DE3018212A1 - Hf-spektralanalysator - Google Patents
Hf-spektralanalysatorInfo
- Publication number
- DE3018212A1 DE3018212A1 DE19803018212 DE3018212A DE3018212A1 DE 3018212 A1 DE3018212 A1 DE 3018212A1 DE 19803018212 DE19803018212 DE 19803018212 DE 3018212 A DE3018212 A DE 3018212A DE 3018212 A1 DE3018212 A1 DE 3018212A1
- Authority
- DE
- Germany
- Prior art keywords
- light
- laser
- lens
- spectrum analyzer
- acoustic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000003595 spectral effect Effects 0.000 title description 2
- 238000001228 spectrum Methods 0.000 claims description 19
- 239000000758 substrate Substances 0.000 claims description 19
- 230000003287 optical effect Effects 0.000 claims description 15
- 230000010287 polarization Effects 0.000 claims description 10
- 230000000694 effects Effects 0.000 claims description 4
- 238000010897 surface acoustic wave method Methods 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 claims description 2
- 239000002344 surface layer Substances 0.000 description 9
- 230000002269 spontaneous effect Effects 0.000 description 6
- 239000013078 crystal Substances 0.000 description 4
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- MDPILPRLPQYEEN-UHFFFAOYSA-N aluminium arsenide Chemical compound [As]#[Al] MDPILPRLPQYEEN-UHFFFAOYSA-N 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 241000276498 Pollachius virens Species 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
- G01R23/17—Spectrum analysis; Fourier analysis with optical or acoustical auxiliary devices
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/29—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the position or the direction of light beams, i.e. deflection
- G02F1/33—Acousto-optical deflection devices
- G02F1/335—Acousto-optical deflection devices having an optical waveguide structure
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Mathematical Physics (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/043,411 US4253060A (en) | 1979-05-29 | 1979-05-29 | RF Spectrum analyzer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE3018212A1 true DE3018212A1 (de) | 1980-12-11 |
Family
ID=21927042
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19803018212 Withdrawn DE3018212A1 (de) | 1979-05-29 | 1980-05-13 | Hf-spektralanalysator |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4253060A (enExample) |
| DE (1) | DE3018212A1 (enExample) |
| FR (1) | FR2458059A1 (enExample) |
| GB (1) | GB2050599B (enExample) |
| IL (1) | IL60012A (enExample) |
| SE (1) | SE450738B (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3138727A1 (de) * | 1981-09-29 | 1983-04-21 | Siemens AG, 1000 Berlin und 8000 München | Frequenzanalysator in planarer wellenleitertechnologie und verfahren zur herstellung einer planaren geodaetischen linse auf oder in einem substrat |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4425023A (en) | 1980-01-31 | 1984-01-10 | Canon Kabushiki Kaisha | Beam spot scanning device |
| US4348074A (en) * | 1980-03-03 | 1982-09-07 | The United States Of America As Represented By The Secretary Of The Navy | Application of ion implantation to LiNbO3 integrated, optical spectrum analyzers |
| US4328576A (en) * | 1980-03-10 | 1982-05-04 | Itek Corporation | Wide band demodulator of phase modulated signals |
| DE3201128C2 (de) * | 1981-01-17 | 1985-08-29 | Omron Tateisi Electronics Co., Kyoto | Optische Schaltvorrichtung |
| GB2098347B (en) * | 1981-02-18 | 1985-07-24 | Omron Tateisi Electronics Co | Parallel-serial converter for optical data |
| JPS57142664A (en) * | 1981-02-27 | 1982-09-03 | Canon Inc | Information recorder |
| JPS57142603A (en) * | 1981-02-27 | 1982-09-03 | Canon Inc | Optical scanner |
| US4455063A (en) * | 1981-04-15 | 1984-06-19 | Canon Kabushiki Kaisha | Luneburg lens for waveguide with graded index profile |
| US4394060A (en) * | 1981-04-15 | 1983-07-19 | Canon Kabushiki Kaisha | Light beam scanning system with saw transducer |
| US4453801A (en) * | 1981-04-15 | 1984-06-12 | Canon Kabushiki Kaisha | Protected Luneburg lens |
| DE3138745A1 (de) * | 1981-09-29 | 1983-04-07 | Siemens AG, 1000 Berlin und 8000 München | Akustooptischer lichtablenker mit hoher aufloesung |
| US4464624A (en) * | 1981-10-15 | 1984-08-07 | General Dynamics/Electronics Division | Broadband optical spectrum analyzer |
| US4762383A (en) * | 1981-12-04 | 1988-08-09 | Omron Tateisi Electronics Co. | Two dimensional light beam deflectors utilizing thermooptical effect and method of using same |
| US4568911A (en) * | 1981-12-29 | 1986-02-04 | Omron Tateisi Electronics Co. | Method and device for optical D-A conversion |
| US4604707A (en) * | 1982-03-12 | 1986-08-05 | Omron Tateisi Electronics Co. | Device and method for comparing optical signals |
| GB2119533B (en) * | 1982-04-17 | 1985-12-18 | Marconi Co Ltd | A bragg cell |
| DE3235499A1 (de) * | 1982-09-24 | 1984-04-05 | Siemens AG, 1000 Berlin und 8000 München | Beugungsbegrenzte linse fuer eine bragg-zelle |
| US4544229A (en) * | 1983-01-19 | 1985-10-01 | Battelle Development Corporation | Apparatus for evaluating a polynomial function using an array of optical modules |
| US4618819A (en) * | 1984-03-27 | 1986-10-21 | The University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
| US4633170A (en) * | 1984-06-05 | 1986-12-30 | The United States Of America As Represented By The Secretary Of The Navy | Bragg cell spectrum analyzer |
| FR2574943B1 (fr) * | 1984-12-18 | 1987-05-22 | Thomson Csf | Systeme analyseur de transitoires |
| US4725774A (en) * | 1986-06-20 | 1988-02-16 | Northrop Corporation | Integrated interferometric acousto-optic spectrum analyzer |
| US4801872A (en) * | 1986-07-09 | 1989-01-31 | Nec Corporation | Guided-wave acoustooptic spectrum analyzer |
| FR2637079B1 (fr) * | 1988-09-23 | 1990-11-23 | Rd Ctre Suisse Electro Microte | Capteur de force a guide d'ondes optique integre dans un substrat |
| US4993032A (en) * | 1989-12-28 | 1991-02-12 | General Dynamics Corp., Electronics Divn. | Monolithic temperature stabilized optical tuning circuit for channel separation in WDM systems utilizing tunable lasers |
| US5027055A (en) * | 1990-01-10 | 1991-06-25 | The United States Of America As Represented By The Secretary Of The Navy | Compact optical RF spectrum analyzer |
| GB2331149B (en) * | 1991-11-20 | 1999-09-22 | Marconi Gec Ltd | An electrostatic voltage sensor |
| US7355162B2 (en) * | 2002-07-02 | 2008-04-08 | Optitune Plc | Optical wavelength measuring device using guiding body and diffractive structure |
| CN103018170A (zh) * | 2012-11-28 | 2013-04-03 | 南京百丝胜新材料科技有限公司 | 在线检测材料弹性参数均匀性的非接触式检测方法 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3619796A (en) * | 1970-04-27 | 1971-11-09 | Bell Telephone Labor Inc | Phase-matching arrangements in parametric traveling-wave devices |
| US3877781A (en) * | 1974-01-16 | 1975-04-15 | Bell Telephone Labor Inc | Electro-optical thin-film device |
-
1979
- 1979-05-29 US US06/043,411 patent/US4253060A/en not_active Expired - Lifetime
-
1980
- 1980-05-06 IL IL60012A patent/IL60012A/xx unknown
- 1980-05-13 DE DE19803018212 patent/DE3018212A1/de not_active Withdrawn
- 1980-05-19 GB GB8016489A patent/GB2050599B/en not_active Expired
- 1980-05-28 SE SE8003967A patent/SE450738B/sv not_active IP Right Cessation
- 1980-05-28 FR FR8011820A patent/FR2458059A1/fr active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3138727A1 (de) * | 1981-09-29 | 1983-04-21 | Siemens AG, 1000 Berlin und 8000 München | Frequenzanalysator in planarer wellenleitertechnologie und verfahren zur herstellung einer planaren geodaetischen linse auf oder in einem substrat |
Also Published As
| Publication number | Publication date |
|---|---|
| IL60012A (en) | 1985-02-28 |
| SE450738B (sv) | 1987-07-20 |
| FR2458059A1 (fr) | 1980-12-26 |
| GB2050599B (en) | 1983-04-27 |
| US4253060A (en) | 1981-02-24 |
| FR2458059B1 (enExample) | 1984-01-13 |
| SE8003967L (sv) | 1980-11-30 |
| GB2050599A (en) | 1981-01-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8139 | Disposal/non-payment of the annual fee |