DE112009000078A5 - Verfahren und Vorrichtung zur Auswertung einer interferometrischen Messgröße - Google Patents
Verfahren und Vorrichtung zur Auswertung einer interferometrischen Messgröße Download PDFInfo
- Publication number
- DE112009000078A5 DE112009000078A5 DE112009000078T DE112009000078T DE112009000078A5 DE 112009000078 A5 DE112009000078 A5 DE 112009000078A5 DE 112009000078 T DE112009000078 T DE 112009000078T DE 112009000078 T DE112009000078 T DE 112009000078T DE 112009000078 A5 DE112009000078 A5 DE 112009000078A5
- Authority
- DE
- Germany
- Prior art keywords
- evaluating
- measured variable
- interferometric measured
- interferometric
- variable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/32—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in transmittance, scattering or luminescence in optical fibres
- G01K11/3206—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in transmittance, scattering or luminescence in optical fibres at discrete locations in the fibre, e.g. using Bragg scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02044—Imaging in the frequency domain, e.g. by using a spectrometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
- G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms
- G01L9/0076—Transmitting or indicating the displacement of flexible diaphragms using photoelectric means
- G01L9/0077—Transmitting or indicating the displacement of flexible diaphragms using photoelectric means for measuring reflected light
- G01L9/0079—Transmitting or indicating the displacement of flexible diaphragms using photoelectric means for measuring reflected light with Fabry-Perot arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/25—Fabry-Perot in interferometer, e.g. etalon, cavity
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Measuring Fluid Pressure (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH2942008 | 2008-02-28 | ||
CH294/08 | 2008-02-28 | ||
PCT/CH2009/000044 WO2009105904A1 (de) | 2008-02-28 | 2009-02-05 | Verfahren und vorrichtung zur auswertung einer interferometrischen messgrösse |
Publications (1)
Publication Number | Publication Date |
---|---|
DE112009000078A5 true DE112009000078A5 (de) | 2010-12-30 |
Family
ID=39381937
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE112009000078T Withdrawn DE112009000078A5 (de) | 2008-02-28 | 2009-02-05 | Verfahren und Vorrichtung zur Auswertung einer interferometrischen Messgröße |
Country Status (6)
Country | Link |
---|---|
US (1) | US7728984B2 (de) |
JP (1) | JP5222961B2 (de) |
CA (1) | CA2713914A1 (de) |
DE (1) | DE112009000078A5 (de) |
TW (1) | TWI452271B (de) |
WO (1) | WO2009105904A1 (de) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102009027592A1 (de) * | 2009-07-09 | 2011-05-12 | Endress + Hauser Gmbh + Co. Kg | Drucksensor mit interferometrischem Wandler und Druckmessgerät mit einem solchen Drucksensor |
US8711361B2 (en) * | 2009-11-05 | 2014-04-29 | Qualcomm, Incorporated | Methods and devices for detecting and measuring environmental conditions in high performance device packages |
US8390916B2 (en) * | 2010-06-29 | 2013-03-05 | Qualcomm Mems Technologies, Inc. | System and method for false-color sensing and display |
JP5654837B2 (ja) * | 2010-10-22 | 2015-01-14 | 株式会社ミツトヨ | 変位測定装置 |
BR112013017113A2 (pt) * | 2011-01-03 | 2020-10-27 | Fundació Institut De Recerca De L'energía De Catalunya | dispositivo optoeletrônico, sistema e processo para modificar a luz ambiental de uma área, produto de programa de programa de computador, dispositivo reflexivo e processo para determinar a calibração de um dispositivo optoeletrônico |
US9046417B2 (en) * | 2011-06-24 | 2015-06-02 | Tokyo Electron Limited | Temperature measuring system, substrate processing apparatus and temperature measuring method |
JP5805498B2 (ja) * | 2011-06-24 | 2015-11-04 | 東京エレクトロン株式会社 | 温度計測システム、基板処理装置及び温度計測方法 |
JP2013007665A (ja) * | 2011-06-24 | 2013-01-10 | Tokyo Electron Ltd | 温度計測装置、基板処理装置及び温度計測方法 |
