DE1598413A1 - Vorrichtung zur Anfertigung verzerrungsfreier Roentgenbeugungsbilder - Google Patents

Vorrichtung zur Anfertigung verzerrungsfreier Roentgenbeugungsbilder

Info

Publication number
DE1598413A1
DE1598413A1 DE19661598413 DE1598413A DE1598413A1 DE 1598413 A1 DE1598413 A1 DE 1598413A1 DE 19661598413 DE19661598413 DE 19661598413 DE 1598413 A DE1598413 A DE 1598413A DE 1598413 A1 DE1598413 A1 DE 1598413A1
Authority
DE
Germany
Prior art keywords
sample
puncture
drive
movement
disc
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE19661598413
Other languages
German (de)
English (en)
Inventor
Menzel Thomas C
Wilchinsky Zigmond W
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ExxonMobil Technology and Engineering Co
Original Assignee
Exxon Research and Engineering Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Exxon Research and Engineering Co filed Critical Exxon Research and Engineering Co
Publication of DE1598413A1 publication Critical patent/DE1598413A1/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE19661598413 1966-01-20 1966-12-01 Vorrichtung zur Anfertigung verzerrungsfreier Roentgenbeugungsbilder Pending DE1598413A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US52192666A 1966-01-20 1966-01-20

Publications (1)

Publication Number Publication Date
DE1598413A1 true DE1598413A1 (de) 1970-04-23

Family

ID=24078704

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19661598413 Pending DE1598413A1 (de) 1966-01-20 1966-12-01 Vorrichtung zur Anfertigung verzerrungsfreier Roentgenbeugungsbilder

Country Status (4)

Country Link
BE (1) BE692931A (no)
DE (1) DE1598413A1 (no)
FR (1) FR1503449A (no)
NL (1) NL6700870A (no)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0153989A2 (de) * 1983-09-13 1985-09-11 Nicolet Instrument Corporation Probenhalter für Pulverdiffraktometer
US4678340A (en) * 1984-09-27 1987-07-07 Nicolet Instrument Corporation Sample holder for powder x-ray diffractometer
EP1327877A1 (en) * 2002-01-15 2003-07-16 Avantium International B.V. Method for successively performing powder diffraction analysis on a plurality of samples
WO2003060497A1 (en) * 2002-01-15 2003-07-24 Avantium International B.V. Method for performing powder diffraction analysis
US7583788B2 (en) 2004-07-14 2009-09-01 South West Technology & Engineering Institute Of China Measuring device for the shortwavelength x ray diffraction and a method thereof

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0153989A2 (de) * 1983-09-13 1985-09-11 Nicolet Instrument Corporation Probenhalter für Pulverdiffraktometer
EP0153989A3 (en) * 1983-09-13 1986-02-05 Nicolet Instrument Corporation Sample holder for a powder diffractometer
US4678340A (en) * 1984-09-27 1987-07-07 Nicolet Instrument Corporation Sample holder for powder x-ray diffractometer
EP1327877A1 (en) * 2002-01-15 2003-07-16 Avantium International B.V. Method for successively performing powder diffraction analysis on a plurality of samples
WO2003060497A1 (en) * 2002-01-15 2003-07-24 Avantium International B.V. Method for performing powder diffraction analysis
US7702071B2 (en) 2002-01-15 2010-04-20 Avantium International B.V. Method for performing power diffraction analysis
US7583788B2 (en) 2004-07-14 2009-09-01 South West Technology & Engineering Institute Of China Measuring device for the shortwavelength x ray diffraction and a method thereof

Also Published As

Publication number Publication date
BE692931A (no) 1967-07-20
FR1503449A (fr) 1967-11-24
NL6700870A (no) 1967-07-21

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