LT2074395T - Optinės charakteristikos atvaizdo formavimo prietaisas - Google Patents

Optinės charakteristikos atvaizdo formavimo prietaisas

Info

Publication number
LT2074395T
LT2074395T LTEP07789308.9T LT07789308T LT2074395T LT 2074395 T LT2074395 T LT 2074395T LT 07789308 T LT07789308 T LT 07789308T LT 2074395 T LT2074395 T LT 2074395T
Authority
LT
Lithuania
Prior art keywords
optical characteristic
mapping instrument
characteristic mapping
instrument
optical
Prior art date
Application number
LTEP07789308.9T
Other languages
English (en)
Inventor
Howard J. Baker
Jesus Fernando Monjardin-Lopez
Francisco Javier Villarreal-Saucedo
Roy Mcbride
Original Assignee
Powerphotonic Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Powerphotonic Ltd filed Critical Powerphotonic Ltd
Publication of LT2074395T publication Critical patent/LT2074395T/lt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
LTEP07789308.9T 2006-08-29 2007-08-24 Optinės charakteristikos atvaizdo formavimo prietaisas LT2074395T (lt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0616974.2A GB0616974D0 (en) 2006-08-29 2006-08-29 Optical characteristic mapping instrument
PCT/GB2007/003217 WO2008025958A2 (en) 2006-08-29 2007-08-24 Optical characteristic mapping instrument

Publications (1)

Publication Number Publication Date
LT2074395T true LT2074395T (lt) 2017-06-12

Family

ID=37102916

Family Applications (1)

Application Number Title Priority Date Filing Date
LTEP07789308.9T LT2074395T (lt) 2006-08-29 2007-08-24 Optinės charakteristikos atvaizdo formavimo prietaisas

Country Status (7)

Country Link
US (1) US8253087B2 (lt)
EP (1) EP2074395B1 (lt)
DK (1) DK2074395T3 (lt)
ES (1) ES2624809T3 (lt)
GB (1) GB0616974D0 (lt)
LT (1) LT2074395T (lt)
WO (1) WO2008025958A2 (lt)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1992905A1 (en) * 2007-05-16 2008-11-19 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Optical sensor with tilt error correction
TWI475874B (zh) * 2007-06-15 2015-03-01 Camtek Ltd 使用多面成像之光學檢查系統
NL2004942A (en) * 2009-07-30 2011-01-31 Asml Netherlands Bv Lithographic apparatus and monitoring method.
JP2012089419A (ja) * 2010-10-21 2012-05-10 Stanley Electric Co Ltd 光源装置および照明装置
US9689740B2 (en) * 2014-10-15 2017-06-27 The Boeing Company Diagnostic for spectrally combined laser
US20170086667A1 (en) * 2015-09-24 2017-03-30 Clarity Medical Systems, Inc. Apparatus and method for wavefront guided vision correction
DE102016201485B3 (de) 2016-02-01 2017-04-13 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Anordnung und Verfahren zur Wellenfrontanalyse
EP3336495B1 (en) * 2016-12-16 2024-02-14 F. Hoffmann-La Roche AG Characterizing the emission properties of samples

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4474467A (en) * 1981-12-28 1984-10-02 Itek Corporation Wavefront sensor using a surface acoustic wave diffraction grating
US4828384A (en) * 1987-12-03 1989-05-09 Westinghouse Electric Corp. High power laser beam intensity mapping apparatus
JPH01316617A (ja) * 1988-06-17 1989-12-21 Komatsu Ltd レーザ出力制御装置
US5521374A (en) * 1994-09-07 1996-05-28 Lumonics Corporation Focused laser beam measurement system and method of beam location
US6297488B1 (en) * 1999-04-29 2001-10-02 National Research Council Of Canada Position sensitive light spot detector
US6616279B1 (en) 2000-10-02 2003-09-09 Johnson & Johnson Vision Care, Inc. Method and apparatus for measuring wavefront aberrations
US6922233B2 (en) * 2002-02-08 2005-07-26 Nuonics, Inc. Digital optical beam profiler

Also Published As

Publication number Publication date
EP2074395B1 (en) 2017-03-22
GB0616974D0 (en) 2006-10-04
ES2624809T3 (es) 2017-07-17
DK2074395T3 (en) 2017-05-22
US8253087B2 (en) 2012-08-28
US20100012818A1 (en) 2010-01-21
EP2074395A2 (en) 2009-07-01
WO2008025958A2 (en) 2008-03-06
WO2008025958A3 (en) 2008-07-03

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