DE102008021641A1 - Auflösungsgesteigerte Lumineszenzmikroskopie - Google Patents

Auflösungsgesteigerte Lumineszenzmikroskopie Download PDF

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Publication number
DE102008021641A1
DE102008021641A1 DE102008021641A DE102008021641A DE102008021641A1 DE 102008021641 A1 DE102008021641 A1 DE 102008021641A1 DE 102008021641 A DE102008021641 A DE 102008021641A DE 102008021641 A DE102008021641 A DE 102008021641A DE 102008021641 A1 DE102008021641 A1 DE 102008021641A1
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DE
Germany
Prior art keywords
molecules
activated
resolution
radiation
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102008021641A
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German (de)
English (en)
Inventor
Ralf Wolleschensky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Microscopy GmbH
Original Assignee
Carl Zeiss Microscopy GmbH
Carl Zeiss MicroImaging GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Microscopy GmbH, Carl Zeiss MicroImaging GmbH filed Critical Carl Zeiss Microscopy GmbH
Priority to DE102008021641A priority Critical patent/DE102008021641A1/de
Priority to US12/990,455 priority patent/US20110043619A1/en
Priority to PCT/EP2009/003036 priority patent/WO2009132811A1/de
Priority to EP09737855.8A priority patent/EP2277029B1/de
Priority to JP2011506602A priority patent/JP5823287B2/ja
Publication of DE102008021641A1 publication Critical patent/DE102008021641A1/de
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
DE102008021641A 2008-04-30 2008-04-30 Auflösungsgesteigerte Lumineszenzmikroskopie Withdrawn DE102008021641A1 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE102008021641A DE102008021641A1 (de) 2008-04-30 2008-04-30 Auflösungsgesteigerte Lumineszenzmikroskopie
US12/990,455 US20110043619A1 (en) 2008-04-30 2009-04-25 Resolution-Enhanced Luminescence Microscopy
PCT/EP2009/003036 WO2009132811A1 (de) 2008-04-30 2009-04-25 Auflösungsgesteigerte lumineszenzmikroskopie
EP09737855.8A EP2277029B1 (de) 2008-04-30 2009-04-25 Auflösungsgesteigerte lumineszenzmikroskopie
JP2011506602A JP5823287B2 (ja) 2008-04-30 2009-04-25 分解能の向上したルミネセンス顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102008021641A DE102008021641A1 (de) 2008-04-30 2008-04-30 Auflösungsgesteigerte Lumineszenzmikroskopie

Publications (1)

Publication Number Publication Date
DE102008021641A1 true DE102008021641A1 (de) 2009-11-05

Family

ID=40908471

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102008021641A Withdrawn DE102008021641A1 (de) 2008-04-30 2008-04-30 Auflösungsgesteigerte Lumineszenzmikroskopie

Country Status (5)

Country Link
US (1) US20110043619A1 (cg-RX-API-DMAC7.html)
EP (1) EP2277029B1 (cg-RX-API-DMAC7.html)
JP (1) JP5823287B2 (cg-RX-API-DMAC7.html)
DE (1) DE102008021641A1 (cg-RX-API-DMAC7.html)
WO (1) WO2009132811A1 (cg-RX-API-DMAC7.html)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009031231A1 (de) * 2009-06-26 2010-12-30 Carl Zeiss Microlmaging Gmbh Verfahren und Anordnungen für die Fluoreszenzmikroskopie
DE102010007730A1 (de) * 2010-02-12 2011-08-18 Leica Microsystems CMS GmbH, 35578 Verfahren und Vorrichtung zum Einstellen eines geeigneten Auswerteparameters für ein Fluoreszenzmikroskop
DE102012224306A1 (de) * 2012-12-21 2014-06-26 Carl Zeiss Microscopy Gmbh Verfahren zur hochauflösenden 3D-Lokalisierungsmikroskopie
EP2663856B1 (en) * 2011-01-12 2025-03-05 Leica Microsystems CMS GmbH Cameras and methods for camera-based image processing in microscopy instruments

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009060793A1 (de) * 2009-12-22 2011-07-28 Carl Zeiss Microlmaging GmbH, 07745 Hochauflösendes Mikroskop und Verfahren zur zwei- oder dreidimensionalen Positionsbestimmung von Objekten
US8237786B2 (en) * 2009-12-23 2012-08-07 Applied Precision, Inc. System and method for dense-stochastic-sampling imaging
DE102011001091C5 (de) * 2010-10-19 2022-07-14 Leica Microsystems Cms Gmbh Verfahren und Einrichtung zur mikroskopischen Bildaufnahme einer Probenstruktur
DE102010044013A1 (de) * 2010-11-16 2012-05-16 Carl Zeiss Microimaging Gmbh Tiefenauflösungsgesteigerte Mikroskopie
DE102013208926A1 (de) * 2013-05-14 2014-11-20 Carl Zeiss Microscopy Gmbh Verfahren zur 3D-hochauflösenden Lokalisierungsmikroskopie
JP6408796B2 (ja) 2014-06-11 2018-10-17 オリンパス株式会社 レーザ顕微鏡装置
JP6375239B2 (ja) * 2015-02-05 2018-08-15 オリンパス株式会社 レーザ顕微鏡装置

Citations (11)

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Publication number Priority date Publication date Assignee Title
DE4416558C2 (de) 1994-02-01 1997-09-04 Hell Stefan Verfahren zum optischen Messen eines Probenpunkts einer Probe und Vorrichtung zur Durchführung des Verfahrens
US5866911A (en) 1994-07-15 1999-02-02 Baer; Stephen C. Method and apparatus for improving resolution in scanned optical system
DE19908883A1 (de) * 1999-03-02 2000-09-07 Rainer Heintzmann Verfahren zur Erhöhung der Auflösung optischer Abbildung
US6633432B2 (en) 2000-08-21 2003-10-14 Olympus Optical Co., Ltd. Optical device and a microscope
DE10325460A1 (de) 2003-04-13 2004-11-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Räumlich hochauflösendes Abbilden
WO2006127692A2 (en) 2005-05-23 2006-11-30 Hess Harald F Optical microscopy with phototransformable optical labels
WO2007009812A1 (de) 2005-07-22 2007-01-25 Carl Zeiss Microimaging Gmbh Auflösungsgesteigerte lumineszenz-mikroskopie
US20070206276A1 (en) * 2006-03-01 2007-09-06 Leica Microsystems Cms Gmbh Method and microscope for high spatial resolution examination of samples
DE102006021317B3 (de) 2006-05-06 2007-10-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
DE102006026203A1 (de) * 2006-05-31 2007-12-06 Carl Zeiss Microimaging Gmbh Verfahren zum räumlich hochauflösenden Abbilden
WO2008021834A2 (en) * 2006-08-11 2008-02-21 The Regents Of The University Of California High-resolution microscope using optical amplification

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US4625106A (en) * 1984-06-29 1986-11-25 The United States Of America As Represented By The Secretary Of The Army Nonlinear gain microchannel plate image intensifier tube
WO1998028592A1 (de) * 1996-12-23 1998-07-02 Ruprecht-Karls-Universität Heidelberg Verfahren und vorrichtungen zur distanzmessung zwischen objektstrukturen
JP4397993B2 (ja) * 1999-03-24 2010-01-13 オリンパス株式会社 顕微鏡写真撮影装置
GB2399971B (en) * 2003-01-22 2006-07-12 Proneta Ltd Imaging sensor optical system
DE102004024810A1 (de) * 2004-05-17 2005-12-08 Soft Imaging System Gmbh Verfahren und Vorrichtung zur optischen Abtastung einer Probe
JP4673000B2 (ja) * 2004-05-21 2011-04-20 株式会社キーエンス 蛍光顕微鏡、蛍光顕微鏡装置を使用した表示方法、蛍光顕微鏡画像表示プログラム及びコンピュータで読み取り可能な記録媒体並びに記憶した機器
DE102008059328A1 (de) * 2008-11-27 2010-06-02 Carl Zeiss Microimaging Gmbh Auflösungsgesteigerte Mikroskopie

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4416558C2 (de) 1994-02-01 1997-09-04 Hell Stefan Verfahren zum optischen Messen eines Probenpunkts einer Probe und Vorrichtung zur Durchführung des Verfahrens
US5866911A (en) 1994-07-15 1999-02-02 Baer; Stephen C. Method and apparatus for improving resolution in scanned optical system
DE19908883A1 (de) * 1999-03-02 2000-09-07 Rainer Heintzmann Verfahren zur Erhöhung der Auflösung optischer Abbildung
EP1157297B1 (de) 1999-03-02 2002-11-06 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und vorrichtung zur objektabbildung
US6633432B2 (en) 2000-08-21 2003-10-14 Olympus Optical Co., Ltd. Optical device and a microscope
DE10325460A1 (de) 2003-04-13 2004-11-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Räumlich hochauflösendes Abbilden
WO2006127692A2 (en) 2005-05-23 2006-11-30 Hess Harald F Optical microscopy with phototransformable optical labels
WO2007009812A1 (de) 2005-07-22 2007-01-25 Carl Zeiss Microimaging Gmbh Auflösungsgesteigerte lumineszenz-mikroskopie
US20070206276A1 (en) * 2006-03-01 2007-09-06 Leica Microsystems Cms Gmbh Method and microscope for high spatial resolution examination of samples
DE102006021317B3 (de) 2006-05-06 2007-10-11 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
DE102006026203A1 (de) * 2006-05-31 2007-12-06 Carl Zeiss Microimaging Gmbh Verfahren zum räumlich hochauflösenden Abbilden
WO2008021834A2 (en) * 2006-08-11 2008-02-21 The Regents Of The University Of California High-resolution microscope using optical amplification

Non-Patent Citations (5)

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Egner et al., Biophysical Journal, S. 3285-3290, Band 93, November 2007
Gurskaya et al., Nature Biotech., Band 24, S. 461-465, 2006
GUSTAFSON,Mats G.L.: Nonlinear structured-illumination microscopy :Wide-field fluorescence imaging with theoretically unlimited resolution. In: Proc.Nat. Acad.Sc.,Vol.102,No.37,Sept.2005,S. 13081-13086 $S.13081,re.Sp.-S.13082,re.Sp. oben,Fig.2-4$ *
HEINTZMANN,R.,JOVIN,Th.M.: Saturated patterned excitation microscopy-a concept for optical resolution improvement. In: J. Opt.Soc.Am.A,Vol.19,No.8,Aug.2002, S.1599-1609 $Zusammenf.,S.1604 ,re.Sp.,S.1607,Appensic A$ *
HEINTZMANN,R.,JOVIN,Th.M.: Saturated patterned excitation microscopy-a concept for optical resolution improvement. In: J. Opt.Soc.Am.A,Vol.19,No.8,Aug.2002, S.1599-1609 Zusammenf.,S.1604 ,re.Sp.,S.1607,Appensic A GUSTAFSON,Mats G.L.: Nonlinear structured-illumination microscopy :Wide-field fluorescence imaging with theoretically unlimited resolution. In: Proc.Nat. Acad.Sc.,Vol.102,No.37,Sept.2005,S. 13081-13086 S.13081,re.Sp.-S.13082,re.Sp. oben,Fig.2-4

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009031231A1 (de) * 2009-06-26 2010-12-30 Carl Zeiss Microlmaging Gmbh Verfahren und Anordnungen für die Fluoreszenzmikroskopie
DE102010007730A1 (de) * 2010-02-12 2011-08-18 Leica Microsystems CMS GmbH, 35578 Verfahren und Vorrichtung zum Einstellen eines geeigneten Auswerteparameters für ein Fluoreszenzmikroskop
US10338369B2 (en) 2010-02-12 2019-07-02 Leica Microsystems Cms Gmbh Method and device for setting a suitable evaluation parameter for a fluorescence microscope
DE102010007730B4 (de) 2010-02-12 2021-08-26 Leica Microsystems Cms Gmbh Verfahren und Vorrichtung zum Einstellen eines geeigneten Auswerteparameters für ein Fluoreszenzmikroskop
EP2663856B1 (en) * 2011-01-12 2025-03-05 Leica Microsystems CMS GmbH Cameras and methods for camera-based image processing in microscopy instruments
DE102012224306A1 (de) * 2012-12-21 2014-06-26 Carl Zeiss Microscopy Gmbh Verfahren zur hochauflösenden 3D-Lokalisierungsmikroskopie
US10031327B2 (en) 2012-12-21 2018-07-24 Carl Zeiss Microscopy Gmbh Method for high-resolution 3D-localization microscopy

Also Published As

Publication number Publication date
EP2277029B1 (de) 2017-12-06
JP2011519038A (ja) 2011-06-30
JP5823287B2 (ja) 2015-11-25
WO2009132811A1 (de) 2009-11-05
US20110043619A1 (en) 2011-02-24
EP2277029A1 (de) 2011-01-26

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Legal Events

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OM8 Search report available as to paragraph 43 lit. 1 sentence 1 patent law
R082 Change of representative

Representative=s name: GEYER, FEHNERS & PARTNER (G.B.R.), DE

R081 Change of applicant/patentee

Owner name: CARL ZEISS MICROSCOPY GMBH, DE

Free format text: FORMER OWNER: CARL ZEISS MICROLMAGING GMBH, 07745 JENA, DE

Effective date: 20130204

R082 Change of representative

Representative=s name: GEYER, FEHNERS & PARTNER (G.B.R.), DE

Effective date: 20130204

R005 Application deemed withdrawn due to failure to request examination