DE102010052689A1 - Substrate holder for the surface treatment of substrates and use of the substrate holder - Google Patents
Substrate holder for the surface treatment of substrates and use of the substrate holder Download PDFInfo
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- DE102010052689A1 DE102010052689A1 DE201010052689 DE102010052689A DE102010052689A1 DE 102010052689 A1 DE102010052689 A1 DE 102010052689A1 DE 201010052689 DE201010052689 DE 201010052689 DE 102010052689 A DE102010052689 A DE 102010052689A DE 102010052689 A1 DE102010052689 A1 DE 102010052689A1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67346—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders characterized by being specially adapted for supporting a single substrate or by comprising a stack of such individual supports
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/6776—Continuous loading and unloading into and out of a processing chamber, e.g. transporting belts within processing chambers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68735—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge profile or support profile
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- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Die Erfindung betrifft einen Substrathalter für die Oberflächenbeschichtung von Substraten, der in Rahmenform ausgebildet ist. Beim erfindungsgemäßen Substrathalter ist eine schräge Kantenfläche vorgesehen, auf dem das Substrat aufliegt, so dass eine vollständige Beschichtung der Oberfläche ohne Umgriff auf nicht erwünschte Bereiche des Substrates erfolgt. Die Erfindung betrifft weiterhin die Verwendung eines derartigen Substrathalters.The invention relates to a substrate holder for surface coating of substrates, which is designed in the form of a frame. In the substrate holder according to the invention, an inclined edge surface is provided on which the substrate rests, so that the surface is completely coated without encompassing undesired areas of the substrate. The invention also relates to the use of such a substrate holder.
Description
Die Erfindung betrifft einen Substrathalter für die Oberflächenbeschichtung von Substraten, der in Rahmenform ausgebildet ist. Beim erfindungsgemäßen Substrathalter ist eine schräge Kantenfläche vorgesehen, auf dem das Substrat aufliegt, so dass eine vollständige Beschichtung der Oberfläche ohne Umgriff auf nicht erwünschte Bereiche des Substrates erfolgt. Die Erfindung betrifft weiterhin die Verwendung eines derartigen Substrathalters.The invention relates to a substrate holder for the surface coating of substrates, which is formed in a frame shape. In the case of the substrate holder according to the invention, an oblique edge surface is provided, on which the substrate rests, so that a complete coating of the surface takes place without encroaching on unwanted regions of the substrate. The invention further relates to the use of such a substrate holder.
Im Stand der Technik sind bisher schon verschiedene Konzepte bekannt, wie Substrate gehalten werden können, um z. B. eine einseitige Beschichtung, Reinigung oder Rückätzung von Substraten, z. B. auch von Solarzellen vornehmen zu können. Derartige Prozesse werden üblicherweise in Durchlaufanlagen ausgeführt, so z. B. in Vakuumanlagen, wie Plasma-Enhanced Chemical Vapor Deposition(PECVD)- oder in Physical Vapor Deposition (PVD) oder in Atmospheric Pressure Chemical Vapor Deposition(APCVD)-Anlagen.In the prior art, various concepts are already known how substrates can be kept to z. As a one-sided coating, cleaning or etching back of substrates, eg. B. to be able to make solar cells. Such processes are usually carried out in continuous systems, such. B. in vacuum systems, such as plasma-enhanced chemical vapor deposition (PECVD) - or in Physical Vapor Deposition (PVD) or in Atmospheric Pressure Chemical Vapor Deposition (APCVD) systems.
