DE29605789U1 - Positionsmeßvorrichtung - Google Patents

Positionsmeßvorrichtung

Info

Publication number
DE29605789U1
DE29605789U1 DE29605789U DE29605789U DE29605789U1 DE 29605789 U1 DE29605789 U1 DE 29605789U1 DE 29605789 U DE29605789 U DE 29605789U DE 29605789 U DE29605789 U DE 29605789U DE 29605789 U1 DE29605789 U1 DE 29605789U1
Authority
DE
Germany
Prior art keywords
measuring device
position measuring
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE29605789U
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE29605789U priority Critical patent/DE29605789U1/de
Publication of DE29605789U1 publication Critical patent/DE29605789U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20075—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring interferences of X-rays, e.g. Borrmann effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/48—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using wave or particle radiation means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
DE29605789U 1996-03-28 1996-03-28 Positionsmeßvorrichtung Expired - Lifetime DE29605789U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE29605789U DE29605789U1 (de) 1996-03-28 1996-03-28 Positionsmeßvorrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE29605789U DE29605789U1 (de) 1996-03-28 1996-03-28 Positionsmeßvorrichtung

Publications (1)

Publication Number Publication Date
DE29605789U1 true DE29605789U1 (de) 1996-06-13

Family

ID=8021852

Family Applications (1)

Application Number Title Priority Date Filing Date
DE29605789U Expired - Lifetime DE29605789U1 (de) 1996-03-28 1996-03-28 Positionsmeßvorrichtung

Country Status (1)

Country Link
DE (1) DE29605789U1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114424054A (zh) * 2019-06-24 2022-04-29 Sms集团有限公司 用于确定多晶产品的材料特性的设备和方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114424054A (zh) * 2019-06-24 2022-04-29 Sms集团有限公司 用于确定多晶产品的材料特性的设备和方法
CN114424054B (zh) * 2019-06-24 2024-03-22 Sms集团有限公司 用于确定多晶产品的材料特性的设备和方法

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Legal Events

Date Code Title Description
R086 Non-binding declaration of licensing interest
R207 Utility model specification

Effective date: 19960725

R156 Lapse of ip right after 3 years

Effective date: 20000101