DE1622867B1 - R¦ntgenstrahlgoniometer - Google Patents
R¦ntgenstrahlgoniometerInfo
- Publication number
- DE1622867B1 DE1622867B1 DE1968A0058432 DEA0058432A DE1622867B1 DE 1622867 B1 DE1622867 B1 DE 1622867B1 DE 1968A0058432 DE1968A0058432 DE 1968A0058432 DE A0058432 A DEA0058432 A DE A0058432A DE 1622867 B1 DE1622867 B1 DE 1622867B1
- Authority
- DE
- Germany
- Prior art keywords
- crystal
- pulses
- circuit
- holder
- suppression circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 claims description 28
- 230000005855 radiation Effects 0.000 claims description 9
- 230000001629 suppression Effects 0.000 claims description 9
- 238000011156 evaluation Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000005147 X-ray Weissenberg Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 150000001768 cations Chemical group 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 210000000003 hoof Anatomy 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/205—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials using diffraction cameras
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE03470/67A SE327573B (enExample) | 1967-03-13 | 1967-03-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE1622867B1 true DE1622867B1 (de) | 1971-01-14 |
Family
ID=20262192
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE1968A0058432 Pending DE1622867B1 (de) | 1967-03-13 | 1968-03-13 | R¦ntgenstrahlgoniometer |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3466438A (enExample) |
| DE (1) | DE1622867B1 (enExample) |
| FR (1) | FR1601087A (enExample) |
| GB (1) | GB1207426A (enExample) |
| SE (1) | SE327573B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3714426A (en) * | 1970-08-18 | 1973-01-30 | Stoe & Cie Gmbh | Method of x-ray analysis of crystal structure an x-ray goniometer for carrying out said method |
| AT346629B (de) * | 1972-01-28 | 1978-11-27 | Efanov Valery P | Verfahren zur roentgendiffraktionstopographier- ung von einkristallen und einrichtung zur durchfuehrung desselben |
| DE2534790C2 (de) * | 1975-08-04 | 1986-08-21 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen | Röntgengoniometer zum wahlweisen Durchführen von Buerger-Präzessionsaufnahmen und Drehkristallaufnahmen |
| NL7609658A (nl) * | 1976-08-31 | 1978-03-02 | Enraf Nonius | Instrument voor roentgen-diffractie-onderzoek. |
| JP3027361B2 (ja) * | 1998-07-17 | 2000-04-04 | 科学技術振興事業団 | イメージングプレートｘ線回折装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3340396A (en) * | 1964-10-26 | 1967-09-05 | Robert L Prickett | Universal x-ray crystallography camera with specific means for movably supporting a specimen in the x-ray beam path |
-
1967
- 1967-03-13 SE SE03470/67A patent/SE327573B/xx unknown
-
1968
- 1968-03-11 US US711984A patent/US3466438A/en not_active Expired - Lifetime
- 1968-03-12 GB GB01995/68A patent/GB1207426A/en not_active Expired
- 1968-03-13 DE DE1968A0058432 patent/DE1622867B1/de active Pending
- 1968-03-13 FR FR1601087D patent/FR1601087A/fr not_active Expired
Non-Patent Citations (1)
| Title |
|---|
| None * |
Also Published As
| Publication number | Publication date |
|---|---|
| SE327573B (enExample) | 1970-08-24 |
| US3466438A (en) | 1969-09-09 |
| FR1601087A (enExample) | 1970-08-10 |
| GB1207426A (en) | 1970-09-30 |
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