DE10151563A1 - Positionsmessgerät - Google Patents

Positionsmessgerät

Info

Publication number
DE10151563A1
DE10151563A1 DE10151563A DE10151563A DE10151563A1 DE 10151563 A1 DE10151563 A1 DE 10151563A1 DE 10151563 A DE10151563 A DE 10151563A DE 10151563 A DE10151563 A DE 10151563A DE 10151563 A1 DE10151563 A1 DE 10151563A1
Authority
DE
Germany
Prior art keywords
measuring device
position measuring
base body
movable element
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE10151563A
Other languages
German (de)
English (en)
Inventor
Jan Braasch
Wolfgang Holzapfel
Volker Seyfried
Sebastian Tondorf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dr Johannes Heidenhain GmbH
Original Assignee
Dr Johannes Heidenhain GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dr Johannes Heidenhain GmbH filed Critical Dr Johannes Heidenhain GmbH
Priority to DE10151563A priority Critical patent/DE10151563A1/de
Priority to PCT/EP2002/011544 priority patent/WO2003036226A1/de
Priority to JP2003538681A priority patent/JP4377229B2/ja
Priority to US10/493,153 priority patent/US7274464B2/en
Priority to EP02782919.1A priority patent/EP1442269B1/de
Publication of DE10151563A1 publication Critical patent/DE10151563A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02029—Combination with non-interferometric systems, i.e. for measuring the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/15—Cat eye, i.e. reflection always parallel to incoming beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE10151563A 2001-10-23 2001-10-23 Positionsmessgerät Withdrawn DE10151563A1 (de)

Priority Applications (5)

Application Number Priority Date Filing Date Title
DE10151563A DE10151563A1 (de) 2001-10-23 2001-10-23 Positionsmessgerät
PCT/EP2002/011544 WO2003036226A1 (de) 2001-10-23 2002-10-16 Positionsmessgerät
JP2003538681A JP4377229B2 (ja) 2001-10-23 2002-10-16 位置測定装置
US10/493,153 US7274464B2 (en) 2001-10-23 2002-10-16 Position measuring device
EP02782919.1A EP1442269B1 (de) 2001-10-23 2002-10-16 Positionsmessgerät

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10151563A DE10151563A1 (de) 2001-10-23 2001-10-23 Positionsmessgerät

Publications (1)

Publication Number Publication Date
DE10151563A1 true DE10151563A1 (de) 2003-04-30

Family

ID=7702992

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10151563A Withdrawn DE10151563A1 (de) 2001-10-23 2001-10-23 Positionsmessgerät

Country Status (5)

