DE298315C - - Google Patents
Info
- Publication number
- DE298315C DE298315C DENDAT298315D DE298315DA DE298315C DE 298315 C DE298315 C DE 298315C DE NDAT298315 D DENDAT298315 D DE NDAT298315D DE 298315D A DE298315D A DE 298315DA DE 298315 C DE298315 C DE 298315C
- Authority
- DE
- Germany
- Prior art keywords
- handle
- horseshoe
- chamber
- recess
- pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
Classifications
-
- A—HUMAN NECESSITIES
- A01—AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
- A01L—SHOEING OF ANIMALS
- A01L7/00—Accessories for shoeing animals
- A01L7/06—Elastic calks or studs
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Wood Science & Technology (AREA)
- Zoology (AREA)
- Environmental Sciences (AREA)
- Purses, Travelling Bags, Baskets, Or Suitcases (AREA)
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE298315C true DE298315C (ja) |
Family
ID=552533
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DENDAT298315D Active DE298315C (ja) |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE298315C (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7019910B2 (en) | 2001-04-06 | 2006-03-28 | Leica Microsystems Semiconductor Gmbh | Inspection microscope and objective for an inspection microscope |
-
0
- DE DENDAT298315D patent/DE298315C/de active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7019910B2 (en) | 2001-04-06 | 2006-03-28 | Leica Microsystems Semiconductor Gmbh | Inspection microscope and objective for an inspection microscope |
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