DE102015203188A1 - Optische Positionsmesseinrichtung - Google Patents

Optische Positionsmesseinrichtung Download PDF

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Publication number
DE102015203188A1
DE102015203188A1 DE102015203188.8A DE102015203188A DE102015203188A1 DE 102015203188 A1 DE102015203188 A1 DE 102015203188A1 DE 102015203188 A DE102015203188 A DE 102015203188A DE 102015203188 A1 DE102015203188 A1 DE 102015203188A1
Authority
DE
Germany
Prior art keywords
scanning
plane
scanning unit
graduation
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102015203188.8A
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German (de)
English (en)
Inventor
Wolfgang Holzapfel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dr Johannes Heidenhain GmbH
Original Assignee
Dr Johannes Heidenhain GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dr Johannes Heidenhain GmbH filed Critical Dr Johannes Heidenhain GmbH
Priority to DE102015203188.8A priority Critical patent/DE102015203188A1/de
Priority to JP2016007673A priority patent/JP6588836B2/ja
Priority to EP16154260.0A priority patent/EP3059554B1/de
Priority to CN201610097949.7A priority patent/CN105910533B/zh
Priority to US15/050,620 priority patent/US9733069B2/en
Publication of DE102015203188A1 publication Critical patent/DE102015203188A1/de
Withdrawn legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/32Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
    • G01D5/34Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
    • G01D5/36Forming the light into pulses
    • G01D5/38Forming the light into pulses by diffraction gratings

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Transform (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE102015203188.8A 2015-02-23 2015-02-23 Optische Positionsmesseinrichtung Withdrawn DE102015203188A1 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE102015203188.8A DE102015203188A1 (de) 2015-02-23 2015-02-23 Optische Positionsmesseinrichtung
JP2016007673A JP6588836B2 (ja) 2015-02-23 2016-01-19 光学位置測定装置
EP16154260.0A EP3059554B1 (de) 2015-02-23 2016-02-04 Optische positionsmesseinrichtung
CN201610097949.7A CN105910533B (zh) 2015-02-23 2016-02-23 光学位置测量装置
US15/050,620 US9733069B2 (en) 2015-02-23 2016-02-23 Optical position-measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102015203188.8A DE102015203188A1 (de) 2015-02-23 2015-02-23 Optische Positionsmesseinrichtung

Publications (1)

Publication Number Publication Date
DE102015203188A1 true DE102015203188A1 (de) 2016-08-25

Family

ID=55299395

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102015203188.8A Withdrawn DE102015203188A1 (de) 2015-02-23 2015-02-23 Optische Positionsmesseinrichtung

Country Status (5)

Country Link
US (1) US9733069B2 (enrdf_load_stackoverflow)
EP (1) EP3059554B1 (enrdf_load_stackoverflow)
JP (1) JP6588836B2 (enrdf_load_stackoverflow)
CN (1) CN105910533B (enrdf_load_stackoverflow)
DE (1) DE102015203188A1 (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016210434A1 (de) 2016-06-13 2017-12-14 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102017219125A1 (de) 2017-10-25 2019-04-25 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
CN113280731A (zh) * 2020-02-19 2021-08-20 约翰内斯.海德汉博士有限公司 光学位置测量装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102017201257A1 (de) * 2017-01-26 2018-07-26 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
EP3929529B1 (en) * 2019-02-21 2024-09-25 Nikon Corporation Surface position detection device, exposure apparatus, substrate-processing system, and device-manufacturing method
CN115993088A (zh) * 2021-10-20 2023-04-21 约翰内斯.海德汉博士有限公司 光学位置测量设备

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1762828A2 (de) 2005-09-12 2007-03-14 Dr. Johannes Heidenhain GmbH Optische Positionsmesseinrichtung zur Erfassung der Position zweier zueinander beweglicher Teile in zwei Bewegungsrichtungen
EP2848899A2 (de) 2013-09-11 2015-03-18 Dr. Johannes Heidenhain GmbH Optische Positionsmesseinrichtung

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5953209U (ja) * 1982-10-01 1984-04-07 ソニ−マグネスケ−ル株式会社 光学式測長スケ−ル
JP4023923B2 (ja) * 1998-07-02 2007-12-19 ソニーマニュファクチュアリングシステムズ株式会社 光学式変位測定装置
KR100531458B1 (ko) * 1998-08-20 2005-11-25 소니 매뉴펙츄어링 시스템즈 코포레이션 광학식 변위측정장치
DE50105554D1 (de) * 2000-09-14 2005-04-14 Heidenhain Gmbh Dr Johannes Positionsmesseinrichtung
JP4722474B2 (ja) * 2004-12-24 2011-07-13 株式会社ミツトヨ 変位検出装置
JP4924884B2 (ja) * 2006-05-19 2012-04-25 株式会社ニコン エンコーダ
US7858922B2 (en) * 2006-11-20 2010-12-28 Dr. Johannes Heidenhain Gmbh Position-measuring device
DE102010029211A1 (de) * 2010-05-21 2011-11-24 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
JP5618898B2 (ja) * 2010-08-31 2014-11-05 Dmg森精機株式会社 変位検出装置
EP2776790B1 (en) * 2011-11-09 2016-09-14 Zygo Corporation Compact encoder head for interferometric encoder system
JP5714780B2 (ja) * 2011-11-09 2015-05-07 ザイゴ コーポレーションZygo Corporation ダブルパス干渉方式エンコーダシステム

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1762828A2 (de) 2005-09-12 2007-03-14 Dr. Johannes Heidenhain GmbH Optische Positionsmesseinrichtung zur Erfassung der Position zweier zueinander beweglicher Teile in zwei Bewegungsrichtungen
EP2848899A2 (de) 2013-09-11 2015-03-18 Dr. Johannes Heidenhain GmbH Optische Positionsmesseinrichtung

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102016210434A1 (de) 2016-06-13 2017-12-14 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
EP3258220A2 (de) 2016-06-13 2017-12-20 Dr. Johannes Heidenhain GmbH Optische positionsmesseinrichtung
DE102017219125A1 (de) 2017-10-25 2019-04-25 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
EP3477264A1 (de) 2017-10-25 2019-05-01 Dr. Johannes Heidenhain GmbH Optische positionsmesseinrichtung
US10527405B2 (en) 2017-10-25 2020-01-07 Dr. Johannes Heidenhain Gmbh Optical position-measuring device
CN113280731A (zh) * 2020-02-19 2021-08-20 约翰内斯.海德汉博士有限公司 光学位置测量装置
EP3869161A1 (de) * 2020-02-19 2021-08-25 Dr. Johannes Heidenhain GmbH Optische positionsmesseinrichtung
US11644348B2 (en) 2020-02-19 2023-05-09 Dr. Johannes Heidenhain Gmbh Optical position measuring device

Also Published As

Publication number Publication date
CN105910533A (zh) 2016-08-31
US9733069B2 (en) 2017-08-15
JP2016156805A (ja) 2016-09-01
CN105910533B (zh) 2019-02-15
JP6588836B2 (ja) 2019-10-09
EP3059554A1 (de) 2016-08-24
US20160245642A1 (en) 2016-08-25
EP3059554B1 (de) 2017-08-30

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Legal Events

Date Code Title Description
R012 Request for examination validly filed
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee