilfe von infrarot-lumineszenzdioden" |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3149869A1 DE3149869A1 (de) | 1983-06-23 |
DE3149869C2 true DE3149869C2 (enrdf_load_stackoverflow) | 1991-02-14 |
Family
ID=6148909
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19813149869 Granted DE3149869A1 (de) | 1981-12-16 | 1981-12-16 | "vorrichtung zur schnellen bestimmung der feuchte einer probe mit hilfe von infrarot-lumineszenzdioden" |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE3149869A1 (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4210031A1 (de) * | 1992-03-27 | 1993-09-30 | Eyetec Gmbh | Berührungslose optische Längenmessung von Materialien mit schwankender Dicke |
DE19701904A1 (de) * | 1997-01-21 | 1998-07-23 | Axel Hemmer | Vorrichtung zur quantitativen Bestimmung der Oberflächenfeuchte mit Hilfe eines kombinierten Verfahrens |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4008279A1 (de) * | 1990-03-15 | 1992-01-09 | Kernforschungsz Karlsruhe | Verfahren zur in-situ-ueberwachung der oberflaechenfeuchte von bewegten kaffeebohnen |
CN1036679C (zh) * | 1994-01-31 | 1997-12-10 | 浙江大学 | 电斩光近红外水分仪 |
EP0795743A3 (en) * | 1996-03-15 | 1998-02-25 | Japan Tobacco Inc. | Method and apparatus for infra-red moisture measurement |
US6094262A (en) * | 1999-02-26 | 2000-07-25 | Waters Investments Limited | High temperature differential refractometry apparatus |
DE10316685A1 (de) * | 2003-04-10 | 2004-10-28 | Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG | Vorichtung zur photometrischen Messung der Konzentration einer chemischen Substanz in einer Meßlösung |
AT507221B1 (de) * | 2009-04-16 | 2010-03-15 | Dietmar Ueblacker | Vorrichtung für das messen des wassergehaltes einer stoffmischung |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1598467B1 (de) * | 1967-07-26 | 1972-03-16 | Frieseke & Hoepfner Gmbh | Geraet zur beruehrungslosen messung der feuchte oder der konzentration anderer substanzen in bewegten messguthaben |
DE2116386A1 (de) * | 1971-03-30 | 1972-10-12 | Wenzel, Martin, Prof.Dr., 1000 Berlin | Anordnung zum Messen der Lichtabsorption |
US3734631A (en) * | 1971-05-28 | 1973-05-22 | Hewlett Packard Co | Nondispersive infrared gas analyzer employing solid state emitters and photodetectors |
DE2553565C3 (de) * | 1975-11-28 | 1980-02-07 | Hartmann & Braun Ag, 6000 Frankfurt | Vorrichtung zur Bestimmung der Stickoxidkonzentration in einem Gasgemisch |
DE2651481A1 (de) * | 1976-11-11 | 1978-05-18 | Hartmann & Braun Ag | Photometrische geraete zur messung der konzentration einer stoffkomponente in einem stoffgemisch |
DE2838498C2 (de) * | 1978-09-04 | 1982-09-02 | Hoelzle & Chelius KG, 6078 Neu-Isenburg | Photoelektrisches Meßgerät |
-
1981
- 1981-12-16 DE DE19813149869 patent/DE3149869A1/de active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4210031A1 (de) * | 1992-03-27 | 1993-09-30 | Eyetec Gmbh | Berührungslose optische Längenmessung von Materialien mit schwankender Dicke |
DE19701904A1 (de) * | 1997-01-21 | 1998-07-23 | Axel Hemmer | Vorrichtung zur quantitativen Bestimmung der Oberflächenfeuchte mit Hilfe eines kombinierten Verfahrens |
DE19701904C2 (de) * | 1997-01-21 | 2002-02-14 | Michael Tummuscheit | Vorrichtung zur quantitativen Bestimmung der Oberflächenfeuchte mit Hilfe eines kombinierten Verfahrens |
Also Published As
Publication number | Publication date |
---|---|
DE3149869A1 (de) | 1983-06-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69030047T2 (de) | Röntgenstrahlen-Fluoreszenzgerät unter Verwendung der Totalreflexion | |
DE1573401C3 (de) | Anordnung zur zerstörungsfreien Werkstoffprüfung auf verborgene Defekte | |
DE69125011T2 (de) | Verfahren und Vorrichtung zur optischen Ferndetektion eines sich in einem beobachteten Raumgebiet befindenden Gases | |
DE3789923T2 (de) | Spektrometer. | |
DE69113509T2 (de) | Gasdetektor. | |
EP0610673A1 (de) | Vorrichtung zur automatischen kolorimetrischen Auswertung von Verfärbungszonen auf einem Träger zum Nachweis von Gasen und/oder Dämpfen | |
DE60223928T2 (de) | Spektrometer unter verwendung von einem spektraltrennungsverfahren | |
DE2526794A1 (de) | Gasanalysator | |
CH618266A5 (en) | Spectrophotometer. | |
DE3048053A1 (de) | Anordnung zum erfassen von teilchen | |
DE10058469C1 (de) | Optischer Gassensor | |
EP0145877B1 (de) | Fotometer zur kontinuierlichen Analyse eines Mediums (Gas oder Flüssigkeit) | |
DE3926349A1 (de) | Optische fehlerinspektionsvorrichtung | |
DE4441023A1 (de) | Gasanalysator und Gasanalysiermechanismus | |
DE20301081U1 (de) | Optischer Gassensor | |
EP0716292B1 (de) | Verfahren und Vorrichtung zur Durchführung dieses Verfahrens zum Messen einer Lage von Bahnen oder Bogen | |
DE4007401A1 (de) | Messvorrichtung | |
DE3149869C2 (enrdf_load_stackoverflow) | ||
DE3225610C2 (enrdf_load_stackoverflow) | ||
DE19913929A1 (de) | Vorrichtung und Verfahren zum Bestimmen von Eigenschaften einer Materialbahn | |
DE19811150C2 (de) | Dünnschichtchromatographiegerät | |
EP0624787A1 (de) | Verfahren und Einrichtung zur zerstörungsfreien Oberflächen-Inspektion | |
CH618267A5 (enrdf_load_stackoverflow) | ||
DE1472144A1 (de) | Spektralphotometer | |
DE2430011C3 (de) | Zweistrahl-Photometer mit Interferenzfilter |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8110 | Request for examination paragraph 44 | ||
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |