DE212021000130U1 - Vorrichtung zur Erkennung von Defekten auf der Walzenoberfläche einer Walzenpresse - Google Patents

Vorrichtung zur Erkennung von Defekten auf der Walzenoberfläche einer Walzenpresse Download PDF

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Publication number
DE212021000130U1
DE212021000130U1 DE212021000130.0U DE212021000130U DE212021000130U1 DE 212021000130 U1 DE212021000130 U1 DE 212021000130U1 DE 212021000130 U DE212021000130 U DE 212021000130U DE 212021000130 U1 DE212021000130 U1 DE 212021000130U1
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roll surface
der
roll
cloud data
point cloud
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DE212021000130.0U
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German (de)
English (en)
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CNBM (HEFEI) POWDER TECHNOLOGY EQUIPMENT Co Ltd
Cnbm Hefei Powder Tech Equipment Co Ltd
Original Assignee
CNBM (HEFEI) POWDER TECHNOLOGY EQUIPMENT Co Ltd
Cnbm Hefei Powder Tech Equipment Co Ltd
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Publication of DE212021000130U1 publication Critical patent/DE212021000130U1/de
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
    • G01B11/285—Measuring arrangements characterised by the use of optical techniques for measuring areas using photoelectric detection means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/62—Analysis of geometric attributes of area, perimeter, diameter or volume
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/64—Analysis of geometric attributes of convexity or concavity
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/66—Analysis of geometric attributes of image moments or centre of gravity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8861—Determining coordinates of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G01N2021/8874—Taking dimensions of defect into account
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10028—Range image; Depth image; 3D point clouds
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Geometry (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Signal Processing (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
DE212021000130.0U 2020-03-20 2021-02-08 Vorrichtung zur Erkennung von Defekten auf der Walzenoberfläche einer Walzenpresse Active DE212021000130U1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CN2020102027080 2020-03-20
CN202010202708.0A CN111402245B (zh) 2020-03-20 2020-03-20 一种辊压机辊面缺陷识别方法和装置
PCT/CN2021/076093 WO2021185010A1 (fr) 2020-03-20 2021-02-08 Procédé et appareil d'identification de défauts de surface de rouleau pour presse à rouleaux

Publications (1)

Publication Number Publication Date
DE212021000130U1 true DE212021000130U1 (de) 2022-03-22

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
DE212021000130.0U Active DE212021000130U1 (de) 2020-03-20 2021-02-08 Vorrichtung zur Erkennung von Defekten auf der Walzenoberfläche einer Walzenpresse

Country Status (3)

Country Link
CN (1) CN111402245B (fr)
DE (1) DE212021000130U1 (fr)
WO (1) WO2021185010A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111402245B (zh) * 2020-03-20 2024-02-27 中建材（合肥）粉体科技装备有限公司 一种辊压机辊面缺陷识别方法和装置
US11703457B2 (en) * 2020-12-29 2023-07-18 Industrial Technology Research Institute Structure diagnosis system and structure diagnosis method
CN112669460B (zh) * 2020-12-31 2023-07-25 新拓三维技术(深圳)有限公司 一种工件缺陷检测方法、系统及计算机可读存储介质
CN114324038A (zh) * 2021-09-26 2022-04-12 中国海洋石油集团有限公司 一种冲蚀测量系统及其检测方法
CN114279386B (zh) * 2021-12-22 2024-02-23 惠州锂威新能源科技有限公司 一种对辊磨损的检测方法
CN116786202B (zh) * 2023-07-10 2024-04-30 中建材（合肥）粉体科技装备有限公司 一种辊压机通过量实时检测系统和检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6086099B2 (ja) * 2014-07-10 2017-03-01 Ｊｆｅスチール株式会社 表面形状測定装置及びその方法
CN106373127A (zh) * 2016-09-14 2017-02-01 东北林业大学 用于木材树种及表面缺陷的激光扫描并行检测方法
US11017679B2 (en) * 2017-01-13 2021-05-25 Skydio, Inc. Unmanned aerial vehicle visual point cloud navigation
US20180211373A1 (en) * 2017-01-20 2018-07-26 Aquifi, Inc. Systems and methods for defect detection
TWI638992B (zh) * 2017-09-20 2018-10-21 正修學校財團法人正修科技大學 畫作缺陷檢測方法
CN108982513B (zh) * 2018-07-11 2021-05-07 天津工业大学 一种基于线激光扫描的高精度三维连接器针脚缺陷检测方法
CN110030951B (zh) * 2019-05-14 2020-02-11 武汉大学 一种基于三维激光扫描技术的引水竖井缺陷检测方法
CN111402245B (zh) * 2020-03-20 2024-02-27 中建材（合肥）粉体科技装备有限公司 一种辊压机辊面缺陷识别方法和装置

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Publication number Publication date
CN111402245A (zh) 2020-07-10
WO2021185010A1 (fr) 2021-09-23
CN111402245B (zh) 2024-02-27

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