DE280198C - - Google Patents

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Publication number
DE280198C
DE280198C DENDAT280198D DE280198DA DE280198C DE 280198 C DE280198 C DE 280198C DE NDAT280198 D DENDAT280198 D DE NDAT280198D DE 280198D A DE280198D A DE 280198DA DE 280198 C DE280198 C DE 280198C
Authority
DE
Germany
Prior art keywords
parts
mixed
atmospheres
hour
heated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DENDAT280198D
Other languages
German (de)
English (en)
Publication of DE280198C publication Critical patent/DE280198C/de
Active legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/0008Organic ingredients according to more than one of the "one dot" groups of C08K5/01 - C08K5/59
    • C08K5/0025Crosslinking or vulcanising agents; including accelerators

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Polyamides (AREA)
DENDAT280198D Active DE280198C (https=)

Publications (1)

Publication Number Publication Date
DE280198C true DE280198C (https=)

Family

ID=536052

Family Applications (1)

Application Number Title Priority Date Filing Date
DENDAT280198D Active DE280198C (https=)

Country Status (1)

Country Link
DE (1) DE280198C (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6531379B2 (en) 1999-04-22 2003-03-11 International Business Machines Corporation High resolution dopant/impurity incorporation in semiconductors via a scanned atomic force probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6531379B2 (en) 1999-04-22 2003-03-11 International Business Machines Corporation High resolution dopant/impurity incorporation in semiconductors via a scanned atomic force probe

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