Country Link
US (1) US7274464B2 (enExample)
EP (1) EP1442269B1 (enExample)
JP (1) JP4377229B2 (enExample)
DE (1) DE10151563A1 (enExample)
WO (1) WO2003036226A1 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004056726B4 (de) * 2004-11-19 2014-12-24 Dr. Johannes Heidenhain Gmbh Verfahren und Vorrichtung zur Bestimmung der räumlichen Lage eines ersten Objektes bezüglich eines zweiten Objektes
GB0612914D0 (en) * 2006-06-16 2006-08-09 Renishaw Plc Metrology apparatus
JP2009540317A (ja) * 2006-06-16 2009-11-19 レニショウ パブリック リミテッド カンパニー 位置測定装置用の伸長可能な脚部アセンブリ
FR2911956B1 (fr) * 2007-01-29 2009-05-08 Hispano Suiza Sa Dispositif de mesure de la position d'un piston dans un cylindre, ensemble d'un cylindre, d'un piston et d'un tel dispositif et moteur d'aeronef comprenant un tel ensemble
US20090056440A1 (en) * 2007-07-10 2009-03-05 Lynn Vendl Adjustable measuring cup
DE102008005384A1 (de) * 2008-01-22 2009-07-23 Dr. Johannes Heidenhain Gmbh Längenmesseinrichtung
WO2010023442A2 (en) * 2008-08-26 2010-03-04 The University Court Of The University Of Glasgow Uses of electromagnetic interference patterns
DE102010019656B4 (de) * 2010-05-03 2016-09-01 Etalon Ag Messgerät
WO2014012173A1 (en) * 2012-07-20 2014-01-23 Advanced Test And Automation Inc. System and method for measuring torque
US10105837B2 (en) * 2013-01-25 2018-10-23 The Boeing Company Tracking enabled extended reach tool system and method
JP6284771B2 (ja) * 2013-01-29 2018-02-28 株式会社ミツトヨ パラレル機構
WO2016129191A1 (ja) * 2015-02-13 2016-08-18 日本ヴィクトリック株式会社 伸縮可撓管継手の挙動探査装置及び挙動探査方法
DE102015009393B4 (de) 2015-07-15 2019-07-04 Gerhard Pfeifer Wegaufnehmeranordnung sowie Crashtest-Dummy
TWI585363B (zh) * 2015-12-01 2017-06-01 國立清華大學 應用於量測之雙球桿系統及其誤差補償方法
KR101860927B1 (ko) * 2017-11-09 2018-05-24 주식회사 흥찬엔지니어링 교량 재하 시험 장치
KR101864849B1 (ko) * 2017-11-09 2018-06-05 주식회사 신우기술 교량 재하 시험 장치
DE102019116280B3 (de) * 2019-06-14 2020-12-17 Etalon Ag Verfahren und Vorrichtung zum Bestimmen einer Länge
CN110487158B (zh) * 2019-09-02 2021-06-29 太原科技大学 一种联轴器对中检测装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2240968A1 (de) * 1972-08-21 1974-03-07 Leitz Ernst Gmbh Optisches verfahren zur messung der relativen verschiebung eines beugungsgitters sowie einrichtungen zu seiner durchfuehrung
DE2549218A1 (de) * 1974-11-05 1976-05-06 Secretary Industry Brit Optisches geraet zum bestimmen von achsen
US4373804A (en) * 1979-04-30 1983-02-15 Diffracto Ltd. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
DE3504464C1 (de) 1985-02-09 1986-04-17 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Transportables Meßgerät zur Überprüfung der Positioniergenauigkeit eines programmgesteuerten Gerätearmes
NO164946C (no) * 1988-04-12 1990-11-28 Metronor As Opto-elektronisk system for punktvis oppmaaling av en flates geometri.
JP2862417B2 (ja) * 1990-11-16 1999-03-03 キヤノン株式会社 変位測定装置及び方法
US5198663A (en) * 1991-04-03 1993-03-30 Mitutoyo Corporation Angular velocity sensor with displacement scale and sensor means
GB9315843D0 (en) * 1993-07-30 1993-09-15 Litton Uk Ltd Improved machine tool
US5616917A (en) * 1995-05-16 1997-04-01 Brown & Sharpe Manufacturing Company Device for measuring an angle between pivotally-connected members
US5765444A (en) * 1995-07-10 1998-06-16 Kensington Laboratories, Inc. Dual end effector, multiple link robot arm system with corner reacharound and extended reach capabilities
US6098484A (en) * 1995-07-10 2000-08-08 Kensington Laboratories, Inc. High torque, low hysteresis, multiple link robot arm mechanism
US5741113A (en) * 1995-07-10 1998-04-21 Kensington Laboratories, Inc. Continuously rotatable multiple link robot arm mechanism
DE19534535C2 (de) 1995-09-18 2000-05-31 Leitz Mestechnik Gmbh Koordinatenmeßmaschine
DE19621195C1 (de) * 1996-05-25 1997-08-21 Leica Ag Verfahren und Vorrichtung zur Richtungsbestimmung zu einem Objekt
DE19703735C2 (de) 1997-01-31 2002-02-07 Leitz Brown & Sharpe Mestechni Längenveränderliches Element
US5944476A (en) * 1997-03-26 1999-08-31 Kensington Laboratories, Inc. Unitary specimen prealigner and continuously rotatable multiple link robot arm mechanism
US6126381A (en) * 1997-04-01 2000-10-03 Kensington Laboratories, Inc. Unitary specimen prealigner and continuously rotatable four link robot arm mechanism
US6155768A (en) * 1998-01-30 2000-12-05 Kensington Laboratories, Inc. Multiple link robot arm system implemented with offset end effectors to provide extended reach and enhanced throughput
US20060249491A1 (en) * 1999-09-01 2006-11-09 Hell Gravure Systems Gmbh Laser radiation source
DE19956912A1 (de) 1999-11-26 2001-08-09 Heidenhain Gmbh Dr Johannes Winkelmeßsystem und Winkelmeßverfahren zur berührungslosen Winkelmessung
JP4531965B2 (ja) * 2000-12-04 2010-08-25 株式会社トプコン 振れ検出装置、振れ検出装置付き回転レーザ装置及び振れ検出補正装置付き位置測定設定システム

Also Published As

Publication number Publication date
US20050018205A1 (en) 2005-01-27
JP4377229B2 (ja) 2009-12-02
EP1442269B1 (de) 2013-04-17
WO2003036226A1 (de) 2003-05-01
JP2005506543A (ja) 2005-03-03
EP1442269A1 (de) 2004-08-04
US7274464B2 (en) 2007-09-25

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
R016 Response to examination communication
R016 Response to examination communication
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee

Effective date: 20140501