DE2430011C3 - Zweistrahl-Photometer mit Interferenzfilter - Google Patents

Zweistrahl-Photometer mit Interferenzfilter

Info

Publication number
DE2430011C3
DE2430011C3 DE2430011A DE2430011A DE2430011C3 DE 2430011 C3 DE2430011 C3 DE 2430011C3 DE 2430011 A DE2430011 A DE 2430011A DE 2430011 A DE2430011 A DE 2430011A DE 2430011 C3 DE2430011 C3 DE 2430011C3
Authority
DE
Germany
Prior art keywords
wavelength
filter
interference filter
photometer
interference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2430011A
Other languages
German (de)
English (en)
Other versions
DE2430011B2 (de
DE2430011A1 (de
Inventor
Konrad Dr. 5000 Koeln Bunge
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bayer AG
Original Assignee
Bayer AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to DE2430011A priority Critical patent/DE2430011C3/de
Application filed by Bayer AG filed Critical Bayer AG
Priority to BE157525A priority patent/BE830463A/xx
Priority to US05/588,750 priority patent/US4017191A/en
Priority to GB26299/75A priority patent/GB1508068A/en
Priority to FR7519398A priority patent/FR2275760A1/fr
Priority to DK280875A priority patent/DK280875A/da
Priority to NL7507457A priority patent/NL7507457A/xx
Publication of DE2430011A1 publication Critical patent/DE2430011A1/de
Publication of DE2430011B2 publication Critical patent/DE2430011B2/de
Application granted granted Critical
Publication of DE2430011C3 publication Critical patent/DE2430011C3/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/427—Dual wavelengths spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J2003/1226—Interference filters
    • G01J2003/1234—Continuously variable IF [CVIF]; Wedge type

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
DE2430011A 1974-06-22 1974-06-22 Zweistrahl-Photometer mit Interferenzfilter Expired DE2430011C3 (de)

Priority Applications (7)

Application Number Priority Date Filing Date Title
DE2430011A DE2430011C3 (de) 1974-06-22 1974-06-22 Zweistrahl-Photometer mit Interferenzfilter
US05/588,750 US4017191A (en) 1974-06-22 1975-06-20 Two-beam photometer with rotatable graded interference filter
GB26299/75A GB1508068A (en) 1974-06-22 1975-06-20 Two-beam photometer with interference filter
FR7519398A FR2275760A1 (fr) 1974-06-22 1975-06-20 Photometre a deux faisceaux a filtre interferentiel
BE157525A BE830463A (fr) 1974-06-22 1975-06-20 Photometre a deux faisceaux a filtre interferentiel
DK280875A DK280875A (da) 1974-06-22 1975-06-20 Dobbeltstralefotometer med interferensfilter
NL7507457A NL7507457A (nl) 1974-06-22 1975-06-23 Fotometer met twee stralen en een interferentie- filter.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2430011A DE2430011C3 (de) 1974-06-22 1974-06-22 Zweistrahl-Photometer mit Interferenzfilter

Publications (3)

Publication Number Publication Date
DE2430011A1 DE2430011A1 (de) 1976-01-08
DE2430011B2 DE2430011B2 (de) 1977-08-25
DE2430011C3 true DE2430011C3 (de) 1978-05-03

Family

ID=5918694

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2430011A Expired DE2430011C3 (de) 1974-06-22 1974-06-22 Zweistrahl-Photometer mit Interferenzfilter

Country Status (7)

Country Link
US (1) US4017191A (enExample)
BE (1) BE830463A (enExample)
DE (1) DE2430011C3 (enExample)
DK (1) DK280875A (enExample)
FR (1) FR2275760A1 (enExample)
GB (1) GB1508068A (enExample)
NL (1) NL7507457A (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4176916A (en) * 1977-03-14 1979-12-04 Neotec Corporation Cam filter wheel
DE3316334A1 (de) * 1983-05-04 1984-11-08 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Verfahren und vorrichtung zur quantitativen konzentrationsbestimmung eines gases innerhalb eines gas-staubgemisches
GB2148492B (en) * 1983-10-22 1986-10-22 Stc Plc Gas detector
FR2581190B1 (fr) * 1985-04-25 1987-06-19 Elf France Detecteur interferometrique de gaz
DE3617123C2 (de) * 1985-07-04 1997-03-20 Cammann Karl Verfahren zur Selektivitätsverbesserung spektrometrischer Messungen sowie Vorrichtung zur Durchführung des Verfahrens
US4976520A (en) * 1988-09-09 1990-12-11 Grumman Aerospace Corporation Common path multichannel optical processor
US6061141A (en) * 1998-01-20 2000-05-09 Spectronix Ltd. Method and system for detecting gases or vapors in a monitored area

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3811781A (en) * 1973-01-26 1974-05-21 Baxter Laboratories Inc Multi-wavelength photometer employing a rotating variable wavelength filter

Also Published As

Publication number Publication date
FR2275760A1 (fr) 1976-01-16
DK280875A (da) 1975-12-23
DE2430011B2 (de) 1977-08-25
NL7507457A (nl) 1975-12-24
DE2430011A1 (de) 1976-01-08
BE830463A (fr) 1975-12-22
FR2275760B1 (enExample) 1979-04-06
US4017191A (en) 1977-04-12
GB1508068A (en) 1978-04-19

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
EHV Ceased/renunciation