DE298315C - - Google Patents

Info

Publication number
DE298315C
DE298315C DENDAT298315D DE298315DA DE298315C DE 298315 C DE298315 C DE 298315C DE NDAT298315 D DENDAT298315 D DE NDAT298315D DE 298315D A DE298315D A DE 298315DA DE 298315 C DE298315 C DE 298315C
Authority
DE
Germany
Prior art keywords
handle
horseshoe
chamber
recess
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DENDAT298315D
Other languages
German (de)
English (en)
Publication of DE298315C publication Critical patent/DE298315C/de
Active legal-status Critical Current

Links

Classifications

    • A—HUMAN NECESSITIES
    • A01—AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
    • A01L—SHOEING OF ANIMALS
    • A01L7/00—Accessories for shoeing animals
    • A01L7/06—Elastic calks or studs

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Wood Science & Technology (AREA)
  • Zoology (AREA)
  • Environmental Sciences (AREA)
  • Purses, Travelling Bags, Baskets, Or Suitcases (AREA)
DENDAT298315D Active DE298315C (enrdf_load_stackoverflow)

Publications (1)

Publication Number Publication Date
DE298315C true DE298315C (enrdf_load_stackoverflow)

Family

ID=552533

Family Applications (1)

Application Number Title Priority Date Filing Date
DENDAT298315D Active DE298315C (enrdf_load_stackoverflow)

Country Status (1)

Country Link
DE (1) DE298315C (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7019910B2 (en) 2001-04-06 2006-03-28 Leica Microsystems Semiconductor Gmbh Inspection microscope and objective for an inspection microscope

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7019910B2 (en) 2001-04-06 2006-03-28 Leica Microsystems Semiconductor Gmbh Inspection microscope and objective for an inspection microscope

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