Ein Problem bei derartigen Oberflächenbearbeitungen von Substraten, wie Solarzellen besteht u. a. darin, dass das Substrat so gehalten werden muss, dass keine Abschattungsflächen entstehen. So gibt es z. B. im Stand der Technik verschiedene Ansätze mit unterschiedlich geformten Stiften. Hierbei liegen die Substrate an einzelnen Punkten auf der zu beschichtenden Fläche auf. Dadurch kann natürlich ein Umgriff bei den Beschichtungen bei dieser Ausführungsform nicht mehr verhindert werden. Zusätzlich entstehen im Bereich der Auflagepunkte Abschattungsflächen. Dadurch kann es beispielsweise bei der Abscheidung dielektrischer Schichten, welche zur Passivierung kristalliner Siliziumsolarzellen dienen, an den nicht beschichteten Bereichen zu einer unerwünschten Rekombination der Ladungsträger in diesem Bereich kommen. Bei der Beschichtung von Substraten mit einem Metallfilm kann es dann, wenn der Metallfilm auch an unerwünschten Orten abgeschieden wird, zu einer Kurzschlussbildung einer Solarzelle kommen.A problem with such surface processing of substrates, such as solar cells u. a. in that the substrate must be held so that no shading surfaces arise. So there are z. B. in the prior art different approaches with differently shaped pins. In this case, the substrates are located at individual points on the surface to be coated. As a result, of course, a wrap around the coatings in this embodiment can no longer be prevented. In addition, shading surfaces are created in the area of the support points. As a result, unwanted recombination of the charge carriers in this region can occur, for example, in the deposition of dielectric layers which serve to passivate crystalline silicon solar cells at the uncoated regions. In the case of the coating of substrates with a metal film, if the metal film is also deposited in undesired locations, a short circuit of a solar cell may occur.
Ausgehend hiervon ist es deshalb die Aufgabe der vorliegenden Erfindung, einen Substrathalter vorzuschlagen, mit dem es möglich wird, die Abschattungsfläche zu reduzieren. Weiterhin soll eine unerwünschte Beschichtung von weiteren Bereichen des Substrates vermieden werden.Proceeding from this, it is therefore the object of the present invention to provide a substrate holder, with which it is possible to reduce the shading area. Furthermore, an undesirable coating of other areas of the substrate should be avoided.
Die vorstehend beschriebene Aufgabe wird durch einen Substrathalter, wie er in Patentanspruch 1 durch die Merkmalskombination definiert ist, gelöst.The object described above is achieved by a substrate holder as defined in claim 1 by the feature combination.
Erfindungsgemäß wird somit ein Substrathalter in Rahmenform vorgeschlagen, wobei sich der Substrathalter dadurch auszeichnet, dass die innenliegenden Rahmenkante in Form einer schrägen Kantenfläche ausgebildet ist. Das zu beschichtende Substrat liegt dann mit seiner Substratkante auf dieser schrägen Kantenfläche auf. Dadurch entsteht durch die Substratkante auf der schrägen Kantenfläche eine umlaufende Auflagelinie, die die zu bearbeitende Oberfläche exakt begrenzt und definiert. Der Bearbeitungsprozess kann damit bis zur Substratkante durchgeführt werden, ohne dass eine Abschattung eintritt, gleichzeitig wird durch die umlaufende Auflagelinie der Substratkante auf der schrägen Kantenfläche ein Umgreifen bei der Bearbeitung des Substrates auf nicht erwünschte Bereiche vermieden.According to the invention, a substrate holder is thus proposed in frame form, wherein the substrate holder is characterized in that the inner frame edge is formed in the form of an oblique edge surface. The substrate to be coated then lies with its substrate edge on this oblique edge surface. As a result, the edge of the substrate on the oblique edge surface forms a peripheral support line which exactly defines and defines the surface to be processed. The processing process can thus be carried out to the substrate edge, without any shadowing occurs, at the same time avoiding the processing of the substrate to undesirable areas is avoided by the circumferential support line of the substrate edge on the inclined edge surface.
Der erfindungsgemäße Substrathalter zeichnet sich somit dadurch aus, dass er durch seine konstruktive Ausbildung infolge der schrägen Kantenfläche einen Umgriff bei der Beschichtung oder bei der Bearbeitung von Substraten auf unerwünschte Stellen vermeidet und dass zugleich jegliche Halteelemente, wie z. B. Stifte vermieden werden, so dass eine vollständige Bearbeitung der Oberfläche erfolgen kann.The substrate holder according to the invention is thus characterized by the fact that it avoids wraparound in the coating or in the processing of substrates on unwanted areas by its structural design due to the oblique edge surface and that at the same time any holding elements, such. B. pins are avoided, so that a complete processing of the surface can be done.
