DE19648420C2 - Grid counter - Google Patents

Grid counter

Info

Publication number
DE19648420C2
DE19648420C2 DE1996148420 DE19648420A DE19648420C2 DE 19648420 C2 DE19648420 C2 DE 19648420C2 DE 1996148420 DE1996148420 DE 1996148420 DE 19648420 A DE19648420 A DE 19648420A DE 19648420 C2 DE19648420 C2 DE 19648420C2
Authority
DE
Germany
Prior art keywords
raster
grid
counter
screen
lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE1996148420
Other languages
German (de)
Other versions
DE19648420A1 (en
Inventor
Hans-Thomas Schmidt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SCHMIDT HANS THOMAS
Original Assignee
SCHMIDT HANS THOMAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SCHMIDT HANS THOMAS filed Critical SCHMIDT HANS THOMAS
Priority to DE1996148420 priority Critical patent/DE19648420C2/en
Publication of DE19648420A1 publication Critical patent/DE19648420A1/en
Application granted granted Critical
Publication of DE19648420C2 publication Critical patent/DE19648420C2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F5/00—Screening processes; Screens therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Instruments Using Mechanical Means (AREA)
  • Printing Methods (AREA)

Description

Die Erfindung betrifft einen Rasterzähler gemäß dem Ober­ begriff des Anspruchs 1.The invention relates to a Raster counter according to the upper Concept of claim 1.

In der grafischen Industrie werden bisher zwei ver­ schiedene Arten von Rasterzählern verwendet, um die Rasterweite (Rasterfeinheit) von autotypischen, ampli­ tudenmodulierten Druckrastern zu bestimmen.So far, two are used in the graphic arts industry different types of grid counters used to make the Screen ruling (screen fineness) of autotypical, ampli to determine student-modulated pressure grids.

Die US-PS 2559915 zeigt einen Rasterzähler zur Bestimmung der Rasterweite von autotypischen Druckrastern der grafischen In­ dustrie mit Hilfe von am Ende enger zulaufenden, geraden Linien, die mit dem Raster ein Moirè er­ zeugen (ähnlich: Siemensstern), welches die Raster­ weite an einer Skala anzeigt. Nachteilig ist, daß zu hohen Rasterweiten hin die Ablesegenauigkeit im­ mer ungenauer wird.The US-PS 2559915 shows one Grid counter for determining the grid width of autotypical printing grids of the graphic In industry with the help of straight lines that are moiréed with the grid witness (similar: Siemens star), which the grid wide on a scale. The disadvantage is that too high screen rulings the reading accuracy in becomes less precise.

Für die Qualitätskontrolle ist es immer wieder erforder­ lich, gerasterte Reprofilme und Drucke auf verwendete Rasterweiten und -winklungen zu untersuchen. Für die Entrasterung (Descreening) gedruckter Bildvorlagen ist immer eine Messung der genauen Rasterweite erforder­ lich, die mit den bisherigen Rasterzählern schlecht mög­ lich ist. Dabei sollen die verwendeten Druckfarben zu unterscheiden sein, da in Farbdrucken oft mit verschie­ denen Rasterweiten gleichzeitig gearbeitet wird. Wün­ schenswert wäre auch noch eine Anzeige der Raster­ winklung, die in der Lage ist, quadratische von ellipti­ sche Punktformen zu unterscheiden.It is always necessary for quality control Lich, rasterized reprofilms and prints on used To examine screen rulings and angles. For the Descreening of printed artwork is always requires a measurement of the exact grid width Lich, which is not possible with the previous grid counters is. The printing inks used should be too be different, because in color prints often with different which screen widths are being worked on simultaneously. Wu A display of the grid would also be worthwhile angulation that is able to square from ellipti distinguish between point shapes.

Nach vielen Versuchen gelang es schrittweise, das Prin­ zip der Rasterweitenbestimmung durch Moirèerzeugung so weit zu entwickeln, daß alle Forderungen erfüllt wur­ den. Prototypen wurden auf einem PC in einem Grafik­ programm (Micrografix Designer) gezeichnet und mit einem hochauflösenden Belichter auf Film ausgegeben. Dabei ist eine Genauigkeit von 5 µm wünschenswert.After many attempts, the Prin zip of the raster width determination through moiré generation to develop so far that all requirements were met the. Prototypes were made on a PC in a graphic program (Micrografix Designer) drawn and with a high-resolution imagesetter on film. An accuracy of 5 µm is desirable.

Die Fig. 1 zeigt den Raster­ zähler. Fig. 1 shows the grid counter.

Fig. 2 zeigt den Moiréeffekt, der die Ablesung an der Skala ermöglicht. Fig. 2 shows the moiré effect, which enables the reading on the scale.

Der Rasterzähler besteht aus vielen Linien, die sich zum rechten Ende immer mehr annähern. Das Meßfeld ist exakt 2 cm hoch; oben ist eine lineare Skala in Linien pro Zentimeter, unten eine lineare Skala in Lines per Inch angebracht, die der Umrechnung der oberen Skala entspricht. Betrachtet man den Rasterzähler von links nach rechts, kommen bei jedem Teilstrich der oberen Skala oben und unten noch jeweils eine Linie dazu. So sind unter den entsprechenden Teilstrichen auch genau so viele Linien je Längeneinheit vorhanden. Zwangsläu­ fig ergibt sich daraus eine gebogene Linienform. Damit der Moiréeffekt in allen Rasterweiten gleich gut zu er­ kennen ist, bleibt die Flächendeckung des Meßfeldes konstant.The grid counter consists of many lines that go to approach the right end more and more. The measuring field is exactly 2 cm high; above is a linear scale in lines per centimeter, below a linear scale in Lines per Inch attached to the conversion of the upper scale corresponds. Looking at the grid counter from the left to the right, come with each tick mark of the top Add a line to the scale above and below. So are also accurate under the corresponding tick marks so many lines per unit length. Inevitable fig results in a curved line shape. In order to the moiré effect is equally good in all screen widths is known, the area coverage of the measuring field remains constant.

Claims (2)

1. Rasterzähler zur Bestimmung der Rasterweite von autotypischen Druckrastern der grafischen Indu­ strie mit Hilfe von am Ende enger zulaufenden Linien, die mit dem Raster ein Moirè er­ zeugen, welches die Rasterweite an Skalen an­ zeigt, dadurch gekennzeichnet, daß die Linien des Rasterzählers gekrümmt verlaufen und dadurch lineare Skalen der Rasterfeinheit erhalten werden, wodurch sich auch in höheren Rasterweiten eine verbesserte Auflösegenauigkeit ergibt.1. raster counter for determining the raster width of autotypical printing rasters of the graphical industry with the help of tapering lines at the end that generate a moiré with the raster, which indicates the raster width on scales, characterized in that the lines of the raster counter are curved and thereby linear scales of the screen fineness are obtained, which results in an improved resolution accuracy even in higher screen widths. 2. Rasterzahler nach Anspruch 1, dadurch gekennzeichnet, daß das Meßfeld 2 cm hoch ist.2. Raster counter according to claim 1, characterized characterized that the Measuring field is 2 cm high.
DE1996148420 1996-11-22 1996-11-22 Grid counter Expired - Fee Related DE19648420C2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE1996148420 DE19648420C2 (en) 1996-11-22 1996-11-22 Grid counter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE1996148420 DE19648420C2 (en) 1996-11-22 1996-11-22 Grid counter

Publications (2)

Publication Number Publication Date
DE19648420A1 DE19648420A1 (en) 1997-05-15
DE19648420C2 true DE19648420C2 (en) 1999-10-21

Family

ID=7812483

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1996148420 Expired - Fee Related DE19648420C2 (en) 1996-11-22 1996-11-22 Grid counter

Country Status (1)

Country Link
DE (1) DE19648420C2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2559915A (en) * 1949-12-28 1951-07-10 Gaebel Arthur Henry Half-tone screen determiner

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2559915A (en) * 1949-12-28 1951-07-10 Gaebel Arthur Henry Half-tone screen determiner

Also Published As

Publication number Publication date
DE19648420A1 (en) 1997-05-15

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Legal Events

Date Code Title Description
OAV Applicant agreed to the publication of the unexamined application as to paragraph 31 lit. 2 z1
ON Later submitted papers
OP8 Request for examination as to paragraph 44 patent law
8122 Nonbinding interest in granting licenses declared
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee