DE1598413A1 - Vorrichtung zur Anfertigung verzerrungsfreier Roentgenbeugungsbilder - Google Patents
Vorrichtung zur Anfertigung verzerrungsfreier RoentgenbeugungsbilderInfo
- Publication number
- DE1598413A1 DE1598413A1 DE19661598413 DE1598413A DE1598413A1 DE 1598413 A1 DE1598413 A1 DE 1598413A1 DE 19661598413 DE19661598413 DE 19661598413 DE 1598413 A DE1598413 A DE 1598413A DE 1598413 A1 DE1598413 A1 DE 1598413A1
- Authority
- DE
- Germany
- Prior art keywords
- sample
- puncture
- drive
- movement
- disc
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000002441 X-ray diffraction Methods 0.000 title claims description 6
- 230000033001 locomotion Effects 0.000 claims description 43
- 238000010586 diagram Methods 0.000 claims description 8
- 230000001360 synchronised effect Effects 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims 9
- 230000003287 optical effect Effects 0.000 claims 2
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000002601 radiography Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 15
- 239000013078 crystal Substances 0.000 description 11
- 239000000463 material Substances 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000012935 Averaging Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- -1 polypropylene Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 230000009365 direct transmission Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US52192666A | 1966-01-20 | 1966-01-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE1598413A1 true DE1598413A1 (de) | 1970-04-23 |
Family
ID=24078704
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19661598413 Pending DE1598413A1 (de) | 1966-01-20 | 1966-12-01 | Vorrichtung zur Anfertigung verzerrungsfreier Roentgenbeugungsbilder |
Country Status (4)
| Country | Link |
|---|---|
| BE (1) | BE692931A (en(2012)) |
| DE (1) | DE1598413A1 (en(2012)) |
| FR (1) | FR1503449A (en(2012)) |
| NL (1) | NL6700870A (en(2012)) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0153989A3 (en) * | 1983-09-13 | 1986-02-05 | Nicolet Instrument Corporation | Sample holder for a powder diffractometer |
| US4678340A (en) * | 1984-09-27 | 1987-07-07 | Nicolet Instrument Corporation | Sample holder for powder x-ray diffractometer |
| EP1327877A1 (en) * | 2002-01-15 | 2003-07-16 | Avantium International B.V. | Method for successively performing powder diffraction analysis on a plurality of samples |
| WO2003060497A1 (en) * | 2002-01-15 | 2003-07-24 | Avantium International B.V. | Method for performing powder diffraction analysis |
| US7583788B2 (en) | 2004-07-14 | 2009-09-01 | South West Technology & Engineering Institute Of China | Measuring device for the shortwavelength x ray diffraction and a method thereof |
-
1966
- 1966-12-01 DE DE19661598413 patent/DE1598413A1/de active Pending
- 1966-12-08 FR FR86723A patent/FR1503449A/fr not_active Expired
-
1967
- 1967-01-19 NL NL6700870A patent/NL6700870A/xx unknown
- 1967-01-20 BE BE692931D patent/BE692931A/xx unknown
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0153989A3 (en) * | 1983-09-13 | 1986-02-05 | Nicolet Instrument Corporation | Sample holder for a powder diffractometer |
| US4678340A (en) * | 1984-09-27 | 1987-07-07 | Nicolet Instrument Corporation | Sample holder for powder x-ray diffractometer |
| EP1327877A1 (en) * | 2002-01-15 | 2003-07-16 | Avantium International B.V. | Method for successively performing powder diffraction analysis on a plurality of samples |
| WO2003060497A1 (en) * | 2002-01-15 | 2003-07-24 | Avantium International B.V. | Method for performing powder diffraction analysis |
| US7702071B2 (en) | 2002-01-15 | 2010-04-20 | Avantium International B.V. | Method for performing power diffraction analysis |
| US7583788B2 (en) | 2004-07-14 | 2009-09-01 | South West Technology & Engineering Institute Of China | Measuring device for the shortwavelength x ray diffraction and a method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| FR1503449A (fr) | 1967-11-24 |
| NL6700870A (en(2012)) | 1967-07-21 |
| BE692931A (en(2012)) | 1967-07-20 |
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