Erfindungsgemäß wird unter einem Rahmen dabei ein einzelner Rahmen aber auch die Anordnung von mehreren Rahmen nebeneinander unter Bildung eines Trägers verstanden. In diesem Fall sind dann die schrägen Kantenflächen im Träger selbst ausgebildet. Die Erfindung umfasst auch Ausführungsformen, bei denen einzelne Rahmen in einem Träger eingesetzt werden.According to the invention, a frame means a single frame but also the arrangement of several frames side by side to form a carrier. In this case, then the oblique edge surfaces are formed in the carrier itself. The invention also includes embodiments in which individual frames are used in a carrier.
Es hat sich herausgestellt, dass es bevorzugt ist, wenn die schräge Kantenfläche so ausgebildet ist, dass ein Winkel ε von 25° bis 70°, bevorzugt von 35° bis 55° eingehalten wird. Erfindungsgemäß wird unter einem Winkel ε ein Winkel verstanden, der zwischen der ersten schrägen Kantenfläche und einer auf dem Substrat angeordneten gedachten Senkrechten ausgehend von der Substratkante entsteht.It has been found that it is preferred if the oblique edge surface is formed such that an angle ε of 25 ° to 70 °, preferably 35 ° to 55 ° is maintained. According to the invention, an angle ε is understood to mean an angle which arises between the first oblique edge surface and an imaginary vertical arranged on the substrate, starting from the substrate edge.
Der Substrathalter nach der Erfindung kann dabei auch so ausgebildet sein, dass nicht nur eine schräge Kantenfläche wie vorstehend beschrieben, sondern dass auch noch eine zweite schräge Kantenfläche, die gegenläufig zur ersten schrägen Kantenfläche ausgebildet ist, vorgesehen ist. Dadurch wird im Querschnitt des Rahmens eine Dreieckskonstruktion realisiert. Für die zweite schräge Kantenfläche gilt, wie vorstehend schon bei der ersten schrägen Kantenfläche beschrieben, dass es bevorzugt ist, wenn hier ein Winkel ψ von 25° bis 70°, bevorzugt von 35° bis 55° eingehalten wird. Die Bestimmung des Winkels ψ erfolgt wie vorstehend beschrieben nämlich in der Weise, dass der Winkel zwischen der zweiten schrägen Kantenfläche und einer auf dem Substrat angeordneten gedachten senkrechten hier ausgehend von der Spitze des Dreiecks berücksichtigt wird.The substrate holder according to the invention can also be designed so that not only an oblique edge surface as described above, but also that a second oblique edge surface which is formed opposite to the first inclined edge surface, is provided. As a result, a triangular construction is realized in the cross section of the frame. For the second oblique edge surface, as described above for the first oblique edge surface, it is preferred that an angle ψ of 25 ° to 70 °, preferably of 35 ° to 55 °, is maintained here. The determination of the angle ψ is carried out as described above, namely in such a way that the angle between the second oblique edge surface and an imaginary vertical arranged on the substrate here is taken into account starting from the apex of the triangle.
Für diesen Fall, d. h. für die Ausführungsform mit zwei schrägen Kantenflächen, liegt dann das Substrat mit seiner Substratkante wiederum auf der ersten schrägen Kantenfläche auf und bildet wiederum einen linienförmigen Auflage, so dass wieder eine exakte Bearbeitung der Oberfläche möglich ist.For this case, d. H. for the embodiment with two oblique edge surfaces, then the substrate with its substrate edge in turn on the first oblique edge surface and in turn forms a linear support, so that again an exact machining of the surface is possible.
Der Substrathalter der Erfindung umfasst dabei selbstverständlich auch Ausführungsformen, bei denen noch zusätzlich eine Halteplatte vorgesehen ist. Gemäß der Erfindung ist es dabei bevorzugt, wenn diese Halteplatte formschlüssig zwischen den ersten schrägen Kantenflächen des Rahmens eingepasst ist. Die Dimensionierung und Formgebung ist dabei so gewählt, dass dann, wenn das Substrat mit seiner zur Bearbeitung gegenüberliegenden Oberfläche auf die Halteplatte aufgelegt wird, die Substratkante wiederum Kontakt zur schrägen Kantenfläche aufweist. Damit wird wiederum eine linienförmige Auflage des Substrates auf der schrägen Kantenfläche erreicht, so dass eine exakte Bearbeitung möglich ist.Of course, the substrate holder of the invention also includes embodiments in which a holding plate is additionally provided. According to the invention, it is preferred if this holding plate is fitted in a form-fitting manner between the first oblique edge surfaces of the frame. The dimensioning and shaping is chosen so that when the substrate is placed with its opposite surface for processing on the holding plate, the substrate edge in turn has contact with the oblique edge surface. Thus, in turn, a linear support of the substrate is achieved on the oblique edge surface, so that an exact processing is possible.
