DE19782260T1 - Leckstrom-Korrekturschaltung - Google Patents

Leckstrom-Korrekturschaltung

Info

Publication number
DE19782260T1
DE19782260T1 DE19782260T DE19782260T DE19782260T1 DE 19782260 T1 DE19782260 T1 DE 19782260T1 DE 19782260 T DE19782260 T DE 19782260T DE 19782260 T DE19782260 T DE 19782260T DE 19782260 T1 DE19782260 T1 DE 19782260T1
Authority
DE
Germany
Prior art keywords
leakage current
correction circuit
current correction
circuit
leakage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19782260T
Other languages
English (en)
Inventor
Hiroyuki Shiotsuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE19782260T1 publication Critical patent/DE19782260T1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is dc
    • G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/26—Current mirrors
    • G05F3/265—Current mirrors using bipolar transistors only

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE19782260T 1997-12-25 1997-12-25 Leckstrom-Korrekturschaltung Withdrawn DE19782260T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1997/004817 WO1999034226A1 (fr) 1997-12-25 1997-12-25 Circuit de correction des courants de fuite

Publications (1)

Publication Number Publication Date
DE19782260T1 true DE19782260T1 (de) 2000-02-10

Family

ID=14181748

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19782260T Withdrawn DE19782260T1 (de) 1997-12-25 1997-12-25 Leckstrom-Korrekturschaltung

Country Status (5)

Country Link
US (1) US6242966B1 (de)
JP (1) JP4290768B2 (de)
KR (1) KR100375580B1 (de)
DE (1) DE19782260T1 (de)
WO (1) WO1999034226A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7313588B1 (en) * 2000-07-13 2007-12-25 Biap Systems, Inc. Locally executing software agent for retrieving remote content and method for creation and use of the agent
US6556408B1 (en) * 2000-07-31 2003-04-29 Texas Instruments Incorporated Compensation circuit for leakage through electrostatic discharge protection devices
JP3737397B2 (ja) * 2001-07-16 2006-01-18 富士通株式会社 半導体集積回路
US7323898B2 (en) 2005-07-18 2008-01-29 Teradyne, Inc. Pin electronics driver
JP2008070307A (ja) * 2006-09-15 2008-03-27 Agilent Technol Inc 容量測定装置および容量測定方法
KR100990144B1 (ko) 2007-03-05 2010-10-29 주식회사 하이닉스반도체 반도체 소자 및 그의 동작방법
US20090063085A1 (en) * 2007-09-05 2009-03-05 Teradyne,Inc. Pmu testing via a pe stage
WO2018112452A1 (en) * 2016-12-16 2018-06-21 Abb Schweiz Ag Compensation for ground return differences

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5418751A (en) * 1993-09-29 1995-05-23 Texas Instruments Incorporated Variable frequency oscillator controlled EEPROM charge pump
JPH08222966A (ja) * 1995-02-14 1996-08-30 Nec Corp サンプル・ホールド回路
JP3225791B2 (ja) * 1995-06-14 2001-11-05 株式会社豊田中央研究所 リーク電流補償回路
JPH0955469A (ja) * 1995-08-10 1997-02-25 Toyota Central Res & Dev Lab Inc リーク電流補償回路
JP3249396B2 (ja) * 1996-07-04 2002-01-21 東芝マイクロエレクトロニクス株式会社 ダイナミック回路

Also Published As

Publication number Publication date
KR20000075605A (ko) 2000-12-26
WO1999034226A1 (fr) 1999-07-08
US6242966B1 (en) 2001-06-05
KR100375580B1 (ko) 2003-03-10
JP4290768B2 (ja) 2009-07-08

Similar Documents

Publication Publication Date Title
DE69736260D1 (de) Leistungsfaktorkorrekturschaltung
DE69738726D1 (de) Spannungserzeugungsschaltung
DE69816023D1 (de) Schaltungsanordnung
DE69737876D1 (de) Fotosensorschaltung
DE69512001D1 (de) Spannungsreferenzschaltung
DE69703188T2 (de) Verzerrungskorrektionsschaltung
NO994637L (no) Digital krets
DE59900215D1 (de) Referenzspannung-Erzeugungsschaltung
DE59813694D1 (de) Spannungsregelschaltung
DE69839322D1 (de) Schnittstellenschaltung
DE1100202T1 (de) Entschachtelungsschaltung
DE69816950D1 (de) Schaltungsanordnung
DE69822118D1 (de) Offset-korrekturschaltung für kodiervorrichtung
DE69733566D1 (de) Strombegrenzungsschaltung
DE69829823D1 (de) Nichtreziproke Schaltungsanordnung
DE69831992D1 (de) Offsetkorrekturschaltung
DE69903026D1 (de) Leistungsfaktorkorrekturanordnung
DE69930063D1 (de) Video-Konturkorrekturschaltung
DE69912101D1 (de) Schaltungsanordnung
DE19782260T1 (de) Leckstrom-Korrekturschaltung
DE69828146D1 (de) Schaltungsanordnung
DE59913873D1 (de) Fuselatch-Schaltung
DE69709879T2 (de) Verzögerungskorrekturschaltung
DE59914352D1 (de) Referenzspannungsschaltung
DE59808593D1 (de) Stromversorgungsschaltung

Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
8607 Notification of search results after publication
8139 Disposal/non-payment of the annual fee