DE2630160C3 - Testdatengenerator mit einem Taktgeber - Google Patents

Testdatengenerator mit einem Taktgeber

Info

Publication number
DE2630160C3
DE2630160C3 DE2630160A DE2630160A DE2630160C3 DE 2630160 C3 DE2630160 C3 DE 2630160C3 DE 2630160 A DE2630160 A DE 2630160A DE 2630160 A DE2630160 A DE 2630160A DE 2630160 C3 DE2630160 C3 DE 2630160C3
Authority
DE
Germany
Prior art keywords
output
signals
signal
clock
test data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2630160A
Other languages
German (de)
English (en)
Other versions
DE2630160B2 (de
DE2630160A1 (de
Inventor
Charles Joseph San Diego Calif. Fassbender (V.St.A.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NCR International Inc
Original Assignee
NCR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NCR Corp filed Critical NCR Corp
Publication of DE2630160A1 publication Critical patent/DE2630160A1/de
Publication of DE2630160B2 publication Critical patent/DE2630160B2/de
Application granted granted Critical
Publication of DE2630160C3 publication Critical patent/DE2630160C3/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816—Testing
    • G11B20/182—Testing using test patterns
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/02—Recording, reproducing, or erasing methods; Read, write or erase circuits therefor
    • G11B5/09—Digital recording
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/84—Generating pulses having a predetermined statistical distribution of a parameter, e.g. random pulse generators

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Signal Processing (AREA)
  • Nonlinear Science (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE2630160A 1975-07-07 1976-07-05 Testdatengenerator mit einem Taktgeber Expired DE2630160C3 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/594,145 US3996612A (en) 1975-07-07 1975-07-07 Test code generator

Publications (3)

Publication Number Publication Date
DE2630160A1 DE2630160A1 (de) 1977-01-13
DE2630160B2 DE2630160B2 (de) 1978-10-26
DE2630160C3 true DE2630160C3 (de) 1979-06-28

Family

ID=24377721

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2630160A Expired DE2630160C3 (de) 1975-07-07 1976-07-05 Testdatengenerator mit einem Taktgeber

Country Status (6)

Country Link
US (1) US3996612A (en:Method)
JP (1) JPS5210035A (en:Method)
CA (1) CA1060108A (en:Method)
DE (1) DE2630160C3 (en:Method)
FR (1) FR2317707A1 (en:Method)
GB (1) GB1513635A (en:Method)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58161116A (ja) * 1982-03-19 1983-09-24 Matsushita Electric Ind Co Ltd デイスク再生装置
US4520408A (en) * 1983-02-22 1985-05-28 Vsp Labs, Inc. Clock signal synchronization apparatus and method for decoding self-clocking encoded data
US4612586A (en) * 1984-06-05 1986-09-16 Memorex Corporation Method for measuring timing asymmetry in a magnetic storage system
JPS61105778A (ja) * 1984-06-05 1986-05-23 メモレツクス・コ−ポレ−シヨン 磁気記憶装置システムの検査方法
DE102004033266A1 (de) * 2004-07-09 2006-02-02 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung und Verfahren zur Positionsmessung

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3641526A (en) * 1969-12-29 1972-02-08 Ibm Intra-record resynchronization
US3821798A (en) * 1972-02-18 1974-06-28 Ibm Resynchronizable recording system
US3864735A (en) * 1973-09-12 1975-02-04 Burroughs Corp Read/write system for high density magnetic recording

Also Published As

Publication number Publication date
GB1513635A (en) 1978-06-07
FR2317707A1 (fr) 1977-02-04
FR2317707B1 (en:Method) 1979-07-20
DE2630160B2 (de) 1978-10-26
DE2630160A1 (de) 1977-01-13
US3996612A (en) 1976-12-07
CA1060108A (en) 1979-08-07
JPS5210035A (en) 1977-01-26

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
8320 Willingness to grant licences declared (paragraph 23)
8327 Change in the person/name/address of the patent owner

Owner name: NCR INTERNATIONAL INC., DAYTON, OHIO, US

8328 Change in the person/name/address of the agent

Free format text: KAHLER, K., DIPL.-ING., 8948 MINDELHEIM KAECK, J., DIPL.-ING. DIPL.-WIRTSCH.-ING., 8910 LANDSBERG FIENER, J., PAT.-ANWAELTE, 8948 MINDELHEIM

8339 Ceased/non-payment of the annual fee