DE2103318B2 - Streuhchtphotometer - Google Patents

Streuhchtphotometer

Info

Publication number
DE2103318B2
DE2103318B2 DE19712103318 DE2103318A DE2103318B2 DE 2103318 B2 DE2103318 B2 DE 2103318B2 DE 19712103318 DE19712103318 DE 19712103318 DE 2103318 A DE2103318 A DE 2103318A DE 2103318 B2 DE2103318 B2 DE 2103318B2
Authority
DE
Germany
Prior art keywords
radiation
scattered
sample
diaphragm
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19712103318
Other languages
German (de)
English (en)
Other versions
DE2103318C3 (enExample
DE2103318A1 (de
Inventor
Wilbur Irving Fullerton Calif. Kaye (V.St.A.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beckman Coulter Inc
Original Assignee
Beckman Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beckman Instruments Inc filed Critical Beckman Instruments Inc
Publication of DE2103318A1 publication Critical patent/DE2103318A1/de
Publication of DE2103318B2 publication Critical patent/DE2103318B2/de
Application granted granted Critical
Publication of DE2103318C3 publication Critical patent/DE2103318C3/de
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid
    • G01N21/53Scattering, i.e. diffuse reflection within a body or fluid within a flowing fluid, e.g. smoke
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06Investigating concentration of particle suspensions
    • G01N15/065Investigating concentration of particle suspensions using condensation nuclei counters

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19712103318 1970-01-29 1971-01-25 Streuhchtphotometer Granted DE2103318B2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US690370A 1970-01-29 1970-01-29
US9679170A 1970-12-21 1970-12-21

Publications (3)

Publication Number Publication Date
DE2103318A1 DE2103318A1 (de) 1972-01-27
DE2103318B2 true DE2103318B2 (de) 1973-10-04
DE2103318C3 DE2103318C3 (enExample) 1974-05-02

Family

ID=26676233

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19712103318 Granted DE2103318B2 (de) 1970-01-29 1971-01-25 Streuhchtphotometer

Country Status (4)

Country Link
DE (1) DE2103318B2 (enExample)
FR (1) FR2080936B1 (enExample)
GB (1) GB1298658A (enExample)
NL (2) NL173679C (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3232508A1 (de) * 1982-09-01 1984-03-01 Siemens AG, 1000 Berlin und 8000 München Anordnung zur ermittlung der intensitaet der lichtausstrahlung einer lichtemittierenden diode

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4355897A (en) 1977-12-27 1982-10-26 Beckman Instruments, Inc. Near-simultaneous measurements at forward and back scatter angles in light scattering photometers
DE3535652A1 (de) * 1984-11-01 1986-04-30 Jenoptik Jena Gmbh, Ddr 6900 Jena Anordnung zur optischen strahlenfuehrung in photometrischen analysenmessgeraeten
US6087947A (en) * 1996-07-11 2000-07-11 Robert N. Hamburger Allergen detector system and method
US5969622A (en) * 1997-10-07 1999-10-19 Robert N. Hamburger Allergen detector system and method
US7053783B2 (en) 2002-12-18 2006-05-30 Biovigilant Systems, Inc. Pathogen detector system and method
WO2006073492A2 (en) 2004-07-30 2006-07-13 Biovigilant Systems, Inc. Pathogen and particle detector system and method
NO322775B1 (no) * 2004-09-24 2006-12-11 Tomra Systems Asa Anordning og fremgangsmate for detektering av et medium
KR101283071B1 (ko) 2005-07-15 2013-07-05 바이오비질런트 시스템즈 인코포레이티드 병원체 및 입자 검출기 시스템 및 방법
US8628976B2 (en) 2007-12-03 2014-01-14 Azbil BioVigilant, Inc. Method for the detection of biologic particle contamination
CN102308196B (zh) 2008-12-18 2014-02-05 百维吉伦特系统有限公司 用于同时检测粒子的尺寸和荧光性的紧凑型检测器
KR20120074558A (ko) * 2010-12-28 2012-07-06 삼성전자주식회사 미세입자 검출장치
BR112015028590B1 (pt) * 2013-05-13 2020-11-10 Hach Lange Gmbh turbidímetro para medir a turvação de uma amostra de líquido em uma cubeta de amostra
CN114184640B (zh) * 2021-12-03 2023-07-04 渤海大学 一种基于积分球反射法的半球发射率测量方法
CN114743715A (zh) * 2022-04-12 2022-07-12 中国科学院合肥物质科学研究院 一种研究中性粒子对壁材料入射角度分布的辐照样品架
CN119533656A (zh) * 2023-08-30 2025-02-28 华为技术有限公司 检测设备和检测方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH278998A (de) * 1949-08-22 1951-11-15 Loeschcke Hans Dr Prof Verfahren zur Zählung von in einem lichtdurchlässigen Medium schwebenden Teilchen und Messgerät zur Durchführung des Verfahrens.
US3248551A (en) * 1962-10-22 1966-04-26 Joseph C Frommer Optical arrangement for sensing very small particles
US3508830A (en) * 1967-11-13 1970-04-28 Shell Oil Co Apparatus for light scattering measurements

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3232508A1 (de) * 1982-09-01 1984-03-01 Siemens AG, 1000 Berlin und 8000 München Anordnung zur ermittlung der intensitaet der lichtausstrahlung einer lichtemittierenden diode
DE3249927C2 (de) * 1982-09-01 1988-07-21 Siemens Ag Anordnung zur Ermittlung der Intensit{t der Lichtausstrahlung einer Infrarotdiode

Also Published As

Publication number Publication date
NL173679B (nl) 1983-09-16
FR2080936A1 (enExample) 1971-11-26
FR2080936B1 (enExample) 1974-03-22
NL8302326A (nl) 1983-10-03
DE2103318C3 (enExample) 1974-05-02
DE2103318A1 (de) 1972-01-27
NL173679C (nl) 1984-02-16
GB1298658A (en) 1972-12-06
NL7100938A (enExample) 1971-08-02

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
E77 Valid patent as to the heymanns-index 1977
8339 Ceased/non-payment of the annual fee