DE2102027C2 - Verfahren zur optischen Erkennung der Lage von Grenzlinien und Einrichtungen zur Durchfühung des Verfahrens - Google Patents
Verfahren zur optischen Erkennung der Lage von Grenzlinien und Einrichtungen zur Durchfühung des VerfahrensInfo
- Publication number
- DE2102027C2 DE2102027C2 DE2102027A DE2102027A DE2102027C2 DE 2102027 C2 DE2102027 C2 DE 2102027C2 DE 2102027 A DE2102027 A DE 2102027A DE 2102027 A DE2102027 A DE 2102027A DE 2102027 C2 DE2102027 C2 DE 2102027C2
- Authority
- DE
- Germany
- Prior art keywords
- light
- double
- components
- figures
- arrangement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 title claims description 35
- 230000003287 optical effect Effects 0.000 title claims description 8
- 238000001514 detection method Methods 0.000 title claims description 3
- 239000013078 crystal Substances 0.000 claims description 22
- 230000010287 polarization Effects 0.000 claims description 8
- 230000004907 flux Effects 0.000 claims description 5
- 230000000737 periodic effect Effects 0.000 claims description 3
- 229910021532 Calcite Inorganic materials 0.000 claims description 2
- 230000000295 complement effect Effects 0.000 claims description 2
- 238000002310 reflectometry Methods 0.000 claims description 2
- 238000003384 imaging method Methods 0.000 claims 3
- 238000006243 chemical reaction Methods 0.000 claims 1
- 230000003134 recirculating effect Effects 0.000 claims 1
- 238000000926 separation method Methods 0.000 claims 1
- 238000002834 transmittance Methods 0.000 claims 1
- 230000005855 radiation Effects 0.000 description 17
- 238000005259 measurement Methods 0.000 description 13
- 239000000523 sample Substances 0.000 description 8
- 238000012545 processing Methods 0.000 description 6
- 230000007423 decrease Effects 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 238000005286 illumination Methods 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000035876 healing Effects 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000035559 beat frequency Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 238000010291 electrical method Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
Landscapes
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Image Input (AREA)
- Image Analysis (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2102027A DE2102027C2 (de) | 1971-01-16 | 1971-01-16 | Verfahren zur optischen Erkennung der Lage von Grenzlinien und Einrichtungen zur Durchfühung des Verfahrens |
| GB5770671A GB1370368A (en) | 1971-01-16 | 1971-12-13 | Optical examination of surfaces |
| JP10114671A JPS547175B1 (enExample) | 1971-01-16 | 1971-12-15 | |
| FR7200554A FR2122152A5 (enExample) | 1971-01-16 | 1972-01-04 | |
| US00217170A US3764218A (en) | 1971-01-16 | 1972-01-12 | Light beam edge detection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE2102027A DE2102027C2 (de) | 1971-01-16 | 1971-01-16 | Verfahren zur optischen Erkennung der Lage von Grenzlinien und Einrichtungen zur Durchfühung des Verfahrens |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE2102027A1 DE2102027A1 (de) | 1972-08-24 |
| DE2102027C2 true DE2102027C2 (de) | 1982-12-30 |
Family
ID=5796110
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2102027A Expired DE2102027C2 (de) | 1971-01-16 | 1971-01-16 | Verfahren zur optischen Erkennung der Lage von Grenzlinien und Einrichtungen zur Durchfühung des Verfahrens |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3764218A (enExample) |
| JP (1) | JPS547175B1 (enExample) |
| DE (1) | DE2102027C2 (enExample) |
| FR (1) | FR2122152A5 (enExample) |
| GB (1) | GB1370368A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19740678A1 (de) * | 1997-09-16 | 1999-03-18 | Polytec Gmbh | Vorrichtung zur berührungslosen Schwingungsmessung |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4328553A (en) * | 1976-12-07 | 1982-05-04 | Computervision Corporation | Method and apparatus for targetless wafer alignment |