Ob nun erfindungsgemäß ein Substrathalter nur mit einem Rahmen oder mit einem Rahmen und einer Halteplatte verwendet wird, hängt davon ab, welches Bearbeitungsverfahren gewählt wird.Whether according to the invention a substrate holder is used only with a frame or with a frame and a holding plate depends on which processing method is selected.
Beispielsweise wird bei PECVD-Anlagen derzeit routinemäßig das Substrat mit der zu beschichtenden Fläche nach unten angeordnet, und von unten beschichtet (Face Down). Dadurch kann noch erreicht werden, dass Partikel nicht auf die Fläche fallen.For example, in the case of PECVD systems, the substrate with the surface to be coated is routinely arranged downwards and coated from below (face down). This can still be achieved that particles do not fall on the surface.
Andererseits ist es aber auch möglich, eine sog. Face-Up-Anordnung der Substrate einzusetzen. Dabei wird die zu beschichtende Fläche nach oben ausgerichtet.On the other hand, it is also possible to use a so-called face-up arrangement of the substrates. The surface to be coated is aligned upward.
Wie vorstehend dargelegt, erlaubt somit auch der erfindungsgemäße Substrathalter, dass sowohl eine Face-Down- als auch eine Face-Up-Anordnung realisiert werden kann.As explained above, the substrate holder according to the invention thus also permits both a face-down and a face-up arrangement to be realized.
Die Erfindung umfasst in Bezug auf den Rahmen keinerlei Einschränkungen. Wesentlich ist nur, dass die durch den Rahmen aufgespannte Fläche in Form und Abmessung an das zu bearbeitende Substrat angepasst ist. Beispielsweise kann somit ein Rahmen eingesetzt werden, der mehreckig, z. B. vier- oder sechseckig ist.The invention has no limitations with respect to the frame. It is only essential that the surface spanned by the frame is adapted in shape and dimension to the substrate to be processed. For example, thus, a frame can be used, the polygonal, z. B. four or hexagonal.
Das Material des Rahmens und/oder der Halteplatte ist dem Fachmann bekannt. Die Materialien müssen dabei so ausgewählt sein, dass sie unter den gegebenen Prozessbedingungen stabil bleiben.The material of the frame and / or the retaining plate is known in the art. The materials must be selected so that they remain stable under the given process conditions.
Wie vorstehend beschrieben, eignet sich somit der erfindungsgemäße Substrathalter insbesondere zur Beschichtung auch beliebiger Schichten oder Schichtsysteme sowie zur Reinigung oder Rückätzung von Substraten. Diese Bearbeitungsschritte werden vorzugsweise in Durchlaufanlagen, vorzugsweise in Vakuumanlagen wie PECVD, PVD oder auch APCVD, durchgeführt.As described above, the substrate holder according to the invention is therefore particularly suitable for coating any desired layers or layer systems as well as for cleaning or etching back substrates. These processing steps are preferably carried out in continuous systems, preferably in vacuum systems such as PECVD, PVD or even APCVD.
Weiterhin kann die Erfindung vorteilhaft in Beschichtungsanlagen umgesetzt werden, in dem zwischen zu beschichtender Seite und nicht zu beschichtender Seite eine Druckdifferenz ausgebildet wird, wobei der Druck auf der zu beschichtenden Seite niedriger ist als auf der nicht zu beschichtenden Seite. Dies kann bspw. durch eine entsprechende Anordnung von Pumpen oder Gasdüsen auf der zu beschichtenden Seite erfolgen wodurch ein statischer oder dynamischer Unterdruck erzeugt wird.Furthermore, the invention can be advantageously implemented in coating plants in which a pressure difference is formed between the side to be coated and the side not to be coated, wherein the pressure on the side to be coated is lower than on the side not to be coated. This can be done, for example, by an appropriate arrangement of pumps or gas nozzles on the side to be coated, whereby a static or dynamic negative pressure is generated.
Die Erfindung wird nachfolgend anhand der
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Die Erfindung umfasst aber auch Ausführungsformen, bei denen mehrere nebeneinander angeordnete Rahmen
Claims (14)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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DE201010052689 DE102010052689A1 (en) | 2010-11-26 | 2010-11-26 | Substrate holder for the surface treatment of substrates and use of the substrate holder |
EP11796619.2A EP2643850A1 (en) | 2010-11-26 | 2011-11-25 | Substrate holder for the surface treatment of substrates, and use of the substrate holder |
PCT/EP2011/005948 WO2012069208A1 (en) | 2010-11-26 | 2011-11-25 | Substrate holder for the surface treatment of substrates, and use of the substrate holder |
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DE201010052689 DE102010052689A1 (en) | 2010-11-26 | 2010-11-26 | Substrate holder for the surface treatment of substrates and use of the substrate holder |
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DE102010052689A1 true DE102010052689A1 (en) | 2012-05-31 |
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DE201010052689 Ceased DE102010052689A1 (en) | 2010-11-26 | 2010-11-26 | Substrate holder for the surface treatment of substrates and use of the substrate holder |
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DE (1) | DE102010052689A1 (en) |
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WO2014191624A1 (en) * | 2013-05-29 | 2014-12-04 | Beneq Oy | Substrate holder and arrangement for holding substrates |
DE102014116342A1 (en) * | 2014-11-10 | 2016-05-25 | Von Ardenne Gmbh | Substrate holding device and method for processing a substrate |
WO2017085178A1 (en) * | 2015-11-18 | 2017-05-26 | Centrotherm Photovoltaics Ag | Wafer boat and plasma treatment device for wafers |
DE102016214445A1 (en) | 2016-08-04 | 2018-02-08 | Meyer Burger (Germany) Ag | Adapter device for substrate carrier |
DE102018111868A1 (en) * | 2018-05-17 | 2019-11-21 | Meyer Burger (Germany) Gmbh | substrate carrier |
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JP6013824B2 (en) * | 2012-07-27 | 2016-10-25 | 株式会社荏原製作所 | Work transfer device |
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- 2010-11-26 DE DE201010052689 patent/DE102010052689A1/en not_active Ceased
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- 2011-11-25 WO PCT/EP2011/005948 patent/WO2012069208A1/en active Application Filing
- 2011-11-25 EP EP11796619.2A patent/EP2643850A1/en not_active Withdrawn
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Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014191624A1 (en) * | 2013-05-29 | 2014-12-04 | Beneq Oy | Substrate holder and arrangement for holding substrates |
DE102014116342A1 (en) * | 2014-11-10 | 2016-05-25 | Von Ardenne Gmbh | Substrate holding device and method for processing a substrate |
DE102014116342B4 (en) * | 2014-11-10 | 2016-06-09 | Von Ardenne Gmbh | Substrate holding device and method for processing a substrate |
WO2017085178A1 (en) * | 2015-11-18 | 2017-05-26 | Centrotherm Photovoltaics Ag | Wafer boat and plasma treatment device for wafers |
DE102016214445A1 (en) | 2016-08-04 | 2018-02-08 | Meyer Burger (Germany) Ag | Adapter device for substrate carrier |
WO2018024871A1 (en) | 2016-08-04 | 2018-02-08 | Meyer Burger (Germany) Ag | Matching apparatus for substrate carriers |
DE102018111868A1 (en) * | 2018-05-17 | 2019-11-21 | Meyer Burger (Germany) Gmbh | substrate carrier |
WO2019219127A1 (en) * | 2018-05-17 | 2019-11-21 | Meyer Burger (Germany) Gmbh | Substrate support |
Also Published As
Publication number | Publication date |
---|---|
WO2012069208A9 (en) | 2012-07-19 |
WO2012069208A1 (en) | 2012-05-31 |
EP2643850A1 (en) | 2013-10-02 |
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