DE3116214C2 - - Google Patents

Info

Publication number
DE3116214C2
DE3116214C2 DE3116214A DE3116214A DE3116214C2 DE 3116214 C2 DE3116214 C2 DE 3116214C2 DE 3116214 A DE3116214 A DE 3116214A DE 3116214 A DE3116214 A DE 3116214A DE 3116214 C2 DE3116214 C2 DE 3116214C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3116214A
Other versions
DE3116214A1 (de
Inventor
Kjell Jan-Erik Stockholm Se Wickman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NICATOR AB, ESKILSTUNA, SE
Original Assignee
PHAROS LIDINGOE SE AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PHAROS LIDINGOE SE AB filed Critical PHAROS LIDINGOE SE AB
Publication of DE3116214A1 publication Critical patent/DE3116214A1/de
Application granted granted Critical
Publication of DE3116214C2 publication Critical patent/DE3116214C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/03—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring coordinates of points
DE19813116214 1980-04-23 1981-04-23 Ablenkeinheit Granted DE3116214A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8003082 1980-04-23

Publications (2)

Publication Number Publication Date
DE3116214A1 DE3116214A1 (de) 1982-02-18
DE3116214C2 true DE3116214C2 (de) 1987-01-15

Family

ID=20340812

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19813116214 Granted DE3116214A1 (de) 1980-04-23 1981-04-23 Ablenkeinheit

Country Status (5)

Country Link
US (1) US4441818A (de)
JP (1) JPS56168503A (de)
DE (1) DE3116214A1 (de)
GB (1) GB2078374B (de)
SE (1) SE455818B (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60220807A (ja) * 1984-04-17 1985-11-05 Agency Of Ind Science & Technol ロ−リングも測定できるオ−トコリメ−タ用反射鏡
US4836669A (en) * 1987-11-16 1989-06-06 Spectra-Physics, Inc. Apparatus and method for projection of reference planes of light
US4971440A (en) * 1989-12-08 1990-11-20 Spectra-Physics, Inc. Projection of two orthogonal reference light planes
JP2817301B2 (ja) * 1989-12-28 1998-10-30 松下電器産業株式会社 光ヘッド
US5218770A (en) * 1990-11-27 1993-06-15 Asahi Seimitsu Kabushiki Kaisha Surveying machine for construction work
US5287365A (en) * 1992-03-05 1994-02-15 Laser Alignment, Inc. Compact laser apparatus
SE502409C2 (sv) * 1993-09-30 1995-10-16 Dataliner Ab Mätanordning för dimensionsmätning av ett stort mätobjekt, t.e.x chassiet hos en bil
US5864956A (en) * 1996-11-22 1999-02-02 Dong; Dawei Level line and limb line combination
DE10116563B4 (de) * 2001-04-04 2009-05-28 Hilti Aktiengesellschaft Mehrachslaserstrahler mit optischem Strahlteiler
DE10319369A1 (de) * 2003-04-29 2004-12-02 Prüftechnik Dieter Busch AG Verfahren zur Bestimmung des Niveaus mehrerer Messpunkte sowie Anordnung dafür
WO2008011398A1 (en) * 2006-07-17 2008-01-24 Lester Wallis Martin Layout laser assembly
US9874438B2 (en) * 2015-12-16 2018-01-23 Harold W. Graddy Laser angle square adapter

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US161155A (en) * 1875-03-23 Improvement in millers paint-staffs
US456086A (en) * 1891-07-14 Reginald forwood
GB491707A (en) * 1937-03-18 1938-09-07 Zeiss Carl Improvements in reflecting systems having two plane reflecting surfaces
US2308206A (en) * 1941-04-07 1943-01-12 Pinkney L Poland Leveling instrument
US2746163A (en) * 1951-12-05 1956-05-22 Pure Oil Co Flange level
US3026625A (en) * 1959-11-23 1962-03-27 Sr John F Carey Surveying instrument
US3409993A (en) * 1966-01-10 1968-11-12 Hughes Aircraft Co Precision tilt meter
GB1161065A (en) * 1966-01-20 1969-08-13 Stanley Horace Frederick Sarl Improvements in or relating to Surveying Instruments.
US3748026A (en) * 1970-08-31 1973-07-24 Aga Ab Reflector for distance measurement
US3684380A (en) * 1970-11-27 1972-08-15 Robert Benchley Jr Navigational aid comprising two mirrors mounted at predetermined angular relationship for reverse direction observation
US3765764A (en) * 1971-03-23 1973-10-16 Aga Ab Coordinate measuring instrument
SE411687B (sv) * 1978-05-31 1980-01-28 Aga Ab Accelerometer for metning av vinkellege i vertikalled

Also Published As

Publication number Publication date
SE8102306L (sv) 1981-10-24
GB2078374A (en) 1982-01-06
SE455818B (sv) 1988-08-08
DE3116214A1 (de) 1982-02-18
GB2078374B (en) 1984-03-07
JPS56168503A (en) 1981-12-24
JPH0315682B2 (de) 1991-03-01
US4441818A (en) 1984-04-10

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8128 New person/name/address of the agent

Representative=s name: STROHSCHAENK, H., DIPL.-ING. URI, P., DIPL.-ING. S

D2 Grant after examination
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NICATOR AB, ESKILSTUNA, SE

8328 Change in the person/name/address of the agent

Free format text: URI, P., DIPL.-ING. STRASSER, W., DIPL.-PHYS., PAT.-ANW., 8000 MUENCHEN

8339 Ceased/non-payment of the annual fee