| GB2137746A (en) * | 1983-04-05 | 1984-10-10 | Hewlett Packard Co | Apparatus for Detecting Deviations of Position from a Reference |
| US4931630A (en) * | 1989-04-04 | 1990-06-05 | Wyko Corporation | Apparatus and method for automatically focusing an interference microscope |
| US5052799A (en) * | 1989-07-17 | 1991-10-01 | Thurman Sasser | Object orienting systems and systems and processes relating thereto |
| US5251058A (en) * | 1989-10-13 | 1993-10-05 | Xerox Corporation | Multiple beam exposure control |
| US5251057A (en) * | 1989-10-13 | 1993-10-05 | Xerox Corporation | Multiple beam optical modulation system |
| US5783797A (en) * | 1996-05-09 | 1998-07-21 | Seagate Technology, Inc. | Laser texturing of magnetic recording medium using a crystal material |
| US5955154A (en) * | 1996-05-09 | 1999-09-21 | Seagate Technology, Inc. | Magnetic recording medium with laser textured glass or glass-ceramic substrate |
| EP0897576B1 (en) * | 1996-05-09 | 2000-03-15 | Seagate Technology, Inc. | Laser texturing of magnetic recording medium using multiple lens focusing |
| US5895712A (en) * | 1996-05-21 | 1999-04-20 | Seagate Technology, Inc. | Magnetic recording medium with improved coercivity |
| US6020045A (en) * | 1996-06-05 | 2000-02-01 | Seagate Technology, Inc. | Textured magnetic recording medium having a transition zone |
| US5739913A (en) * | 1996-08-02 | 1998-04-14 | Mrs Technology, Inc. | Non-contact edge detector |
| US5952058A (en) | 1997-01-15 | 1999-09-14 | Seagate Technology, Inc. | Laser texturing magnetic recording medium using fiber optics |
| US5965215A (en) * | 1997-01-15 | 1999-10-12 | Seagate Technology, Inc. | Method for laser texturing a landing zone and a data zone of a magnetic recording medium |
| US6207926B1 (en) | 1997-01-15 | 2001-03-27 | Seagate Technology Llc | Fiber optic laser texturing with optical probe feedback control |
| US6021032A (en) * | 1997-01-15 | 2000-02-01 | Seagate Technology, Inc. | Magnetic recording medium with laser textured data zone |
| US5853820A (en) * | 1997-06-23 | 1998-12-29 | Seagate Technology, Inc. | Controlled laser texturing glass-ceramic substrates for magnetic recording media |
| US6068728A (en) * | 1997-08-28 | 2000-05-30 | Seagate Technology, Inc. | Laser texturing with reverse lens focusing system |
| US5837330A (en) | 1997-08-28 | 1998-11-17 | Seagate Technology, Inc. | Dual fiber optic laser texturing |
| US5956217A (en) * | 1997-08-28 | 1999-09-21 | Seagate Technology, Inc. | Reference disk for determining glide height |
| US5861196A (en) * | 1997-09-25 | 1999-01-19 | Seagate Technology, Inc. | Laser texturing a glass or glass-ceramic substrate |
| US5945197A (en) * | 1997-10-27 | 1999-08-31 | Seagate Technology | Laser texturing of magnetic recording medium using multiple lens focusing |
| US6093472A (en) * | 1999-06-23 | 2000-07-25 | Seagate Technology, Inc. | Magnetic recording medium with laser textured glass or glass-ceramic substrate |
| US6468596B1 (en) | 1999-07-15 | 2002-10-22 | Seagate Technology Llc | Laser-assisted in-situ fractionated lubricant and a new process for surface of magnetic recording media |
| US7305115B2 (en) * | 2002-02-22 | 2007-12-04 | Siemens Energy And Automation, Inc. | Method and system for improving ability of a machine vision system to discriminate features of a target |
| CN112068144B (zh) * | 2019-06-11 | 2022-10-21 | 深圳市光鉴科技有限公司 | 光投射系统及3d成像装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1004386B (de) * | 1953-05-23 | 1957-03-14 | Genevoise Instr Physique | Verfahren zur Kontrolle des Abstandes eines beweglichen Koerpers von einer Geraden und Einrichtung zu dessen Durchfuehrung |
| DE1136834B (de) * | 1959-04-09 | 1962-09-20 | Leitz Ernst Gmbh | Vorrichtung zum Messen von Lageaenderungen |
| DE1099182B (de) * | 1960-03-26 | 1961-02-09 | Leitz Ernst Gmbh | Ablesevorrichtung fuer Messteilungen und andere periodische Objekte |
| US3391970A (en) * | 1964-06-30 | 1968-07-09 | Ibm | Optical memory in which a digital light deflector is used in a bi-directional manner |
| GB1192491A (en) * | 1968-03-15 | 1970-05-20 | Mullard Ltd | Apparatus for Treating a Light Beam |
-
1971
- 1971-01-16 DE DE2102027A patent/DE2102027C2/de not_active Expired
- 1971-12-13 GB GB5770671A patent/GB1370368A/en not_active Expired
- 1971-12-15 JP JP10114671A patent/JPS547175B1/ja active Pending
-
1972
- 1972-01-04 FR FR7200554A patent/FR2122152A5/fr not_active Expired
- 1972-01-12 US US00217170A patent/US3764218A/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19740678A1 (de) * | 1997-09-16 | 1999-03-18 | Polytec Gmbh | Vorrichtung zur berührungslosen Schwingungsmessung |
| US6084672A (en) * | 1997-09-16 | 2000-07-04 | Polytec Gmbh | Device for optically measuring an object using a laser interferometer |
Also Published As
| Publication number | Publication date |
|---|---|
| US3764218A (en) | 1973-10-09 |
| FR2122152A5 (enExample) | 1972-08-25 |
| DE2102027A1 (de) | 1972-08-24 |
| GB1370368A (en) | 1974-10-16 |
| JPS547175B1 (enExample) | 1979-04-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE2102027C2 (de) | Verfahren zur optischen Erkennung der Lage von Grenzlinien und Einrichtungen zur Durchfühung des Verfahrens | |
| DE3715864C2 (de) | Verfahren und Vorrichtung zum Erfassen/Einstellen einer Verschiebung | |
| DE2240968A1 (de) | Optisches verfahren zur messung der relativen verschiebung eines beugungsgitters sowie einrichtungen zu seiner durchfuehrung | |
| EP0561015A1 (de) | Interferometrische Phasenmessung | |
| DE3603235A1 (de) | Vorrichtung und verfahren zum analysieren von parametern eines faserigen substrats | |
| DE2210681C3 (de) | Einrichtung zur berührungslosen Messung | |
| EP0052813A2 (de) | Verfahren zum Beschauen einer reflektierenden und/oder transparenten, sich bewegenden Bahn und Beschaumaschine zur Durchführung des Verfahrens | |
| DE1698280A1 (de) | Messvorrichtung fuer Relativbewegungen | |
| CH701902A2 (de) | Verfahren zur Verfolgung der Farbhomogenität der Garnoberfläche und Vorrichtung zu dessen Durchführung. | |
| DE19636711A1 (de) | Verbesserungen an oder bezüglich Spektrometern | |
| DE3317090A1 (de) | Fokusdetektor | |
| DE3887008T2 (de) | Spannungsdetektor. | |
| DE2825501A1 (de) | Justiervorrichtung | |
| DE69421877T2 (de) | Lasersonde für Geschwindigkeits- und Neigungsmessung | |
| DE60307934T2 (de) | Pilotton Multiplexierung der Polarisationszustände in der Heterodynanalyse eines optischen Elements | |
| DE2916202A1 (de) | Verfahren zur analyse des polarisationszustandes einer strahlung und vorrichtung zur durchfuehrung des verfahrens | |
| DE4035039C2 (de) | Verfahren und Einrichtung zur Erfassung der Bewegung strukturierter Objekte | |
| DE2061381A1 (de) | Interferometer | |
| DE1815445A1 (de) | Lenksystem | |
| DE19547553C1 (de) | Vorrichtung zur Bestimmung des Polarisationszustandes elektromagnetischer Strahlung | |
| DE2160282A1 (de) | Automatische Einstellanordnung | |
| DE19716058B4 (de) | Optische Positionsmeßeinrichtung | |
| DE3322713A1 (de) | Verfahren und vorrichtung zur laufenden messung des rollwinkels eines beweglichen maschinenteiles | |
| DE3878106T2 (de) | Vielkanalspannungsdetektor. | |
| DE2115886B2 (de) | Elektrooptische modulationsvorrichtung |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8181 | Inventor (new situation) |
Free format text: SCHEDEWIE, FRANZ, DIPL.-PHYS. DR., 7030 BOEBLINGEN, DE |
|
| D2 | Grant after examination | ||
| 8339 | Ceased/non-payment of the annual fee |