Testing and sorting device for electronic components, e.g. IC chips - simultaneously controls blocking pins for several channels of multi-channel component discharge system
Testing and sorting device for electronic components, e.g. IC chips - simultaneously controls blocking pins for several channels of multi-channel component discharge system
Microelectronic component separation device e.g. for component testing and sorting device, has synchronized operation of stop lever and clamp lever gripper mechanisms for separation of front component
Feeding device in IC handling devices, which receives electronic components, in particular integrated circuits (IC), from at least one upstream IC guide and feeds at least two downstream IC guides