DE2030707A1 - - Google Patents

Info

Publication number
DE2030707A1
DE2030707A1 DE19702030707 DE2030707A DE2030707A1 DE 2030707 A1 DE2030707 A1 DE 2030707A1 DE 19702030707 DE19702030707 DE 19702030707 DE 2030707 A DE2030707 A DE 2030707A DE 2030707 A1 DE2030707 A1 DE 2030707A1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19702030707
Other languages
German (de)
Other versions
DE2030707B2 (de
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to DE19702030707 priority Critical patent/DE2030707B2/de
Publication of DE2030707B2 publication Critical patent/DE2030707B2/de
Publication of DE2030707A1 publication Critical patent/DE2030707A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DE19702030707 1970-06-22 1970-06-22 Kontaktierungseinrichtung fuer die loesbare elektrische kontaktierung mit den kontaktstellen einer schaltungsanordnung Withdrawn DE2030707B2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19702030707 DE2030707B2 (de) 1970-06-22 1970-06-22 Kontaktierungseinrichtung fuer die loesbare elektrische kontaktierung mit den kontaktstellen einer schaltungsanordnung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19702030707 DE2030707B2 (de) 1970-06-22 1970-06-22 Kontaktierungseinrichtung fuer die loesbare elektrische kontaktierung mit den kontaktstellen einer schaltungsanordnung

Publications (2)

Publication Number Publication Date
DE2030707B2 DE2030707B2 (de) 1971-11-25
DE2030707A1 true DE2030707A1 (enExample) 1971-11-25

Family

ID=5774603

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19702030707 Withdrawn DE2030707B2 (de) 1970-06-22 1970-06-22 Kontaktierungseinrichtung fuer die loesbare elektrische kontaktierung mit den kontaktstellen einer schaltungsanordnung

Country Status (1)

Country Link
DE (1) DE2030707B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3115787A1 (de) * 1981-03-06 1982-11-04 Feinmetall Gmbh, 7033 Herrenberg Kontaktvorrichtung
JPS59188550A (ja) * 1983-04-12 1984-10-25 Fuji Photo Film Co Ltd イオン活量測定装置用電気接続端子アセンブリ−
DE3430591A1 (de) * 1984-08-20 1986-02-27 Precitronic Gesellschaft für Feinmechanik und Electronic mbH, 2000 Hamburg Kontaktgabeeinrichtung zwischen einem geraet und einem verbrauchsartikel
DE8806162U1 (de) * 1988-05-09 1989-09-07 Nixdorf Computer Ag, 4790 Paderborn Kontaktstift für die Funktionsprüfung von Leiterplatten
DE3920850A1 (de) * 1989-06-24 1991-01-10 Feinmetall Gmbh Federkontaktstift

Also Published As

Publication number Publication date
DE2030707B2 (de) 1971-11-25

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Legal Events

Date Code Title Description
E77 Valid patent as to the heymanns-index 1977
EHJ Ceased/non-payment of the annual fee