DE3071965D1 - Reference voltage generator and circuit for measuring the threshold voltage of a mos transistor, applicable to such a reference voltage generator - Google Patents

Reference voltage generator and circuit for measuring the threshold voltage of a mos transistor, applicable to such a reference voltage generator

Info

Publication number
DE3071965D1
DE3071965D1 DE8080400098T DE3071965T DE3071965D1 DE 3071965 D1 DE3071965 D1 DE 3071965D1 DE 8080400098 T DE8080400098 T DE 8080400098T DE 3071965 T DE3071965 T DE 3071965T DE 3071965 D1 DE3071965 D1 DE 3071965D1
Authority
DE
Germany
Prior art keywords
reference voltage
voltage generator
applicable
measuring
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8080400098T
Other languages
English (en)
Inventor
Luc Audaire
Bernard Baylac
Gerard Merckel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Application granted granted Critical
Publication of DE3071965D1 publication Critical patent/DE3071965D1/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • G05F3/242—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage
    • G05F3/245—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only with compensation for device parameters, e.g. channel width modulation, threshold voltage, processing, or external variations, e.g. temperature, loading, supply voltage producing a voltage or current as a predetermined function of the temperature
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/1025—Channel region of field-effect devices
    • H01L29/1029—Channel region of field-effect devices of field-effect transistors
    • H01L29/1033—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Nonlinear Science (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Ceramic Engineering (AREA)
  • Control Of Electrical Variables (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE8080400098T 1979-01-26 1980-01-22 Reference voltage generator and circuit for measuring the threshold voltage of a mos transistor, applicable to such a reference voltage generator Expired DE3071965D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7902052A FR2447610A1 (fr) 1979-01-26 1979-01-26 Generateur de tension de reference et circuit de mesure de la tension de seuil d'un transistor mos, applicable a ce generateur de tension de reference

Publications (1)

Publication Number Publication Date
DE3071965D1 true DE3071965D1 (en) 1987-06-11

Family

ID=9221253

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8080400098T Expired DE3071965D1 (en) 1979-01-26 1980-01-22 Reference voltage generator and circuit for measuring the threshold voltage of a mos transistor, applicable to such a reference voltage generator

Country Status (5)

Country Link
US (1) US4305011A (de)
EP (1) EP0014149B1 (de)
JP (1) JPS55102024A (de)
DE (1) DE3071965D1 (de)
FR (1) FR2447610A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4384217A (en) * 1981-05-11 1983-05-17 Bell Telephone Laboratories, Incorporated Temperature stabilized voltage reference circuit
US4408130A (en) * 1981-10-05 1983-10-04 Bell Telephone Laboratories, Incorporated Temperature stabilized voltage reference
NL8302731A (nl) * 1983-08-02 1985-03-01 Philips Nv Halfgeleiderinrichting.
US4634894A (en) * 1985-03-04 1987-01-06 Advanced Micro Devices, Inc. Low power CMOS reference generator with low impedance driver
US4663584B1 (en) * 1985-06-10 1996-05-21 Toshiba Kk Intermediate potential generation circuit
US4789825A (en) * 1986-05-14 1988-12-06 American Telephone And Telegraph Co., At&T Bell Laboratories Integrated circuit with channel length indicator
JPS6319023A (ja) * 1986-07-11 1988-01-26 Toshiba Corp 動作停止機能付き定電圧回路
US4742292A (en) * 1987-03-06 1988-05-03 International Business Machines Corp. CMOS Precision voltage reference generator
US4837459A (en) * 1987-07-13 1989-06-06 International Business Machines Corp. CMOS reference voltage generation
DE60219309T2 (de) * 2002-08-30 2008-01-03 Infineon Technologies Ag Halbleiterbaustein zum Einstellen einer durch Kurzkanaleffekte verursachten Schwellspannungsverschiebung
US7368980B2 (en) * 2005-04-25 2008-05-06 Triquint Semiconductor, Inc. Producing reference voltages using transistors

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3823332A (en) * 1970-01-30 1974-07-09 Rca Corp Mos fet reference voltage supply
US3806742A (en) * 1972-11-01 1974-04-23 Motorola Inc Mos voltage reference circuit
JPS5419571B2 (de) * 1973-05-11 1979-07-16
US3975648A (en) * 1975-06-16 1976-08-17 Hewlett-Packard Company Flat-band voltage reference
JPS5922246B2 (ja) * 1975-12-29 1984-05-25 セイコーエプソン株式会社 テイデンリユウカイロ
US4100437A (en) * 1976-07-29 1978-07-11 Intel Corporation MOS reference voltage circuit
US4096430A (en) * 1977-04-04 1978-06-20 General Electric Company Metal-oxide-semiconductor voltage reference

Also Published As

Publication number Publication date
EP0014149B1 (de) 1987-05-06
FR2447610B1 (de) 1982-06-11
US4305011A (en) 1981-12-08
FR2447610A1 (fr) 1980-08-22
EP0014149A1 (de) 1980-08-06
JPS55102024A (en) 1980-08-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee