DE112007000650A5 - Lichtsender, Lichtempfänger und Messeinrichtung zur Messung optischer Eigenschaften transparenter Substrate - Google Patents

Lichtsender, Lichtempfänger und Messeinrichtung zur Messung optischer Eigenschaften transparenter Substrate Download PDF

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Publication number
DE112007000650A5
DE112007000650A5 DE112007000650T DE112007000650T DE112007000650A5 DE 112007000650 A5 DE112007000650 A5 DE 112007000650A5 DE 112007000650 T DE112007000650 T DE 112007000650T DE 112007000650 T DE112007000650 T DE 112007000650T DE 112007000650 A5 DE112007000650 A5 DE 112007000650A5
Authority
DE
Germany
Prior art keywords
light
optical properties
transparent substrates
measuring
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE112007000650T
Other languages
English (en)
Other versions
DE112007000650B4 (de
Inventor
Jochen Dipl.-Ing. Krause
Holger Dr. Pröhl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Von Ardenne Asset GmbH and Co KG
Original Assignee
Von Ardenne Anlagentechnik GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Von Ardenne Anlagentechnik GmbH filed Critical Von Ardenne Anlagentechnik GmbH
Publication of DE112007000650A5 publication Critical patent/DE112007000650A5/de
Application granted granted Critical
Publication of DE112007000650B4 publication Critical patent/DE112007000650B4/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474Details of optical heads therefor, e.g. using optical fibres
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/08Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/10Arrangements of light sources specially adapted for spectrometry or colorimetry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255Details, e.g. use of specially adapted sources, lighting or optical systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0488Optical or mechanical part supplementary adjustable parts with spectral filtering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J2001/0481Preset integrating sphere or cavity

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE112007000650T 2006-10-30 2007-10-30 Lichtsender, Lichtempfänger und Messeinrichtung zur Messung optischer Eigenschaften transparenter Substrate Expired - Fee Related DE112007000650B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102006051717 2006-10-30
DE102006051717.2 2006-10-30
PCT/DE2007/001951 WO2008052526A1 (de) 2006-10-30 2007-10-30 Lichtsender, lichtempfänger und messeinrichtung zur messung optischer eigenschaften transparenter substrate

Publications (2)

Publication Number Publication Date
DE112007000650A5 true DE112007000650A5 (de) 2008-12-11
DE112007000650B4 DE112007000650B4 (de) 2012-04-12

Family

ID=39084544

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112007000650T Expired - Fee Related DE112007000650B4 (de) 2006-10-30 2007-10-30 Lichtsender, Lichtempfänger und Messeinrichtung zur Messung optischer Eigenschaften transparenter Substrate

Country Status (3)

Country Link
US (1) US8072607B2 (de)
DE (1) DE112007000650B4 (de)
WO (1) WO2008052526A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009040642B3 (de) 2009-09-09 2011-03-10 Von Ardenne Anlagentechnik Gmbh Verfahren und Vorrichtung zur Messung von optischen Kenngrößen transparenter, streuender Messobjekte
CN102539387A (zh) * 2011-12-28 2012-07-04 北京奥博泰科技有限公司 一种测量玻璃反射比的方法和装置
US20140368822A1 (en) * 2011-12-30 2014-12-18 Burbidge Pty Ltd Media absorbency determination
CN102829959B (zh) * 2012-08-16 2014-12-17 京东方科技集团股份有限公司 一种导光板透过率光谱的测试装置及方法
US9985156B2 (en) * 2013-11-01 2018-05-29 UNIVERSITé LAVAL Optical concentrator/diffuser using graded index waveguide
JP6588292B2 (ja) * 2015-09-29 2019-10-09 コーデンシ株式会社 検出装置
JP6603262B2 (ja) * 2017-04-28 2019-11-06 シャープ株式会社 画像形成装置および画像形成方法
US11347037B2 (en) 2017-10-02 2022-05-31 Methode Electronics, Inc. Luminous flux collector for directing light into a light-diffusing fiber
CN109959636B (zh) * 2017-12-22 2021-06-15 中国科学院上海硅酸盐研究所 一种新型表征透明块体材料现场透光性能的方法
CN112041076B (zh) * 2018-04-23 2023-04-18 迈恩医疗解决方案有限公司 用于从液体介质获得测量信号的自动分析器和光学测量方法
US20200158632A1 (en) * 2018-11-19 2020-05-21 Luminit Llc Test System for a Holographic Optical Element
JP6751214B1 (ja) * 2020-02-12 2020-09-02 デクセリアルズ株式会社 測定装置及び成膜装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4602160A (en) 1983-09-28 1986-07-22 Sentrol Systems Ltd. Infrared constituent analyzer and control system
US4601576A (en) * 1983-12-09 1986-07-22 Tencor Instruments Light collector for optical contaminant and flaw detector
US4660984A (en) * 1984-09-04 1987-04-28 Eastman Kodak Company Reflectometer featuring an integrated cavity of enhanced efficiency
US4655225A (en) * 1985-04-18 1987-04-07 Kurabo Industries Ltd. Spectrophotometric method and apparatus for the non-invasive
US4744615A (en) * 1986-01-29 1988-05-17 International Business Machines Corporation Laser beam homogenizer
DE9005845U1 (de) * 1990-05-23 1990-07-26 Fa. Carl Zeiss, 7920 Heidenheim Vorrichtung zur Messung der Absorption von transparenten Proben mit ungünstiger Außenform
US5184013A (en) * 1991-07-22 1993-02-02 Eastman Kodak Company Diffuse light collector which minimizes streak artifacts
DE19528855A1 (de) * 1995-08-05 1997-02-06 Leybold Ag Verfahren und Vorrichtung zur spektralen Remissions- und Transmissionsmessung
DE10018949A1 (de) * 1999-04-21 2001-01-11 Leuze Electronic Gmbh & Co Bildverarbeitungssystem
US20020018203A1 (en) * 2000-08-11 2002-02-14 Battle David R. Spectrophotometer system having active pixel array
US7177050B2 (en) * 2000-12-20 2007-02-13 Cintel International Limited System for reducing scratch visibility
DE102005010681B4 (de) * 2005-03-09 2016-05-04 Leybold Optics Gmbh Messanordnung zum optischen Monitoring von Beschichtungsprozessen

Also Published As

Publication number Publication date
US20110007320A1 (en) 2011-01-13
WO2008052526A1 (de) 2008-05-08
DE112007000650B4 (de) 2012-04-12
US8072607B2 (en) 2011-12-06

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R016 Response to examination communication
R016 Response to examination communication
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R020 Patent grant now final

Effective date: 20120713

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Representative=s name: PATENTANWAELTE LIPPERT, STACHOW & PARTNER, DE

R081 Change of applicant/patentee

Owner name: VON ARDENNE GMBH, DE

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Effective date: 20140707

Owner name: VON ARDENNE ASSET GMBH & CO. KG, DE

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Effective date: 20140707

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Effective date: 20140707

Representative=s name: LIPPERT STACHOW PATENTANWAELTE RECHTSANWAELTE , DE

Effective date: 20140707

R082 Change of representative
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Free format text: FORMER OWNER: VON ARDENNE GMBH, 01324 DRESDEN, DE

R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee