DE197385C - - Google Patents

Info

Publication number
DE197385C
DE197385C DE1906197385D DE197385DD DE197385C DE 197385 C DE197385 C DE 197385C DE 1906197385 D DE1906197385 D DE 1906197385D DE 197385D D DE197385D D DE 197385DD DE 197385 C DE197385 C DE 197385C
Authority
DE
Germany
Prior art keywords
selenium
cell
cells
alternating current
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE1906197385D
Other languages
German (de)
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Application granted granted Critical
Publication of DE197385C publication Critical patent/DE197385C/de
Expired legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/10Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/34Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
    • G01J1/36Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE1906197385D 1906-10-19 1906-10-19 Expired DE197385C (OSRAM)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE197385T 1906-10-19

Publications (1)

Publication Number Publication Date
DE197385C true DE197385C (OSRAM) 1908-04-13

Family

ID=34624851

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1906197385D Expired DE197385C (OSRAM) 1906-10-19 1906-10-19

Country Status (1)

Country Link
DE (1) DE197385C (OSRAM)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1128175B (de) * 1959-09-29 1962-04-19 Eltro G M B H & Co Ges Fuer St Verfahren zur blendenlosen Modulation bei Strahlungsempfangsvorrichtungen
DE1266539B (de) * 1958-12-15 1968-04-18 Saint Gobain Vergleichsstrahlungspyrometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1266539B (de) * 1958-12-15 1968-04-18 Saint Gobain Vergleichsstrahlungspyrometer
DE1128175B (de) * 1959-09-29 1962-04-19 Eltro G M B H & Co Ges Fuer St Verfahren zur blendenlosen Modulation bei Strahlungsempfangsvorrichtungen

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