GB2500255B (en) | 2012-03-16 | 2020-04-15 | Oxsensis Ltd | Optical sensor |
GB2509105B (en) * | 2012-12-20 | 2017-02-22 | Oxsensis Ltd | Mechanical resonator sensor |
US10078050B2 (en) | 2013-01-28 | 2018-09-18 | Woods Hole Oceanographic Institution | Submersible N-wavelength interrogation system and method for multiple wavelength interferometers |
AU2014209027B2 (en) * | 2013-01-28 | 2017-10-05 | Woods Hole Oceanographic Institution | N-wavelength interrogation system and method for multiple wavelength interferometers |
FI124888B (fi) * | 2013-06-04 | 2015-03-13 | Ponsse Oyj | Menetelmä ja järjestely punnitusjärjestelmässä sekä vastaava ohjelmistotuote ja materiaalinkäsittelykone |
WO2016067268A1 (en) * | 2014-10-30 | 2016-05-06 | Swat Arkadiusz | Method, system and subsystem for interferometrically determining radius of curvature |
US10527502B2 (en) * | 2015-05-21 | 2020-01-07 | University Of Limerick | Temperature sensor |
NL2017595A (en) * | 2015-11-10 | 2017-05-26 | Asml Netherlands Bv | Proximity sensor, lithographic apparatus and device manufacturing method |
CN107192449B (zh) * | 2017-04-25 | 2019-04-19 | 哈尔滨工程大学 | 基于法布里珀罗腔干涉测量脉冲激光能量传感器及脉冲光能量测量方法 |
CN114424039B (zh) * | 2019-09-20 | 2024-09-20 | 英福康有限公司 | 确定压力的方法和压力传感器 |
CN112985477A (zh) * | 2019-11-29 | 2021-06-18 | 梅吉特股份有限公司 | 用于在恶劣环境中测量物理参数的光学传感器及其制造和使用方法 |
WO2021212271A1 (zh) * | 2020-04-20 | 2021-10-28 | 北京佰为深科技发展有限公司 | 法珀传感器腔长解调系统和法珀传感器腔长解调方法 |
US20230251122A1 (en) * | 2022-02-09 | 2023-08-10 | Simmonds Precision Products, Inc. | Optical fabry-perot based liquid level sensors |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI98094C (fi) | 1992-05-19 | 1997-04-10 | Vaisala Technologies Inc Oy | Fabry-Perot resonaattoriin perustuva optinen voima-anturi |
US6078706A (en) * | 1998-09-22 | 2000-06-20 | The United States Of America As Represented By The Secretary Of The Navy | Quasi-static fiber pressure sensor |
US7324214B2 (en) * | 2003-03-06 | 2008-01-29 | Zygo Corporation | Interferometer and method for measuring characteristics of optically unresolved surface features |
US7099015B2 (en) | 2003-08-25 | 2006-08-29 | Ivan Melnyk | Fiber optic sensing device for measuring a physical parameter |
US20050151975A1 (en) | 2004-01-14 | 2005-07-14 | Ivan Melnyk | Fabry-perot fiber optic sensing device and method |
GB0408073D0 (en) * | 2004-04-08 | 2004-05-12 | Council Cent Lab Res Councils | Optical sensor |
US7259862B2 (en) * | 2004-09-20 | 2007-08-21 | Opsens Inc. | Low-coherence interferometry optical sensor using a single wedge polarization readout interferometer |
JP5143736B2 (ja) | 2005-08-12 | 2013-02-13 | インフィコン ゲゼルシャフト ミット ベシュレンクテル ハフツング | 測定セルおよびその製造方法 |
US7564562B2 (en) * | 2007-02-23 | 2009-07-21 | Ziebel (US), Inc. | Method for demodulating signals from a dispersive white light interferometric sensor and its application to remote optical sensing |
-
2008
- 2008-03-24 US US12/053,951 patent/US7728984B2/en active Active
-
2009
- 2009-02-05 CA CA2713914A patent/CA2713914A1/en not_active Abandoned
- 2009-02-05 DE DE112009000078T patent/DE112009000078A5/de not_active Withdrawn
- 2009-02-05 JP JP2010547931A patent/JP5222961B2/ja not_active Expired - Fee Related
- 2009-02-05 WO PCT/CH2009/000044 patent/WO2009105904A1/de active Application Filing
- 2009-02-26 TW TW098106070A patent/TWI452271B/zh active
Also Published As
Publication number | Publication date |
---|---|
US7728984B2 (en) | 2010-06-01 |
US20090219542A1 (en) | 2009-09-03 |
JP5222961B2 (ja) | 2013-06-26 |
WO2009105904A1 (de) | 2009-09-03 |
CA2713914A1 (en) | 2009-09-03 |
JP2011515659A (ja) | 2011-05-19 |
TWI452271B (zh) | 2014-09-11 |
TW200938819A (en) | 2009-09-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R012 | Request for examination validly filed | ||
R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: G01L0009000000 Ipc: G01L0011020000 |
|
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |