DE102017110976B8 - Selbstoszillierender Mehrrampen-Umsetzer und Verfahren zum Umsetzen einer Kapazität in ein digitales Signal - Google Patents

Selbstoszillierender Mehrrampen-Umsetzer und Verfahren zum Umsetzen einer Kapazität in ein digitales Signal Download PDF

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Publication number
DE102017110976B8
DE102017110976B8 DE102017110976.5A DE102017110976A DE102017110976B8 DE 102017110976 B8 DE102017110976 B8 DE 102017110976B8 DE 102017110976 A DE102017110976 A DE 102017110976A DE 102017110976 B8 DE102017110976 B8 DE 102017110976B8
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Germany
Prior art keywords
capacitance
converting
self
digital signal
oscillating multi
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DE102017110976.5A
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English (en)
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DE102017110976B3 (de
Inventor
Richard Gaggl
Enrique Prefasi
Christopher Rogi
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Infineon Technologies Austria AG
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Infineon Technologies Austria AG
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Priority to DE102017110976.5A priority Critical patent/DE102017110976B8/de
Priority to US15/981,475 priority patent/US10326464B2/en
Priority to CN201810483343.6A priority patent/CN108964664B/zh
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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/069—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy by range overlap between successive stages or steps
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H03M1/52—Input signal integrated with linear return to datum
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H03M1/56—Input signal compared with linear ramp
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • H03M1/0604—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/0607—Offset or drift compensation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1019—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error by storing a corrected or correction value in a digital look-up table
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
DE102017110976.5A 2017-05-19 2017-05-19 Selbstoszillierender Mehrrampen-Umsetzer und Verfahren zum Umsetzen einer Kapazität in ein digitales Signal Active DE102017110976B8 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE102017110976.5A DE102017110976B8 (de) 2017-05-19 2017-05-19 Selbstoszillierender Mehrrampen-Umsetzer und Verfahren zum Umsetzen einer Kapazität in ein digitales Signal
US15/981,475 US10326464B2 (en) 2017-05-19 2018-05-16 Self-oscillating multi-ramp converter and method for converting a capacitance into a digital signal
CN201810483343.6A CN108964664B (zh) 2017-05-19 2018-05-18 自激振荡多斜率变换器以及用于将电容变换为数字信号的方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102017110976.5A DE102017110976B8 (de) 2017-05-19 2017-05-19 Selbstoszillierender Mehrrampen-Umsetzer und Verfahren zum Umsetzen einer Kapazität in ein digitales Signal

Publications (2)

Publication Number Publication Date
DE102017110976B3 DE102017110976B3 (de) 2018-09-27
DE102017110976B8 true DE102017110976B8 (de) 2018-12-06

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DE102017110976.5A Active DE102017110976B8 (de) 2017-05-19 2017-05-19 Selbstoszillierender Mehrrampen-Umsetzer und Verfahren zum Umsetzen einer Kapazität in ein digitales Signal

Country Status (3)

Country Link
US (1) US10326464B2 (de)
CN (1) CN108964664B (de)
DE (1) DE102017110976B8 (de)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102015008485A1 (de) * 2015-07-01 2017-01-05 Leopold Kostal Gmbh & Co. Kg Verfahren zum Messen eines Kapazitätswertes
SG11201810578UA (en) * 2016-06-01 2018-12-28 Agency Science Tech & Res Delta sigma modulator for and method of generating a digital output voltage
EP3618284B1 (de) * 2018-08-31 2023-11-01 Nxp B.V. Kapazität-digital-umwandler
US11595030B2 (en) * 2020-05-05 2023-02-28 Omnivision Technologies, Inc. Ramp generator providing high resolution fine gain including fractional divider with delta-sigma modulator
TWI771929B (zh) * 2021-02-25 2022-07-21 茂達電子股份有限公司 具有電荷分配電路的計數器
CN114207390A (zh) * 2021-08-16 2022-03-18 迪克创新科技有限公司 感光装置及相关电子装置

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Publication number Priority date Publication date Assignee Title
US6366231B1 (en) * 2000-04-10 2002-04-02 General Electric Company Integrate and fold analog-to-digital converter with saturation prevention
DE102005038875A1 (de) * 2005-05-25 2006-11-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kapazitätsmessschaltung
DE102005061090B3 (de) * 2005-12-21 2007-08-30 Atmel Germany Gmbh Messeinrichtung zur kapazitiven Druckmessung
JP4929060B2 (ja) * 2006-07-14 2012-05-09 ローム株式会社 アナログ／ディジタル変換器、照度センサ、照明装置、電子機器
US8547114B2 (en) * 2006-11-14 2013-10-01 Cypress Semiconductor Corporation Capacitance to code converter with sigma-delta modulator
CN101312344B (zh) * 2007-05-24 2010-05-19 武汉芯动科技有限公司 积分数据接收方法及接收器
KR20130107275A (ko) * 2010-09-14 2013-10-01 어드밴스드 실리콘 에스아 정전용량 방식 터치 애플리케이션용 회로
JP2015065532A (ja) * 2013-09-24 2015-04-09 株式会社東芝 信号処理装置および信号処理方法
US9374101B2 (en) * 2014-10-21 2016-06-21 Electronics And Telecommunications Research Institute Sensor device including high-resolution analog to digital converter
US9628104B2 (en) * 2015-03-13 2017-04-18 Rosemount Inc. High resolution sigma delta modulator for capacitance sensor terminal displacement measurement

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
GEORGE, B.; KUMAR, V. J.: Analysis of the Switched-Capacitor Dual-Slope Capacitance-to-Digital Converter. Transactions on Instrumentation and Measurement, IEEE, Vol. 59, Nr. 5, Mai 2010, S. 997 – 1006. – ISSN 1557-9662 *
SANJURJO, J. P.; PREFASI, E.; BUFFA, C.; GAGGL, R.: An Energy-Efficient 17-bit Noise-Shaping Dual-Slope Capacitance-to-Digital Converter for MEMS sensors. In: ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference, IEEE, 2016, S. 389-392. – ISBN 978-1-5090-2972-3 *

Also Published As

Publication number Publication date
US10326464B2 (en) 2019-06-18
CN108964664A (zh) 2018-12-07
US20180337684A1 (en) 2018-11-22
CN108964664B (zh) 2023-04-07
DE102017110976B3 (de) 2018-09-27

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